"The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm ..."

Kanak Agarwal, Sani R. Nassif (2008)

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DOI: 10.1109/TVLSI.2007.909792

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type: Journal Article

metadata version: 2024-06-04

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Kanak Agarwal, Sani R. Nassif:
The Impact of Random Device Variation on SRAM Cell Stability in Sub-90-nm CMOS Technologies. IEEE Trans. Very Large Scale Integr. Syst. 16(1): 86-97 (2008)

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