"Wafer-Level Modular Testing of Core-Based SoCs."

Sudarshan Bahukudumbi, Krishnendu Chakrabarty (2007)

> Home

Details and statistics

DOI: 10.1109/TVLSI.2007.903943

access: closed

type: Journal Article

metadata version: 2022-01-03

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/tvlsi/BahukudumbiC07
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/tvlsi/BahukudumbiC07
Sudarshan Bahukudumbi, Krishnendu Chakrabarty:
Wafer-Level Modular Testing of Core-Based SoCs. IEEE Trans. Very Large Scale Integr. Syst. 15(10): 1144-1154 (2007)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.