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"Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits."

Sanmitra Banerjee et al. (2021)

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DOI: 10.1109/TVLSI.2020.3045417

access: closed

type: Journal Article

metadata version: 2021-02-11

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  - journals/tvlsi/BanerjeeCNC21
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  - https://dblp.org/rec/journals/tvlsi/BanerjeeCNC21
Sanmitra Banerjee, Arjun Chaudhuri, August Ning, Krishnendu Chakrabarty:
Variation-Aware Delay Fault Testing for Carbon-Nanotube FET Circuits. IEEE Trans. Very Large Scale Integr. Syst. 29(2): 409-422 (2021)

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