"An ROBDD-Based Combinatorial Method for the Evaluation of Yield of ..."

Juan A. Carrasco, Víctor Suñé (2009)

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DOI: 10.1109/TVLSI.2008.2004479

access: closed

type: Journal Article

metadata version: 2020-03-11

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Juan A. Carrasco, Víctor Suñé:
An ROBDD-Based Combinatorial Method for the Evaluation of Yield of Defect-Tolerant Systems-on-Chip. IEEE Trans. Very Large Scale Integr. Syst. 17(2): 207-220 (2009)

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