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"MICRO: a new hybrid test data compression/decompression scheme."
Sunghoon Chun et al. (2006)
- Sunghoon Chun, YongJoon Kim, Jung-Been Im, Sungho Kang:
MICRO: a new hybrid test data compression/decompression scheme. IEEE Trans. Very Large Scale Integr. Syst. 14(6): 649-654 (2006)
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