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"A comparison of various terminal-gate relationships for interconnect ..."

Joni Dambre et al. (2003)

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DOI: 10.1109/TVLSI.2002.808454

access: closed

type: Journal Article

metadata version: 2020-03-11

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Joni Dambre, Peter Verplaetse, Dirk Stroobandt, Jan Van Campenhout:
A comparison of various terminal-gate relationships for interconnect prediction in VLSI circuits. IEEE Trans. Very Large Scale Integr. Syst. 11(1): 24-34 (2003)

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