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"Functional Test-Sequence Grading at Register-Transfer Level."

Hongxia Fang et al. (2012)

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DOI: 10.1109/TVLSI.2011.2163651

access: closed

type: Journal Article

metadata version: 2022-01-03

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Hongxia Fang, Krishnendu Chakrabarty, Abhijit Jas, Srinivas Patil, Chandra Tirumurti:
Functional Test-Sequence Grading at Register-Transfer Level. IEEE Trans. Very Large Scale Integr. Syst. 20(10): 1890-1894 (2012)

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