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"Automatic Test Generation for Combinational Threshold Logic Networks."

Pallav Gupta, Rui Zhang, Niraj K. Jha (2008)

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DOI: 10.1109/TVLSI.2008.2000671

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - https://dblp.org/rec/journals/tvlsi/GuptaZJ08
Pallav Gupta, Rui Zhang, Niraj K. Jha:
Automatic Test Generation for Combinational Threshold Logic Networks. IEEE Trans. Very Large Scale Integr. Syst. 16(8): 1035-1045 (2008)

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