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"WiT: Optimal Wiring Topology for Electromigration Avoidance."

Iris Hui-Ru Jiang, Hua-Yu Chang, Chih-Long Chang (2012)

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DOI: 10.1109/TVLSI.2011.2116049

access: closed

type: Journal Article

metadata version: 2020-03-11

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Iris Hui-Ru Jiang, Hua-Yu Chang, Chih-Long Chang:
WiT: Optimal Wiring Topology for Electromigration Avoidance. IEEE Trans. Very Large Scale Integr. Syst. 20(4): 581-592 (2012)

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