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"An On-Chip Delay Measurement Technique Using Signature Registers for ..."

Kentaroh Katoh, Kazuteru Namba, Hideo Ito (2012)

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DOI: 10.1109/TVLSI.2011.2125994

access: closed

type: Journal Article

metadata version: 2020-03-11

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Kentaroh Katoh, Kazuteru Namba, Hideo Ito:
An On-Chip Delay Measurement Technique Using Signature Registers for Small-Delay Defect Detection. IEEE Trans. Very Large Scale Integr. Syst. 20(5): 804-817 (2012)

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