"A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of ..."

Tony Tae-Hyoung Kim et al. (2015)

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DOI: 10.1109/TVLSI.2014.2339364

access: closed

type: Journal Article

metadata version: 2020-03-11

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Tony Tae-Hyoung Kim, Pong-Fei Lu, Keith A. Jenkins, Chris H. Kim:
A Ring-Oscillator-Based Reliability Monitor for Isolated Measurement of NBTI and PBTI in High-k/Metal Gate Technology. IEEE Trans. Very Large Scale Integr. Syst. 23(7): 1360-1364 (2015)

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