"Design-for-testability and fault-tolerant techniques for FFT processors."

Shyue-Kung Lu, Jen-Sheng Shih, Shih-Chang Huang (2005)

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DOI: 10.1109/TVLSI.2005.844306

access: closed

type: Journal Article

metadata version: 2020-03-11

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Shyue-Kung Lu, Jen-Sheng Shih, Shih-Chang Huang:
Design-for-testability and fault-tolerant techniques for FFT processors. IEEE Trans. Very Large Scale Integr. Syst. 13(6): 732-741 (2005)

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