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"Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays."

Randy W. Mann et al. (2017)

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DOI: 10.1109/TVLSI.2016.2598160

access: closed

type: Journal Article

metadata version: 2020-03-11

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  - journals/tvlsi/MannMRSKXGVPW17
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  - https://dblp.org/rec/journals/tvlsi/MannMRSKXGVPW17
Randy W. Mann, William McMahon, Yoann Mamy Randriamihaja, Yuncheng Song, Ajay Anand Kallianpur, Sheng Xie, Akhilesh Gautam, Joseph Versaggi, Biju Parameshwaran, Chad E. Weintraub:
Bias-Induced Healing of $V_{\text {min}}$ Failures in Advanced SRAM Arrays. IEEE Trans. Very Large Scale Integr. Syst. 25(2): 660-669 (2017)

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