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"Resistive Open Faults Detectability Analysis and Implications for Testing ..."

Mohamed Tagelsir Mohammadat et al. (2015)

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DOI: 10.1109/TVLSI.2014.2312357

access: closed

type: Journal Article

metadata version: 2021-07-25

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  - https://dblp.org/rec/journals/tvlsi/MohammadatAHZ15
Mohamed Tagelsir Mohammadat, Noohul Basheer Zain Ali, Fawnizu Azmadi Hussin, Mark Zwolinski:
Resistive Open Faults Detectability Analysis and Implications for Testing Low Power Nanometric ICs. IEEE Trans. Very Large Scale Integr. Syst. 23(3): 580-583 (2015)

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