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"Input Necessary Assignments for Testing of Path Delay Faults in ..."

Irith Pomeranz, Sudhakar M. Reddy (2011)

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DOI: 10.1109/TVLSI.2009.2031865

access: closed

type: Journal Article

metadata version: 2020-03-11

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Irith Pomeranz, Sudhakar M. Reddy:
Input Necessary Assignments for Testing of Path Delay Faults in Standard-Scan Circuits. IEEE Trans. Very Large Scale Integr. Syst. 19(2): 333-337 (2011)

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