"Soft Error Rate Reduction of Combinational Circuits Using Gate Sizing in ..."

Mohsen Raji, Behnam Ghavami (2017)

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DOI: 10.1109/TVLSI.2016.2569562

access: closed

type: Journal Article

metadata version: 2020-03-11

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Mohsen Raji, Behnam Ghavami:
Soft Error Rate Reduction of Combinational Circuits Using Gate Sizing in the Presence of Process Variations. IEEE Trans. Very Large Scale Integr. Syst. 25(1): 247-260 (2017)

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