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"Intrinsic MOSFET parameter fluctuations due to random dopant placement."
Xinghai Tang, Vivek De, James D. Meindl (1997)
- Xinghai Tang, Vivek De, James D. Meindl:
Intrinsic MOSFET parameter fluctuations due to random dopant placement. IEEE Trans. Very Large Scale Integr. Syst. 5(4): 369-376 (1997)
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