"X-masking during logic BIST and its impact on defect coverage."

Yuyi Tang et al. (2006)

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DOI: 10.1109/TVLSI.2005.863742

access: closed

type: Journal Article

metadata version: 2023-03-21

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Yuyi Tang, Hans-Joachim Wunderlich, Piet Engelke, Ilia Polian, Bernd Becker, Jürgen Schlöffel, Friedrich Hapke, Michael Wittke:
X-masking during logic BIST and its impact on defect coverage. IEEE Trans. Very Large Scale Integr. Syst. 14(2): 193-202 (2006)

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