"Efficient test-point selection for scan-based BIST."

Huan-Chih Tsai et al. (1998)

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DOI: 10.1109/92.736140

access: closed

type: Journal Article

metadata version: 2022-12-07

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  - https://dblp.org/rec/journals/tvlsi/TsaiCLB98
Huan-Chih Tsai, Kwang-Ting Cheng, Chih-Jen Lin, Sudipta Bhawmik:
Efficient test-point selection for scan-based BIST. IEEE Trans. Very Large Scale Integr. Syst. 6(4): 667-676 (1998)

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