"New Self-dual Circuits for Error Detection and Testing."

Alexej Dmitriev et al. (2000)

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DOI: 10.1155/2000/84720

access: open

type: Journal Article

metadata version: 2023-05-08

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Alexej Dmitriev, Valerij V. Saposhnikov, Vladimir V. Saposhnikov, Michael Gössel, V. Moshanin, Andrej A. Morosov:
New Self-dual Circuits for Error Detection and Testing. VLSI Design 11(1): 1-21 (2000)

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