Stop the war!

Остановите войну!

for scientists:

default search action

combined dblp search
author search
venue search
publication search

ask others

"Functional Testbench Qualification by Mutation Analysis."

Kai Huang et al. (2015)

> Home

Details and statistics

DOI: 10.1155/2015/256474

access: open

type: Journal Article

metadata version: 2023-03-07

- view
  - electronic edition via DOI (open access)
  authority control:
- export record
  dblp key:
  - journals/vlsi/KaiZYY15
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/vlsi/KaiZYY15
Kai Huang, Peng Zhu, Rongjie Yan, Xiaolang Yan:
Functional Testbench Qualification by Mutation Analysis. VLSI Design 2015: 256474:1-256474:9 (2015)

a service of

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.