"Observation of Anomalous Negative Differential Resistance in Diode ..."

Edwin C. Kan et al. (1998)

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DOI: 10.1155/1998/76350

access: open

type: Journal Article

metadata version: 2023-05-08

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  - https://dblp.org/rec/journals/vlsi/KanJYD98
Edwin C. Kan, Gyoyoung Jin, Zhiping Yu, Robert W. Dutton:
Observation of Anomalous Negative Differential Resistance in Diode Breakdown Simulation Using Carrier Temperature Dependent Impact Ionization. VLSI Design 6(1-4): 299-302 (1998)

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