"Overcoming Labeled Sample Scarcity and Poor Model Portability: A Robust ..."

Haitao Li et al. (2025)

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DOI: 10.1109/LWC.2025.3557696

access: closed

type: Journal Article

metadata version: 2025-08-14

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Haitao Li, Dongfang Zhou, Qikun Liu, Yi Zhang, Linyu Wang:
Overcoming Labeled Sample Scarcity and Poor Model Portability: A Robust Framework for Specific Emitter Identification. IEEE Wirel. Commun. Lett. 14(7): 1889-1893 (2025)

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