"Defect oriented memory test and repair at the nanometer design scale."

Alberto Scionti (2011)

> Home

Details and statistics

DOI: —

access: closed

type: Book or Thesis

metadata version: 2023-05-10

- view
  - electronic edition @ sbn.it
- export record
  dblp key:
  - phd/it/Scionti11
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/phd/it/Scionti11
Alberto Scionti:
Defect oriented memory test and repair at the nanometer design scale. Polytechnic University of Turin, Italy, 2011

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.