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ORCID"Predicting CMOS Hot Carrier Degradation in VLSI Circuits"
Erhong Li (1999)
- Erhong Li:
Predicting CMOS Hot Carrier Degradation in VLSI Circuits. University of Illinois Urbana-Champaign, USA, 1999
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last updated on 2023-09-07 22:34 CEST by the dblp team
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