"Enhancing Defect Coverage of VLSI Chips by Using Cost Effective Delay ..."

Manish Sharma (2003)

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type: Book or Thesis

metadata version: 2023-09-14

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Manish Sharma:
Enhancing Defect Coverage of VLSI Chips by Using Cost Effective Delay Fault Tests. University of Illinois Urbana-Champaign, USA, 2003

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