Randomised* testing* of a microprocessor* model* using* SMT* solver* state* generation*OKBrian Campbell 0001Ian StarkRandomised testing of a microprocessor model using SMT-solver state generation.Sci. Comput. Program.11860-762016Journal Articlesopenjournals/scp/CampbellS1610.1016/J.SCICO.2015.10.012https://doi.org/10.1016/j.scico.2015.10.012https://dblp.org/rec/journals/scp/CampbellS16URL#3169204Brian Campbell 0001Ian StarkRandomised Testing of a Microprocessor Model Using SMT-Solver State Generation.FMICS185-1992014Conference and Workshop Papersclosedconf/fmics/CampbellS1410.1007/978-3-319-10702-8_13https://doi.org/10.1007/978-3-319-10702-8_13https://dblp.org/rec/conf/fmics/CampbellS14URL#3855350