:facetid:toc:\"db/journals/ibmrd/ibmrd39.bht\"OK:facetid:toc:db/journals/ibmrd/ibmrd39.bhtEric AdlerJohn K. DeBrosseStephen F. GeisslerSteven J. HolmesMark D. JaffeJeffrey B. JohnsonCharles W. Koburger IIIJerome B. LaskyBrian LloydGlen L. MilesJames S. NakosWendell P. Noble Jr.Steven H. VoldmanMichael ArmacostRichard FergusonThe evolution of IBM CMOS DRAM technology.IBM J. Res. Dev.391-2167-1881995Journal Articlesclosedjournals/ibmrd/AdlerDGHJJKLLMNNVAF9510.1147/RD.391.0167https://doi.org/10.1147/rd.391.0167https://dblp.org/rec/journals/ibmrd/AdlerDGHJJKLLMNNVAF95URL#6736380Ramesh C. AgarwalSusanne M. BalleFred G. GustavsonMahesh V. JoshiPrasad V. PalkarA three-dimensional approach to parallel matrix multiplication.IBM J. Res. Dev.395575-5821995Journal Articlesclosedjournals/ibmrd/AgarwalBGJP9510.1147/RD.395.0575https://doi.org/10.1147/rd.395.0575https://dblp.org/rec/journals/ibmrd/AgarwalBGJP95URL#6736381Phaedon AvourisIn-Whan LyoYukio HasegawaProbing electrical transport, electron interference, and quantum size effects at surfaces with STM/STS.IBM J. Res. Dev.396603-6161995Journal Articlesclosedjournals/ibmrd/AvourisLH9510.1147/RD.396.0603https://doi.org/10.1147/rd.396.0603https://dblp.org/rec/journals/ibmrd/AvourisLH95URL#6736382Roland A. BechadeRobert M. HouleDigital delay line clock shapers and multipliers.IBM J. Res. Dev.391-293-1041995Journal Articlesclosedjournals/ibmrd/BechadeH9510.1147/RD.391.0093https://doi.org/10.1147/rd.391.0093https://dblp.org/rec/journals/ibmrd/BechadeH95URL#6736383Reinaldo A. BergamaschiRichard A. O'ConnorLeon StokMichael Z. MoriczShiv PrakashAndreas KuehlmannD. Sreenivasa RaoHigh-level synthesis in an industrial environment.IBM J. Res. Dev.391-2131-1481995Journal Articlesclosedjournals/ibmrd/BergamaschiOSMPKR9510.1147/RD.391.0131https://doi.org/10.1147/rd.391.0131https://dblp.org/rec/journals/ibmrd/BergamaschiOSMPKR95URL#6736384Kerry BernsteinJohn E. BertschLawrence G. HellerEdward J. NowakFrancis R. WhiteReduced-voltage power/performance optimization of the 3.6-volt PowerPC 601 Microprocessor.IBM J. Res. Dev.391-233-421995Journal Articlesclosedjournals/ibmrd/BernsteinBHNW9510.1147/RD.391.0033https://doi.org/10.1147/rd.391.0033https://dblp.org/rec/journals/ibmrd/BernsteinBHNW95URL#6736385Pradip BoseS. SuryaArchitectural timing verification of CMOS RISC processors.IBM J. Res. Dev.391-2113-1301995Journal Articlesclosedjournals/ibmrd/BoseS9510.1147/RD.391.0113https://doi.org/10.1147/rd.391.0113https://dblp.org/rec/journals/ibmrd/BoseS95URL#6736386David D. ChamblissRobert J. WilsonShirley ChiangThe use of STM to study metal film epitaxy.IBM J. Res. Dev.396639-6541995Journal Articlesclosedjournals/ibmrd/ChamblissWC9510.1147/RD.396.0639https://doi.org/10.1147/rd.396.0639https://dblp.org/rec/journals/ibmrd/ChamblissWC95URL#6736387Donald G. ChesebroJames W. AdkissonLyman R. ClarkSteven N. EslingerMargaret A. FaucherSteven J. HolmesRaymond P. MalletteEdward J. NowakEdward W. SengleSteven H. VoldmanThomas W. WeeksOverview of gate linewidth control in the manufacture of CMOS logic chips.IBM J. Res. Dev.391-2189-2001995Journal Articlesclosedjournals/ibmrd/ChesebroACEFHMNSVW9510.1147/RD.391.0189https://doi.org/10.1147/rd.391.0189https://dblp.org/rec/journals/ibmrd/ChesebroACEFHMNSVW95URL#6736388Donna R. CoteSon Van NguyenWilliam J. CoteScott L. PenningtonAnthony K. StamperDragan V. PodlesnikLow-temperature chemical vapor deposition processes and dielectrics for microelectronic circuit manufacturing at IBM.IBM J. Res. Dev.394437-4641995Journal Articlesclosedjournals/ibmrd/CoteNCPSP9510.1147/RD.394.0437https://doi.org/10.1147/rd.394.0437https://dblp.org/rec/journals/ibmrd/CoteNCPSP95URL#6736389Alina DeutschGerard V. KopcsayChristopher W. SurovicBarry J. RubinLewis M. TermanRichard P. Dunne Jr.Thomas A. GalloRobert H. DennardModeling and characterization of long on-chip interconnections for high-performance microprocessors.IBM J. Res. Dev.395547-5681995Journal Articlesclosedjournals/ibmrd/DeutschKSRTDGD9510.1147/RD.395.0547https://doi.org/10.1147/rd.395.0547https://dblp.org/rec/journals/ibmrd/DeutschKSRTDGD95URL#6736390Sang H. DhongMasahiro TanakaSteven W. TomashotToshiaki KirihataA low-noise TTL-compatible CMOS off-chip driver circuit.IBM J. Res. Dev.391-2105-1121995Journal Articlesclosedjournals/ibmrd/DhongTTK9510.1147/RD.391.0105https://doi.org/10.1147/rd.391.0105https://dblp.org/rec/journals/ibmrd/DhongTTK95URL#6736391Daniel C. EdelsteinGeorge A. Sai-HalaszYuh-Jier MiiVLSI on-chip interconnection performance simulations and measurements.IBM J. Res. Dev.394383-4021995Journal Articlesclosedjournals/ibmrd/EdelsteinSM9510.1147/RD.394.0383https://doi.org/10.1147/rd.394.0383https://dblp.org/rec/journals/ibmrd/EdelsteinSM95URL#6736392Wayne F. EllisJohn E. Barth Jr.Sri DivakaruniJeffrey H. DreibelbisAnatol FurmanErik L. HedbergHsing-San LeeThomas M. MaffittChristopher P. MillerCharles H. StapperHoward L. KalterMultipurpose DRAM architecture for optimal power, performance, and product flexibility.IBM J. Res. Dev.391-251-621995Journal Articlesclosedjournals/ibmrd/EllisBDDFHLMMSK9510.1147/RD.391.0051https://doi.org/10.1147/rd.391.0051https://dblp.org/rec/journals/ibmrd/EllisBDDFHLMMSK95URL#6736393John F. EwenMehmet SoyuerAlbert X. WidmerKevin R. WrennerBenjamin D. ParkerHerschel A. AinspanCMOS circuits for Gb/s serial data communication.IBM J. Res. Dev.391-273-821995Journal Articlesclosedjournals/ibmrd/EwenSWWPA9510.1147/RD.391.0073https://doi.org/10.1147/rd.391.0073https://dblp.org/rec/journals/ibmrd/EwenSWWPA95URL#6736394Daniel J. FlemingPreface.IBM J. Res. Dev.391-23-41995Journal Articlesclosedjournals/ibmrd/Fleming9510.1147/RD.391.0003https://doi.org/10.1147/rd.391.0003https://dblp.org/rec/journals/ibmrd/Fleming95URL#6736395Peter A. FranaszekRandolph D. NelsonProperties of delay-cost scheduling in time-sharing systems.IBM J. Res. Dev.393295-3141995Journal Articlesclosedjournals/ibmrd/FranaszekN9510.1147/RD.393.0295https://doi.org/10.1147/rd.393.0295https://dblp.org/rec/journals/ibmrd/FranaszekN95URL#6736396Chao-Kun HuKenneth P. RodbellTimothy D. SullivanKim Y. LeeDennis P. BouldinElectromigration and stress-induced voiding in fine Al and Al-alloy thin-film lines.IBM J. Res. Dev.394465-4981995Journal Articlesclosedjournals/ibmrd/HuRSLB9510.1147/RD.394.0465https://doi.org/10.1147/rd.394.0465https://dblp.org/rec/journals/ibmrd/HuRSLB95URL#6736397John R. KirtleyMark B. KetchenChang C. TsueiJonathan Z. SunWilliam J. GallagherLock See Yu-JahnesArunava GuptaKevin G. StawiaszShalom J. WindDesign and applications of a scanning SQUID microscope.IBM J. Res. Dev.396655-6681995Journal Articlesclosedjournals/ibmrd/KirtleyKTSGYGSW9510.1147/RD.396.0655https://doi.org/10.1147/rd.396.0655https://dblp.org/rec/journals/ibmrd/KirtleyKTSGYGSW95URL#6736398Charles W. Koburger IIIWilliam F. ClarkJames W. AdkissonEric AdlerPaul E. BakemanAlbert S. BergendahlAlan B. BotulaW. ChangBijan DavariJohn H. GivensHoward H. HansenSteven J. HolmesDavid V. HorakChung Hon LamJerome B. LaskyStephen E. LuceRandy W. MannGlen L. MilesJames S. NakosEdward J. NowakGhavam G. ShahidiYuan TaurFrancis R. WhiteMatthew R. WordemanA half-micron CMOS logic generation.IBM J. Res. Dev.391-2215-2281995Journal Articlesclosedjournals/ibmrd/KoburgerCAABBBCDGHHHLLLMMNNSTWW9510.1147/RD.391.0215https://doi.org/10.1147/rd.391.0215https://dblp.org/rec/journals/ibmrd/KoburgerCAABBBCDGHHHLLLMMNNSTWW95URL#6736399T. S. KuanPreface.IBM J. Res. Dev.3943701995Journal Articlesclosedjournals/ibmrd/Kuan9510.1147/RD.394.0370https://doi.org/10.1147/rd.394.0370https://dblp.org/rec/journals/ibmrd/Kuan95URL#6736400Daniel M. KuchtaHerschel A. AinspanFrank J. CanoraRichard P. Schneider Jr.Performance of fiber-optic data links using 670-nm cw VCSELs and a monolithic Si photodetector and CMOS preamplifier.IBM J. Res. Dev.391-263-721995Journal Articlesclosedjournals/ibmrd/KuchtaACS9510.1147/RD.391.0063https://doi.org/10.1147/rd.391.0063https://dblp.org/rec/journals/ibmrd/KuchtaACS95URL#6736401Andreas KuehlmannArvind Srinivasan 0004David P. LaPotinVerity - A formal verification program for custom CMOS circuits.IBM J. Res. Dev.391-2149-1661995Journal Articlesclosedjournals/ibmrd/KuehlmannSL9510.1147/RD.391.0149https://doi.org/10.1147/rd.391.0149https://dblp.org/rec/journals/ibmrd/KuehlmannSL95URL#6736402Jeffrey C. LagariasCharles Philippe TresserA walk along the branches of the extended Farey Tree.IBM J. Res. Dev.393283-2941995Journal Articlesclosedjournals/ibmrd/LagariasT9510.1147/RD.393.0283https://doi.org/10.1147/rd.393.0283https://dblp.org/rec/journals/ibmrd/LagariasT95URL#6736403George A. LeonovichAnthony P. FranchinoWilliam J. MillerUh-Po Eric TsouIntegrated cost and productivity learning in CMOS semiconductor manufacturing.IBM J. Res. Dev.391-2201-2141995Journal Articlesclosedjournals/ibmrd/LeonovichFMT9510.1147/RD.391.0201https://doi.org/10.1147/rd.391.0201https://dblp.org/rec/journals/ibmrd/LeonovichFMT95URL#6736404Thomas J. LicataEvan G. ColganJames M. E. HarperStephen E. LuceInterconnect fabrication processes and the development of low-cost wiring for CMOS products.IBM J. Res. Dev.394419-4361995Journal Articlesclosedjournals/ibmrd/LicataCHL9510.1147/RD.394.0419https://doi.org/10.1147/rd.394.0419https://dblp.org/rec/journals/ibmrd/LicataCHL95URL#6736405Martin A. LutzRandall M. FeenstraJack O. ChuAtomic force microscopy studies of SiGe films and Si/SiGe heterostructures.IBM J. Res. Dev.396629-6381995Journal Articlesclosedjournals/ibmrd/LutzFC9510.1147/RD.396.0629https://doi.org/10.1147/rd.396.0629https://dblp.org/rec/journals/ibmrd/LutzFC95URL#6736406H. Jonathon MaminBruce D. TerrisLong-Sheng FanStorrs HoenRobert C. BarrettDaniel RugarHigh-density data storage using proximal probe techniques.IBM J. Res. Dev.396681-7001995Journal Articlesclosedjournals/ibmrd/MaminTFHBR9510.1147/RD.396.0681https://doi.org/10.1147/rd.396.0681https://dblp.org/rec/journals/ibmrd/MaminTFHBR95URL#6736407Randy W. MannLarry A. ClevengerPaul D. AgnelloFrancis R. WhiteSilicides and local interconnections for high-performance VLSI applications.IBM J. Res. Dev.394403-4181995Journal Articlesclosedjournals/ibmrd/MannCAW9510.1147/RD.394.0403https://doi.org/10.1147/rd.394.0403https://dblp.org/rec/journals/ibmrd/MannCAW95URL#6736408C. Mathew MateForce microscopy studies of the molecular origins of friction and lubrication.IBM J. Res. Dev.396617-6281995Journal Articlesclosedjournals/ibmrd/Mate9510.1147/RD.396.0617https://doi.org/10.1147/rd.396.0617https://dblp.org/rec/journals/ibmrd/Mate95URL#6736409Gary M. McClellandHarry HeinzelmannFumiya WatanabeThe femtosecond field-emission camera, a device for continuous observation of the motion of individual adsorbed atoms and molecules.IBM J. Res. Dev.396669-6801995Journal Articlesclosedjournals/ibmrd/McClellandHW9510.1147/RD.396.0669https://doi.org/10.1147/rd.396.0669https://dblp.org/rec/journals/ibmrd/McClellandHW95URL#6736410Hideto NiijimaDesign of a solid-state file using flash EEPROM.IBM J. Res. Dev.395531-5461995Journal Articlesclosedjournals/ibmrd/Niijima9510.1147/RD.395.0531https://doi.org/10.1147/rd.395.0531https://dblp.org/rec/journals/ibmrd/Niijima95URL#6736411Ramin A. NobakhtA unified table-based Viterbi subset decoder for high-speed voice-band modems.IBM J. Res. Dev.393331-3341995Journal Articlesclosedjournals/ibmrd/Nobakht9510.1147/RD.393.0331https://doi.org/10.1147/rd.393.0331https://dblp.org/rec/journals/ibmrd/Nobakht95URL#6736412Ramin A. NobakhtAn algorithm for adaptive cancellation of phase jitter.IBM J. Res. Dev.395569-5741995Journal Articlesclosedjournals/ibmrd/Nobakht95a10.1147/RD.395.0569https://doi.org/10.1147/rd.395.0569https://dblp.org/rec/journals/ibmrd/Nobakht95aURL#6736413Takashi OhtaUse of multiple representations for simulating cloth shapes and motions: An overview.IBM J. Res. Dev.395523-5301995Journal Articlesclosedjournals/ibmrd/Ohta9510.1147/RD.395.0523https://doi.org/10.1147/rd.395.0523https://dblp.org/rec/journals/ibmrd/Ohta95URL#6736414Joonho ParkStamatis VassiliadisJosé G. Delgado-FriasFlexible oblivious router architecture.IBM J. Res. Dev.393315-3301995Journal Articlesclosedjournals/ibmrd/ParkVD9510.1147/RD.393.0315https://doi.org/10.1147/rd.393.0315https://dblp.org/rec/journals/ibmrd/ParkVD95URL#6736415Dieter W. PohlSome thoughts about scanning probe microscopy, micromechanics, and storage.IBM J. Res. Dev.396701-7121995Journal Articlesclosedjournals/ibmrd/Pohl9510.1147/RD.396.0701https://doi.org/10.1147/rd.396.0701https://dblp.org/rec/journals/ibmrd/Pohl95URL#6736416James G. RyanRobert M. GeffkenNeil R. PoulinJurij R. ParaszczakThe evolution of interconnection technology at IBM.IBM J. Res. Dev.394371-3821995Journal Articlesclosedjournals/ibmrd/RyanGPP9510.1147/RD.394.0371https://doi.org/10.1147/rd.394.0371https://dblp.org/rec/journals/ibmrd/RyanGPP95URL#6736417Robert F. SechlerInterconnect design with VLSI CMOS.IBM J. Res. Dev.391-223-321995Journal Articlesclosedjournals/ibmrd/Sechler9510.1147/RD.391.0023https://doi.org/10.1147/rd.391.0023https://dblp.org/rec/journals/ibmrd/Sechler95URL#6736418Robert F. SechlerGregory F. GrohoskiDesign at the system level with VLSI CMOS.IBM J. Res. Dev.391-25-221995Journal Articlesclosedjournals/ibmrd/SechlerG9510.1147/RD.391.0005https://doi.org/10.1147/rd.391.0005https://dblp.org/rec/journals/ibmrd/SechlerG95URL#6736419Ghavam G. ShahidiJames D. WarnockJames ComfortStephen E. FischerPatricia A. McFarlandAlexandre AcovicTerry I. ChappellBarbara A. ChappellTak H. NingCarl J. AndersonRobert H. DennardJ. Y.-C. SunMichael R. PolcariBijan DavariCMOS scaling in the 0.1-µm, 1.X-volt regime for high-performance applications.IBM J. Res. Dev.391-2229-2441995Journal Articlesclosedjournals/ibmrd/ShahidiWCFMACCNADSPD9510.1147/RD.391.0229https://doi.org/10.1147/rd.391.0229https://dblp.org/rec/journals/ibmrd/ShahidiWCFMACCNADSPD95URL#6736420Hyun J. ShinDale J. PearsonScott K. ReynoldsAndrew C. MegdanisSudhir M. GowdaKevin R. WrennerCustom design of CMOS low-power high-performance digital signal-processing macro for hard-disk-drive applications.IBM J. Res. Dev.391-283-921995Journal Articlesclosedjournals/ibmrd/ShinPRMGW9510.1147/RD.391.0083https://doi.org/10.1147/rd.391.0083https://dblp.org/rec/journals/ibmrd/ShinPRMGW95URL#6736421Toshio SunagaKoji HosokawaSang H. DhongKoji KitamuraA 64Kb - 32 DRAM for graphics applications.IBM J. Res. Dev.391-243-501995Journal Articlesclosedjournals/ibmrd/SunagaHDK9510.1147/RD.391.0043https://doi.org/10.1147/rd.391.0043https://dblp.org/rec/journals/ibmrd/SunagaHDK95URL#6736422Yuan TaurYuh-Jier MiiDavid J. FrankH.-S. Philip WongDouglas A. BuchananShalom J. WindStephen A. RishtonWatson A. Sai-HalaszEdward J. NowakCMOS scaling into the 21st century: 0.1 µm and beyond.IBM J. Res. Dev.391-2245-2601995Journal Articlesclosedjournals/ibmrd/TaurMFWBWRSN9510.1147/RD.391.0245https://doi.org/10.1147/rd.391.0245https://dblp.org/rec/journals/ibmrd/TaurMFWBWRSN95URL#6736423H. Kumar WickramasingheDaniel RugarPreface.IBM J. Res. Dev.3966021995Journal Articlesclosedjournals/ibmrd/WickramasingheR9510.1147/RD.396.0602https://doi.org/10.1147/rd.396.0602https://dblp.org/rec/journals/ibmrd/WickramasingheR95URL#6736424