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@inproceedings{DBLP:conf/natw/AkterKSSP20,
  author    = {Naznin Akter and
               Mustafa Karabiyik and
               Michael S. Shur and
               John Suarez and
               Nezih Pala},
  title     = {{AI} Powered THz {VLSI} Testing Technology},
  booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/NATW49237.2020.9153077},
  doi       = {10.1109/NATW49237.2020.9153077},
  timestamp = {Thu, 06 Aug 2020 14:48:48 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/AkterKSSP20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/GolmohamadiJHLZ20,
  author    = {Marcia Golmohamadi and
               Ryan Jurasek and
               Wolfgang Hokenmaier and
               Donald Labrecque and
               Ruoyu Zhi and
               Bret Dale and
               Nibir Islam and
               Dave Kinney and
               Angela Johnson},
  title     = {Verification and Testing Considerations of an In-Memory {AI} Chip},
  booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/NATW49237.2020.9153079},
  doi       = {10.1109/NATW49237.2020.9153079},
  timestamp = {Thu, 06 Aug 2020 14:48:48 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/GolmohamadiJHLZ20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ImmanuelM20,
  author    = {Joshua Immanuel and
               Spencer K. Millican},
  title     = {Calculating Signal Controllability using Neural Networks: Improvements
               to Testability Analysis and Test Point Insertion},
  booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/NATW49237.2020.9153082},
  doi       = {10.1109/NATW49237.2020.9153082},
  timestamp = {Thu, 06 Aug 2020 14:48:48 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ImmanuelM20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/MossVJ20,
  author    = {Stephen Moss and
               Elanchezhian Veeramani and
               Joris Angelo Sundaram Jerome},
  title     = {Passive Intermodulation {(PIM)} Test and Measurement},
  booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  pages     = {1--3},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/NATW49237.2020.9153075},
  doi       = {10.1109/NATW49237.2020.9153075},
  timestamp = {Thu, 06 Aug 2020 14:48:48 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/MossVJ20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/PaliwodaTNGNCPG20,
  author    = {Peter C. Paliwoda and
               Maria Toledano{-}Luque and
               Tanya Nigam and
               F. Guarin and
               M. Nour and
               S. Cimino and
               L. Pantisano and
               A. Gupta and
               O. H. Gonzalez and
               M. Hauser and
               W. Liu and
               A. Vayshenker and
               D. Ioannou and
               D. Lee and
               L. Jiang and
               P. Yee and
               S. Rauch and
               B. Min},
  title     = {Self-heating characterization and its applications in technology development},
  booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  pages     = {1--7},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/NATW49237.2020.9153081},
  doi       = {10.1109/NATW49237.2020.9153081},
  timestamp = {Thu, 06 Aug 2020 14:48:48 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/PaliwodaTNGNCPG20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/PoulosH20,
  author    = {Konstantinos Poulos and
               Themistoklis Haniotakis},
  title     = {A Built In Test circuit for waveform classification at high frequencies},
  booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/NATW49237.2020.9153078},
  doi       = {10.1109/NATW49237.2020.9153078},
  timestamp = {Thu, 06 Aug 2020 14:48:48 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/PoulosH20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/RauchLVG20,
  author    = {Stewart Rauch and
               Dongho Lee and
               Alexey Vert and
               Roy Gupta},
  title     = {Characterization of Thermal Runaway in a Ge Photodiode for Si Photonics},
  booktitle = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://doi.org/10.1109/NATW49237.2020.9153080},
  doi       = {10.1109/NATW49237.2020.9153080},
  timestamp = {Thu, 06 Aug 2020 14:48:48 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/RauchLVG20.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/natw/2020,
  title     = {29th {IEEE} North Atlantic Test Workshop, {NATW} 2020, Albany, NY,
               USA, June 17-24, 2020},
  publisher = {{IEEE}},
  year      = {2020},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/9145488/proceeding},
  isbn      = {978-1-7281-9699-2},
  timestamp = {Thu, 06 Aug 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/2020.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/FosberryM19,
  author    = {Mark Fosberry and
               Ben McMahon},
  title     = {Matlab {JTAG} {AXI} Master opens new dimensions for development and
               testability},
  booktitle = {28th {IEEE} North Atlantic Test Workshop, {NATW} 2019, Burlington,
               VT, USA, May 13-15, 2019},
  pages     = {1--2},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/NATW.2019.8758735},
  doi       = {10.1109/NATW.2019.8758735},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/FosberryM19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Hunt-SchroederA19,
  author    = {Eric Hunt{-}Schroeder and
               Darren Anand and
               Edward Hwang and
               Aaron Cummings and
               Matthew Deming and
               Michael Roberge and
               Michael Ziegerhofer},
  title     = {Behavioral Modeling of a Charge Trap Transistor One Time Programmable
               Memory},
  booktitle = {28th {IEEE} North Atlantic Test Workshop, {NATW} 2019, Burlington,
               VT, USA, May 13-15, 2019},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/NATW.2019.8758743},
  doi       = {10.1109/NATW.2019.8758743},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Hunt-SchroederA19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/RoySMA19,
  author    = {Soham Roy and
               Brandon Stiene and
               Spencer K. Millican and
               Vishwani D. Agrawal},
  title     = {Improved Random Pattern Delay Fault Coverage Using Inversion Test
               Points},
  booktitle = {28th {IEEE} North Atlantic Test Workshop, {NATW} 2019, Burlington,
               VT, USA, May 13-15, 2019},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/NATW.2019.8758727},
  doi       = {10.1109/NATW.2019.8758727},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/RoySMA19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/SrinivasanHAFSS19,
  author    = {Uma Srinivasan and
               William V. Huott and
               Chad Adams and
               Pete Freiburger and
               Franco Stellari and
               Peilin Song and
               Phong Tran and
               Dave Albert},
  title     = {Case Study of Advanced Diagnostic Techniques for Multi Port Register
               File},
  booktitle = {28th {IEEE} North Atlantic Test Workshop, {NATW} 2019, Burlington,
               VT, USA, May 13-15, 2019},
  pages     = {1--9},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/NATW.2019.8758709},
  doi       = {10.1109/NATW.2019.8758709},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/SrinivasanHAFSS19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/WenY19,
  author    = {Yiming Wen and
               Weize Yu},
  title     = {Convolutional Neural Networks (CNNs)-Assisted Voltage Regulation:
               {A} New Power Delivery Scheme},
  booktitle = {28th {IEEE} North Atlantic Test Workshop, {NATW} 2019, Burlington,
               VT, USA, May 13-15, 2019},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/NATW.2019.8758751},
  doi       = {10.1109/NATW.2019.8758751},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/WenY19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/YuW19,
  author    = {Weize Yu and
               Yiming Wen},
  title     = {Malicious Attacks on Physical Unclonable Function Sensors of Internet
               of Things},
  booktitle = {28th {IEEE} North Atlantic Test Workshop, {NATW} 2019, Burlington,
               VT, USA, May 13-15, 2019},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://doi.org/10.1109/NATW.2019.8758732},
  doi       = {10.1109/NATW.2019.8758732},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/YuW19.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/natw/2019,
  title     = {28th {IEEE} North Atlantic Test Workshop, {NATW} 2019, Burlington,
               VT, USA, May 13-15, 2019},
  publisher = {{IEEE}},
  year      = {2019},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8753145/proceeding},
  isbn      = {978-1-7281-3382-9},
  timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/2019.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/AhmedBS18,
  author    = {Imtiaz Ahmed and
               Subhash Baraiya and
               Rahul Singhal},
  title     = {Case study on low pin count testing of industry transceiver chip},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388868},
  doi       = {10.1109/NATW.2018.8388868},
  timestamp = {Fri, 31 Jan 2020 17:11:30 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/AhmedBS18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/AlaouiTBV18,
  author    = {Nabil El Belghiti Alaoui and
               Patrick Tounsi and
               Alexandre Boyer and
               Arnaud Viard},
  title     = {New testing approach using near electromagnetic field probing intending
               to upgrade in-circuit testing of high density PCBAs},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--8},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388867},
  doi       = {10.1109/NATW.2018.8388867},
  timestamp = {Fri, 31 Jan 2020 17:11:30 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/AlaouiTBV18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/InceYO18,
  author    = {Mehmet Ince and
               Ender Yilmaz and
               Sule Ozev},
  title     = {Enabling fast process variation and fault simulation through macromodelling
               of analog components},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388861},
  doi       = {10.1109/NATW.2018.8388861},
  timestamp = {Fri, 31 Jan 2020 17:11:30 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/InceYO18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/JiangW18,
  author    = {Wei Jiang and
               Guoan Wang},
  title     = {A simplified on-chip calibration method for branch-line coupler},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--3},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388863},
  doi       = {10.1109/NATW.2018.8388863},
  timestamp = {Sat, 01 Feb 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/JiangW18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/JiangZSD18,
  author    = {Hui Jiang and
               Fanchen Zhang and
               Yi Sun and
               Jennifer Dworak},
  title     = {One more time! Increasing fault detection with scan shift capture},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--7},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388862},
  doi       = {10.1109/NATW.2018.8388862},
  timestamp = {Fri, 31 Jan 2020 17:11:30 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/JiangZSD18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/PennucciJHPBLK18,
  author    = {Ryan Pennucci and
               Ryan Jurasek and
               Wolfgang Hokenmaier and
               Lester Patrick and
               Jacob Bucci and
               Donald Labrecque and
               David Kinney},
  title     = {An analysis of an inexpensive memory test solution},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388866},
  doi       = {10.1109/NATW.2018.8388866},
  timestamp = {Fri, 31 Jan 2020 17:11:30 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/PennucciJHPBLK18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/PlattL18,
  author    = {Timothy M. Platt and
               Chen Liu},
  title     = {Reducing test time with {FPGA} accelerators using OpenCL},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--9},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388864},
  doi       = {10.1109/NATW.2018.8388864},
  timestamp = {Fri, 31 Jan 2020 17:11:30 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/PlattL18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ShurS18,
  author    = {Michael S. Shur and
               John Suarez},
  title     = {Nanoscale silicon mosfet response to THz radiation for testing {VLSI}},
  booktitle = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {https://doi.org/10.1109/NATW.2018.8388865},
  doi       = {10.1109/NATW.2018.8388865},
  timestamp = {Fri, 31 Jan 2020 17:11:30 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/ShurS18.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/natw/2018,
  title     = {27th {IEEE} North Atlantic Test Workshop, {NATW} 2018, Essex, VT,
               USA, May 7-9, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8379736},
  isbn      = {978-1-5386-6400-1},
  timestamp = {Fri, 31 Jan 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/2018.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/AlhelalyDMGNC17,
  author    = {Soha Alhelaly and
               Jennifer Dworak and
               Theodore W. Manikas and
               Ping Gui and
               Kundan Nepal and
               Alfred L. Crouch},
  title     = {Detecting a trojan die in 3D stacked integrated circuits},
  booktitle = {2017 {IEEE} North Atlantic Test Workshop, {NATW} 2017, Providence,
               RI, USA, May 8-10, 2017},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/NATW.2017.7938027},
  doi       = {10.1109/NATW.2017.7938027},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/AlhelalyDMGNC17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/GuptaDEC17,
  author    = {Saurabh Gupta and
               Jennifer Dworak and
               Daniel Engels and
               Al Crouch},
  title     = {Mitigating simple power analysis attacks on {LSIB} key logic},
  booktitle = {2017 {IEEE} North Atlantic Test Workshop, {NATW} 2017, Providence,
               RI, USA, May 8-10, 2017},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/NATW.2017.7938025},
  doi       = {10.1109/NATW.2017.7938025},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/GuptaDEC17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Huang17,
  author    = {Yu Huang},
  title     = {Case study of bandwidth management in SoC testing},
  booktitle = {2017 {IEEE} North Atlantic Test Workshop, {NATW} 2017, Providence,
               RI, USA, May 8-10, 2017},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/NATW.2017.7938022},
  doi       = {10.1109/NATW.2017.7938022},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Huang17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/PoulosKH17,
  author    = {Konstantinos Poulos and
               Jayasurya Kuchi and
               Themistoklis Haniotakis},
  title     = {An enhanced approach to reduce test application time through limited
               shift operations in scan chains},
  booktitle = {2017 {IEEE} North Atlantic Test Workshop, {NATW} 2017, Providence,
               RI, USA, May 8-10, 2017},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/NATW.2017.7938026},
  doi       = {10.1109/NATW.2017.7938026},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/PoulosKH17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/RameshPK17,
  author    = {Pavithra Ramesh and
               Vinay C. Patil and
               Sandip Kundu},
  title     = {Peer pressure on identity: On requirements for disambiguating PUFs
               in noisy environment},
  booktitle = {2017 {IEEE} North Atlantic Test Workshop, {NATW} 2017, Providence,
               RI, USA, May 8-10, 2017},
  pages     = {1--4},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://doi.org/10.1109/NATW.2017.7938023},
  doi       = {10.1109/NATW.2017.7938023},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/RameshPK17.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/natw/2017,
  title     = {2017 {IEEE} North Atlantic Test Workshop, {NATW} 2017, Providence,
               RI, USA, May 8-10, 2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7937762/proceeding},
  isbn      = {978-1-5090-5902-7},
  timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/2017.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ChauhanKO16,
  author    = {Hari Chauhan and
               Vladimir Kvartenko and
               Marvin Onabajo},
  title     = {A Tuning Technique for Temperature and Process Variation Compensation
               of Power Amplifiers with Digital Predistortion},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {38--45},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.12},
  doi       = {10.1109/NATW.2016.12},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ChauhanKO16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ChoiKJ16,
  author    = {Yongsuk Choi and
               Yong{-}Bin Kim and
               In{-}Seok Jung},
  title     = {A 100MS/s 10-bit Split-SAR {ADC} with Capacitor Mismatch Compensation
               Using Built-In Calibration},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.9},
  doi       = {10.1109/NATW.2016.9},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ChoiKJ16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/GhoshO16,
  author    = {Malinky Ghosh and
               Kelly A. Ockunzzi},
  title     = {Automated and Reusable {IP} Functional Test Rule Development across
               Multiple {IP} Instances within and across Asic Designs},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {34--37},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.13},
  doi       = {10.1109/NATW.2016.13},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/GhoshO16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/IslamK16,
  author    = {Md. Nazmul Islam and
               Sandip Kundu},
  title     = {Modeling Residual Life of an {IC} Considering Multiple Aging Mechanisms},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {24--27},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.17},
  doi       = {10.1109/NATW.2016.17},
  timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/IslamK16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/LiuYQHF16,
  author    = {Xiao Liu and
               Changkai Yu and
               Yu Qi and
               Yu Huang and
               James Fu},
  title     = {Case Study of Testing a SoC Design with Mixed {EDT} Channel Sharing
               and Channel Broadcasting},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {12--17},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.10},
  doi       = {10.1109/NATW.2016.10},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/LiuYQHF16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/NguyenTBLCCGCG16,
  author    = {Joseph Nguyen and
               David Turgis and
               David Bonciani and
               Brice Lhomme and
               Yann Carminati and
               Olivier Callen and
               Guillaume Guirleo and
               Lorenzo Ciampolini and
               G{\'{e}}rard Ghibaudo},
  title     = {{RAPIDO} Testing and Modeling of Assisted Write and Read Operations
               for SRAMs},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {28--33},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.14},
  doi       = {10.1109/NATW.2016.14},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/NguyenTBLCCGCG16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ShahshahaniTZ16,
  author    = {Amirhossein Shahshahani and
               Andrey Tolstikhin and
               Zeljko Zilic},
  title     = {Enabling Debug in IoT Wireless Development and Deployment with Security
               Considerations},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {53--58},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.16},
  doi       = {10.1109/NATW.2016.16},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ShahshahaniTZ16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Venkatasubramanian16,
  author    = {Muralidharan Venkatasubramanian and
               Vishwani D. Agrawal},
  title     = {Failures Guide Probabilistic Search for a Hard-to-Find Test},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {18--23},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.18},
  doi       = {10.1109/NATW.2016.18},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Venkatasubramanian16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ZhangJCKK16,
  author    = {Chen Zhang and
               Gyunam Jeon and
               Yongsuk Choi and
               Yong{-}Bin Kim and
               Kyung Ki Kim},
  title     = {An Area Efficient 4Gb/s Half-Rate 3-Tap {DFE} with Current-Integrating
               Summer for Data Correction},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {6--11},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.11},
  doi       = {10.1109/NATW.2016.11},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ZhangJCKK16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ZhangSSNDMGBCP16,
  author    = {Fanchen Zhang and
               Yi Sun and
               Xi Shen and
               Kundan Nepal and
               Jennifer Dworak and
               Theodore W. Manikas and
               Ping Gui and
               R. Iris Bahar and
               Al Crouch and
               John C. Potter},
  title     = {Using Existing Reconfigurable Logic in 3D Die Stacks for Test},
  booktitle = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  pages     = {46--52},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://doi.org/10.1109/NATW.2016.15},
  doi       = {10.1109/NATW.2016.15},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ZhangSSNDMGBCP16.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/natw/2016,
  title     = {25th {IEEE} North Atlantic Test Workshop, {NATW} 2016, Providence,
               RI, USA, May 9-11, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7557345/proceeding},
  isbn      = {978-1-4673-8949-5},
  timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/2016.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Al-HaddadOZED15,
  author    = {Rawad N. Al{-}Haddad and
               Rashad S. Oreifej and
               Ramtin Zand and
               Abdel Ejnioui and
               Ronald F. DeMara},
  title     = {Adaptive Mitigation of Radiation-Induced Errors and {TDDB} in Reconfigurable
               Logic Fabrics},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {23--32},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.14},
  doi       = {10.1109/NATW.2015.14},
  timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Al-HaddadOZED15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ChakrabortyW15,
  author    = {Swati Chakraborty and
               Duncan M. Hank Walker},
  title     = {At-Speed Path Delay Test},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {39--42},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.13},
  doi       = {10.1109/NATW.2015.13},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ChakrabortyW15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ChillarigeVMCCS15,
  author    = {Sameer Chillarige and
               S. Virdi and
               Anil Malik and
               Krishna Chakravadhanula and
               Vivek Chickermane and
               Joe Swenton and
               G. Vandling},
  title     = {A Novel Failure Diagnosis Approach for Low Pin Count and Low Power
               Compression Architectures},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {43--48},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.17},
  doi       = {10.1109/NATW.2015.17},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ChillarigeVMCCS15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/DworakGK15,
  author    = {Jennifer Dworak and
               Ping Gui and
               Qutaiba Khasawneh},
  title     = {An Industrial Case Study: PaRent (Parallel {\&} Concurrent) Testing
               for Complex Mixed-Signal Devices},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {33--38},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.19},
  doi       = {10.1109/NATW.2015.19},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/DworakGK15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/HanafySW15,
  author    = {Mohamed Hanafy and
               Hazem Said and
               Ayman M. Wahba},
  title     = {Complete Properties Extraction from Simulation Traces for Assertions
               Auto-generation},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {1--6},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.8},
  doi       = {10.1109/NATW.2015.8},
  timestamp = {Mon, 15 Jun 2020 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/HanafySW15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/LiA15,
  author    = {Baohu Li and
               Vishwani D. Agrawal},
  title     = {Multivalued Logic for Reduced Pin Count and Multi-site SoC Testing},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {49--54},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.15},
  doi       = {10.1109/NATW.2015.15},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/LiA15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/LiQYZLHKR15,
  author    = {Guoliang Li and
               Jun Qian and
               Qinfu Yang and
               Yuan Zuo and
               Rui Li and
               Yu Huang and
               Mark Kassab and
               Janusz Rajski},
  title     = {Hybrid Hierarchical and Modular Tests for SoC Designs},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {11--16},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.9},
  doi       = {10.1109/NATW.2015.9},
  timestamp = {Thu, 14 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/LiQYZLHKR15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Tekumalla15,
  author    = {Ramesh C. Tekumalla},
  title     = {Clock Domain Imbalances and Their Impact on Test Architecture},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {7--10},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.10},
  doi       = {10.1109/NATW.2015.10},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Tekumalla15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ValiN15,
  author    = {Amin Vali and
               Nicola Nicolici},
  title     = {Satisfiability-Based Analysis of Failing Traces during Post-silicon
               Debug},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {17--22},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.16},
  doi       = {10.1109/NATW.2015.16},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ValiN15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ZhangA15,
  author    = {Huiting Zhang and
               Vishwani D. Agrawal},
  title     = {SoC {TAM} Design to Minimize Test Application Time},
  booktitle = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  pages     = {55--60},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://doi.org/10.1109/NATW.2015.18},
  doi       = {10.1109/NATW.2015.18},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ZhangA15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/natw/2015,
  title     = {24th {IEEE} North Atlantic Test Workshop, {NATW} 2015, Johnson City,
               NY, USA, May 11-13, 2015},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7146166/proceeding},
  isbn      = {978-1-4673-7417-0},
  timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/2015.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/BansalMT14,
  author    = {Surbhi Bansal and
               Aviansh Mendhalkar and
               Ramesh C. Tekumalla},
  title     = {On Handling Memory Scan Chains},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {6--10},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.11},
  doi       = {10.1109/NATW.2014.11},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/BansalMT14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/GaoZCW14,
  author    = {Yukun Gao and
               Tengteng Zhang and
               Swati Chakraborty and
               D. M. H. Walker},
  title     = {Delay Test of Embedded Memories},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {65--68},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.22},
  doi       = {10.1109/NATW.2014.22},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/GaoZCW14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/GunasekarA14,
  author    = {Sindhu Gunasekar and
               Vishwani D. Agrawal},
  title     = {Optimal Selection of {ATE} Frequencies for Test Time Reduction Using
               Aperiodic Clock},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {52--56},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.19},
  doi       = {10.1109/NATW.2014.19},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/GunasekarA14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/HuangKJRCHKC14,
  author    = {Yu Huang and
               Mark Kassab and
               Jay Jahangiri and
               Janusz Rajski and
               Wu{-}Tung Cheng and
               Dongkwan Han and
               Jihye Kim and
               Kun Young Chung},
  title     = {Test Compression Improvement with {EDT} Channel Sharing in SoC Designs},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {22--31},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.14},
  doi       = {10.1109/NATW.2014.14},
  timestamp = {Thu, 14 Nov 2019 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/HuangKJRCHKC14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Lam14,
  author    = {Tommy Lam},
  title     = {Innovative Antenna Chamber Characterization},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {15--21},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.13},
  doi       = {10.1109/NATW.2014.13},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Lam14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/NsameBS14,
  author    = {Pascal Nsame and
               Guy Bois and
               Yvon Savaria},
  title     = {Design and Test of Adaptive Computing Fabrics for Scalable and High-Efficiency
               Cognitive SoC Applications},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {48--51},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.18},
  doi       = {10.1109/NATW.2014.18},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/NsameBS14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/RahmanFSCT14,
  author    = {Md. Tauhidur Rahman and
               Domenic Forte and
               Quihang Shi and
               Gustavo K. Contreras and
               Mohammad Tehranipoor},
  title     = {{CSST:} An Efficient Secure Split-Test for Preventing {IC} Piracy},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {43--47},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.17},
  doi       = {10.1109/NATW.2014.17},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/RahmanFSCT14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ShibinDJ14,
  author    = {Konstantin Shibin and
               Sergei Devadze and
               Artur Jutman},
  title     = {Asynchronous Fault Detection in {IEEE} {P1687} Instrument Network},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {73--78},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.24},
  doi       = {10.1109/NATW.2014.24},
  timestamp = {Fri, 27 Mar 2020 00:00:00 +0100},
  biburl    = {https://dblp.org/rec/conf/natw/ShibinDJ14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Tang14,
  author    = {Grace Tang},
  title     = {Power System Fault Modeling/Simulation Protective Relay Testing and
               Simulation},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {40--42},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.16},
  doi       = {10.1109/NATW.2014.16},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Tang14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/TekumallaK14,
  author    = {Ramesh C. Tekumalla and
               Prakash Krishnamoorthy},
  title     = {Local Repair Signature Handling for Repairable Memories},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {1--5},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.10},
  doi       = {10.1109/NATW.2014.10},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/TekumallaK14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/TekumallaK14a,
  author    = {Ramesh C. Tekumalla and
               Prakash Krishnamoorthy},
  title     = {On-chip Clock Testing and Frequency Measurement},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {11--14},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.12},
  doi       = {10.1109/NATW.2014.12},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/TekumallaK14a.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/TouatiBDGTVB14,
  author    = {Aymen Touati and
               Alberto Bosio and
               Luigi Dilillo and
               Patrick Girard and
               Aida Todri{-}Sanial and
               Arnaud Virazel and
               Paolo Bernardi},
  title     = {A Comprehensive Evaluation of Functional Programs for Power-Aware
               Test},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {69--72},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.23},
  doi       = {10.1109/NATW.2014.23},
  timestamp = {Mon, 21 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/TouatiBDGTVB14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/Venkatasubramanian14,
  author    = {Muralidharan Venkatasubramanian and
               Vishwani D. Agrawal},
  title     = {A New Test Vector Search Algorithm for a Single Stuck-at Fault Using
               Probabilistic Correlation},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {57--60},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.20},
  doi       = {10.1109/NATW.2014.20},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/Venkatasubramanian14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ZhangGW14,
  author    = {Tengteng Zhang and
               Yukun Gao and
               D. M. H. Walker},
  title     = {Pattern Generation for Post-Silicon Timing Validation Considering
               Power Supply Noise},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {61--64},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.21},
  doi       = {10.1109/NATW.2014.21},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ZhangGW14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/natw/ZhangTD14,
  author    = {Fanchen Zhang and
               Micah Thornton and
               Jennifer Dworak},
  title     = {When Optimized N-Detect Test Sets are Biased: An Investigation of
               Cell-Aware-Type Faults and N-Detect Stuck-At {ATPG}},
  booktitle = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  pages     = {32--39},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://doi.org/10.1109/NATW.2014.15},
  doi       = {10.1109/NATW.2014.15},
  timestamp = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/ZhangTD14.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/natw/2014,
  title     = {{IEEE} 23rd North Atlantic Test Workshop, {NATW} 2014, Johnson City,
               NY, USA, May 14-16, 2014},
  publisher = {{IEEE}},
  year      = {2014},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6875428/proceeding},
  timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl    = {https://dblp.org/rec/conf/natw/2014.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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