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@inproceedings{DBLP:conf/ats/Agarwal97,
author = {Vinod K. Agarwal},
title = {Embedded Test and Measurement Critical for Deep Submicron Technology},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {2},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.10004},
doi = {10.1109/ATS.1997.10004},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Agarwal97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/AltetRT97,
author = {Josep Altet and
Antonio Rubio and
Hideo Tamamoto},
title = {Analysis of the Feasibility of Dynamic Thermal Testing in Digital
Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {149--154},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643951},
doi = {10.1109/ATS.1997.643951},
timestamp = {Tue, 11 Jul 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/AltetRT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BaduraH97,
author = {Dariusz Badura and
Andrzej Hlawiczka},
title = {Low Cost Bist for Edac Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {410--415},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643991},
doi = {10.1109/ATS.1997.643991},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BaduraH97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BhatiaV97,
author = {Sandeep Bhatia and
Prab Varma},
title = {Test Compaction in a Parallel Access Scan Environment},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {300--305},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643974},
doi = {10.1109/ATS.1997.643974},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BhatiaV97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/BoatengTT97,
author = {Kwame Osei Boateng and
Hiroshi Takahashi and
Yuzo Takamatsu},
title = {Design of C-Testable Multipliers Based on the Modified Booth Algorithm},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {42--47},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643914},
doi = {10.1109/ATS.1997.643914},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/BoatengTT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Chakravarty97,
author = {Sreejit Chakravarty},
title = {On the capability of delay tests to detect bridges and opens},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {314--319},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643976},
doi = {10.1109/ATS.1997.643976},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Chakravarty97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ChiusanoCPRR97,
author = {Silvia Chiusano and
Fulvio Corno and
Paolo Prinetto and
Maurizio Rebaudengo and
Matteo Sonza Reorda},
title = {Guaranteeing Testability in Re-encoding for Low Power},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {30--35},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643912},
doi = {10.1109/ATS.1997.643912},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ChiusanoCPRR97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CornoPRRS97,
author = {Fulvio Corno and
Paolo Prinetto and
Maurizio Rebaudengo and
Matteo Sonza Reorda and
Giovanni Squillero},
title = {A Genetic Algorithm for the Computation of Initialization Sequences
for Synchronous Sequential Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {56--61},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643917},
doi = {10.1109/ATS.1997.643917},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CornoPRRS97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/CornoPRRV97,
author = {Fulvio Corno and
Paolo Prinetto and
Maurizio Rebaudengo and
Matteo Sonza Reorda and
Massimo Violante},
title = {Exploiting Logic Simulation to Improve Simulation-based Sequential
{ATPG}},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {68--73},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643922},
doi = {10.1109/ATS.1997.643922},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/CornoPRRV97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DabholkarC97,
author = {Vinay Dabholkar and
Sreejit Chakravarty},
title = {Computing stress tests for interconnect defects},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {143--148},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643950},
doi = {10.1109/ATS.1997.643950},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DabholkarC97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DalmiaIT97,
author = {Maneesha Dalmia and
Andr{\'{e}} Ivanov and
Sassan Tabatabaei},
title = {Power supply current monitoring techniques for testing PLLs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {366--371},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643984},
doi = {10.1109/ATS.1997.643984},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DalmiaIT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/DarusAA97,
author = {Zahari M. Darus and
Iftekhar Ahmed and
Liakot Ali},
title = {A test processor chip implementing multiple seed, multiple polynomial
linear feedback shift register},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {155},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643952},
doi = {10.1109/ATS.1997.643952},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/DarusAA97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/David97,
author = {Ren{\'{e}} David},
title = {Test Length for Random Testing of Sequential Machines Application
to RAMs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {392--397},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643988},
doi = {10.1109/ATS.1997.643988},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/David97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/EmoriKIAAN97,
author = {Michiaki Emori and
Junko Kumagai and
Koichi Itaya and
Takashi Aikyo and
Tomoko Anan and
Junichi Niimi},
title = {{ATREX} : Design for Testability System for Mega Gate LSIs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {126},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643947},
doi = {10.1109/ATS.1997.643947},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/EmoriKIAAN97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HamidaSMK97,
author = {Naim Ben{-}Hamida and
Khaled Saab and
David Marche and
Bozena Kaminska},
title = {A perturbation based fault modeling and simulation for mixed-signal
circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {182--187},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643956},
doi = {10.1109/ATS.1997.643956},
timestamp = {Thu, 22 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/HamidaSMK97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HartjeGS97,
author = {Hendrik Hartje and
Michael G{\"{o}}ssel and
Egor S. Sogomonyan},
title = {Code-Disjoint Circuits for Parity Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {100},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643929},
doi = {10.1109/ATS.1997.643929},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HartjeGS97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HashizumeKT97,
author = {Masaki Hashizume and
Toshimasa Kuchii and
Takeomi Tamesada},
title = {Supply Current Test for Unit-to-unit Variations of Electrical Characteristics
in Gates},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {372--377},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643985},
doi = {10.1109/ATS.1997.643985},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HashizumeKT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HatayamaITUS97,
author = {Kazumi Hatayama and
Mitsuji Ikeda and
Masahiro Takakura and
Satoshi Uchiyama and
Yoriyuki Sakamoto},
title = {Application of a Design for Delay Testability Approach to High Speed
Logic LSIs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {112--115},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643944},
doi = {10.1109/ATS.1997.643944},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HatayamaITUS97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HosokawaHOMK97,
author = {Toshinori Hosokawa and
Toshihiro Hiraoka and
Mitsuyasu Ohta and
Michiaki Muraoka and
Shigeo Kuninobu},
title = {A Partial Scan Design Method Based on n-Fold Line-up Structures},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {306},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643975},
doi = {10.1109/ATS.1997.643975},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HosokawaHOMK97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuLWC97,
author = {Chih Wei Hu and
Chung{-}Len Lee and
Wen Ching Wu and
Jwu E. Chen},
title = {Fault diagnosis of odd-even sorting networks},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {288},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643972},
doi = {10.1109/ATS.1997.643972},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuLWC97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangHL97,
author = {Tsung{-}Chu Huang and
Min{-}Cheng Huang and
Kuen{-}Jong Lee},
title = {Built-in current sensor designs based on the bulk-driven technique},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {384},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643987},
doi = {10.1109/ATS.1997.643987},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangHL97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/HuangZML97,
author = {Wei{-}Kang Huang and
M. Y. Zhang and
Fred J. Meyer and
Fabrizio Lombardi},
title = {A XOR-Tree Based Technique for Constant Testability of Configurable
FPGAs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {248--253},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643966},
doi = {10.1109/ATS.1997.643966},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/HuangZML97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IchiharaK97,
author = {Hideyuki Ichihara and
Kozo Kinoshita},
title = {On Acceleration of Logic Circuits Optimization Using Implication Relations},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {222--227},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643962},
doi = {10.1109/ATS.1997.643962},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IchiharaK97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/IguchiSM97,
author = {Yukihiro Iguchi and
Tsutomu Sasao and
Munehiro Matsuura},
title = {On Decomposition of Kleene TDDs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {234},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643964},
doi = {10.1109/ATS.1997.643964},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/IguchiSM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/InoueMF97,
author = {Tomoo Inoue and
Satoshi Miyazaki and
Hideo Fujiwara},
title = {On the Complexity of Universal Fault Diagnosis for Look-up Table FPGAs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {276--281},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643970},
doi = {10.1109/ATS.1997.643970},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/InoueMF97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ItazakiIK97,
author = {Noriyoshi Itazaki and
Yasutaka Idomoto and
Kozo Kinoshita},
title = {An Algorithmic Test Generation Method for Crosstalk Faults in Synchronous
Sequential Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {22},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643909},
doi = {10.1109/ATS.1997.643909},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ItazakiIK97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ItoT97,
author = {Takehiro Ito and
Itsuo Takanami},
title = {On fault injection approaches for fault tolerance of feedforward neural
networks},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {88--93},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643927},
doi = {10.1109/ATS.1997.643927},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ItoT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/JacometWWPG97,
author = {Marcel Jacomet and
Roger W{\"{a}}lti and
Lukas Winzenried and
Jaime Perez and
Martin Gysel},
title = {ProTest: {A} Low Cost Rapid Prototyping Test System for ASICs and
FPGAs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {138--142},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643949},
doi = {10.1109/ATS.1997.643949},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/JacometWWPG97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KajiharaS97,
author = {Seiji Kajihara and
Tsutomu Sasao},
title = {On the Adders with Minimum Tests},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {10--15},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643907},
doi = {10.1109/ATS.1997.643907},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KajiharaS97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/KomatsuMM97,
author = {F. Komatsu and
H. Motoki and
M. Miyoshi},
title = {A New Auto-Focus Method in Critical Dimension Measurement {SEM}},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {202--207},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643959},
doi = {10.1109/ATS.1997.643959},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/KomatsuMM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Kuji97,
author = {Norio Kuji},
title = {Guided-Probe Diagnosis of Macro-Cell-Designed {LSI} Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {174},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643955},
doi = {10.1109/ATS.1997.643955},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Kuji97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LaiPB97,
author = {Kowen Lai and
Christos A. Papachristou and
Mikhail Baklashov},
title = {{BIST} testability enhancement using high level test synthesis for
behavioral and structural designs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {338--342},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643980},
doi = {10.1109/ATS.1997.643980},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LaiPB97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/LongYLM97,
author = {Wangning Long and
Shiyuan Yang and
Zhongcheng Li and
Yinghua Min},
title = {Memory Efficient {ATPG} for Path Delay Faults},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {326--331},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643978},
doi = {10.1109/ATS.1997.643978},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/LongYLM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MichinishiYOIF97,
author = {Hiroyuki Michinishi and
Tokumi Yokohira and
Takuji Okamoto and
Tomoo Inoue and
Hideo Fujiwara},
title = {Testing for the programming circuit of LUT-based FPGAs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {242--247},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643965},
doi = {10.1109/ATS.1997.643965},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MichinishiYOIF97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MinZL97,
author = {Yinghua Min and
Zhuxing Zhao and
Zhongcheng Li},
title = {{IDDT} Testing},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {378--383},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643986},
doi = {10.1109/ATS.1997.643986},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MinZL97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MiuraNNF97,
author = {Katsuyoshi Miura and
Kohei Nakata and
Koji Nakamae and
Hiromu Fujioka},
title = {Automatic {EB} Fault Tracing System by Successive Circuit Extraction
from {VLSI} {CAD} Layout Data},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {162--167},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643953},
doi = {10.1109/ATS.1997.643953},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MiuraNNF97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MizunoKKTS97,
author = {Osamu Mizuno and
Shinji Kusumoto and
Tohru Kikuno and
Yasunari Takagi and
Keishi Sakamoto},
title = {Estimating the Number of Faults using Simulator based on Generalized
Stochastic Petri-Net Model},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {269},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643969},
doi = {10.1109/ATS.1997.643969},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MizunoKKTS97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/MoriMBM97,
author = {Junji Mori and
Ben Mathew and
Dave Burns and
Yeuk{-}Hai Mok},
title = {Testability Features of {R10000} Microprocessor},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {108--111},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643930},
doi = {10.1109/ATS.1997.643930},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/MoriMBM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NakaoHH97,
author = {Michinobu Nakao and
Kazumi Hatayama and
Isao Higashi},
title = {Accelerated Test Points Selection Method for Scan-Based {BIST}},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {359},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643983},
doi = {10.1109/ATS.1997.643983},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NakaoHH97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/NikawaI97,
author = {Kiyoshi Nikawa and
Shoji Inoue},
title = {New Capabilities of {OBIRCH} Method for Fault Localization and Defect
Detection},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {214},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643961},
doi = {10.1109/ATS.1997.643961},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/NikawaI97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OhtakeIF97,
author = {Satoshi Ohtake and
Tomoo Inoue and
Hideo Fujiwara},
title = {Sequential Test Generation Based on Circuit Pseudo-Transformation},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {62--67},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643919},
doi = {10.1109/ATS.1997.643919},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OhtakeIF97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OnoWHNY97,
author = {Toshinobu Ono and
Kazuo Wakui and
Hitoshi Hikima and
Yoshiyuki Nakamura and
Masaaki Yoshida},
title = {Integrated and Automated Design-for-Testability Implementation for
Cell-Based ICs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {122--125},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643946},
doi = {10.1109/ATS.1997.643946},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OnoWHNY97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/OzakiSWGUM97,
author = {Kazuyuki Ozaki and
Hidenori Sekiguchi and
Shinichi Wakana and
Yoshiro Goto and
Yasutoshi Umehara and
Jun Matsumoto},
title = {Novel Optical Probing System for Quarter-micron {VLSI} Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {208--213},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643960},
doi = {10.1109/ATS.1997.643960},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/OzakiSWGUM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PangWL97,
author = {Joseph C. W. Pang and
Mike W. T. Wong and
Yim{-}Shu Lee},
title = {Design and Implementation of Strongly Code-Disjoint {CMOS} Built-in
Intermediate Voltage Sensor for Totally Self-Checking Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {82--87},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643925},
doi = {10.1109/ATS.1997.643925},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PangWL97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ParkC97,
author = {Gang{-}Min Park and
Hoon Chang},
title = {An extended march test algorithm for embedded memories},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {404--409},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643990},
doi = {10.1109/ATS.1997.643990},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ParkC97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PerbostLL97,
author = {Marc Perbost and
Ludovic Le Lan and
Christian Landrault},
title = {Automatic Testability Analysis of Boards and MCMs at Chip Level},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {36--41},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643913},
doi = {10.1109/ATS.1997.643913},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PerbostLL97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR97,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {On the Compaction of Test Sets Produced by Genetic Optimization},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {4--9},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643906},
doi = {10.1109/ATS.1997.643906},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzR97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/PomeranzR97a,
author = {Irith Pomeranz and
Sudhakar M. Reddy},
title = {{TEMPLATES:} {A} Test Generation Procedure for Synchronous Sequential
Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {74},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643923},
doi = {10.1109/ATS.1997.643923},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/PomeranzR97a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/RenovellPFZ97,
author = {Michel Renovell and
Jean{-}Michel Portal and
Joan Figueras and
Yervant Zorian},
title = {Test Pattern and Test Configuration Generation Methodology for the
Logic of RAM-Based {FPGA}},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {254},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643967},
doi = {10.1109/ATS.1997.643967},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/RenovellPFZ97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Savir97,
author = {Jacob Savir},
title = {On The Tradeoff Between Number of Clocks and Number of Latches in
Shift Registers},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {296--299},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643973},
doi = {10.1109/ATS.1997.643973},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Savir97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Savir97a,
author = {Jacob Savir},
title = {On Chip Weighted Random Patterns},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {343--352},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643981},
doi = {10.1109/ATS.1997.643981},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Savir97a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/ShinogiHT97,
author = {Tsuyoshi Shinogi and
Terumine Hayashi and
Kazuo Taki},
title = {Test Generation for Stuck-On Faults in BDD-Based Pass-Transistor Logic
{SPL}},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {16--21},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643908},
doi = {10.1109/ATS.1997.643908},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/ShinogiHT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SongC97,
author = {MoonBae Song and
Hoon Chang},
title = {A variable reordering method for fast optimization of binary decision
diagrams},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {228--233},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643963},
doi = {10.1109/ATS.1997.643963},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SongC97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/SuCCT97,
author = {Chauchin Su and
Yi{-}Ren Cheng and
Yue{-}Tsang Chen and
Shing Tenchen},
title = {Analog signal metrology for mixed signal ICs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {194},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643958},
doi = {10.1109/ATS.1997.643958},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/SuCCT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TakahashiBTM97,
author = {Hiroshi Takahashi and
Kwame Osei Boateng and
Yuzo Takamatsu and
Toshiyuki Matsunaga},
title = {A Method of Generating Tests for Marginal Delays an Delay Faults in
Combinational Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {320--325},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643977},
doi = {10.1109/ATS.1997.643977},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TakahashiBTM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/TsunoyamaUK97,
author = {Masahiro Tsunoyama and
Masahiko Uenoyama and
Tatsuya Kabasawa},
title = {A concurrent fault-detection scheme for {FFT} processors},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {94--99},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643928},
doi = {10.1109/ATS.1997.643928},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/TsunoyamaUK97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Wen97,
author = {Xiaoqing Wen},
title = {Fault Diagnosis for Static {CMOS} Circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {282--287},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643971},
doi = {10.1109/ATS.1997.643971},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Wen97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Wu97,
author = {Cheng{-}Wen Wu},
title = {On energy efficiency of {VLSI} testing},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {132--137},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643948},
doi = {10.1109/ATS.1997.643948},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Wu97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/WuG97,
author = {Yuejian Wu and
Sanjay Gupta},
title = {Built-In Self-Test for Multi-Port RAMs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {398--403},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643989},
doi = {10.1109/ATS.1997.643989},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/WuG97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/XuWDS97,
author = {Shiyi Xu and
Peter Waignjo and
Percy G. Dias and
Bole Shi},
title = {Testability Prediction for Sequential Circuits Using Neural Network},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {48},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643916},
doi = {10.1109/ATS.1997.643916},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/XuWDS97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/Yamaguchi97,
author = {Takahiro J. Yamaguchi},
title = {Static Testing of ADCs Using Wavelet Transforms},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {188--193},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643957},
doi = {10.1109/ATS.1997.643957},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/Yamaguchi97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YamazakiY97,
author = {Koji Yamazaki and
Teruhiko Yamada},
title = {An approach to diagnose logical faults in partially observable sequential
circuits},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {168--173},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643954},
doi = {10.1109/ATS.1997.643954},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YamazakiY97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YangP97,
author = {Cheer{-}Sun D. Yang and
Lori L. Pollock},
title = {An Algorithm for All-du-path Testing Coverage of Shared Memory Parallel
Programs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {263--268},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643968},
doi = {10.1109/ATS.1997.643968},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YangP97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YokoyamaWT97,
author = {Hiroshi Yokoyama and
Xiaoqing Wen and
Hideo Tamamoto},
title = {Random Pattern Testable Design with Partial Circuit Duplication},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {353--358},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643982},
doi = {10.1109/ATS.1997.643982},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YokoyamaWT97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YoshidaSMH97,
author = {Takaki Yoshida and
Reisuke Shimoda and
Takashi Mizokawa and
Katsuhiro Hirayama},
title = {An effective fault simulation method for core based {LSI}},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {116--121},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643945},
doi = {10.1109/ATS.1997.643945},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YoshidaSMH97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/ats/YuM97,
author = {Xiaoming Yu and
Yinghua Min},
title = {Design of delay-verifiable combinational logic by adding extra inputs},
booktitle = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
pages = {332},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://doi.org/10.1109/ATS.1997.643979},
doi = {10.1109/ATS.1997.643979},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/ats/YuM97.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/ats/1997,
title = {6th Asian Test Symposium {(ATS} '97), 17-18 November 1997, Akita,
Japan},
publisher = {{IEEE} Computer Society},
year = {1997},
url = {https://ieeexplore.ieee.org/xpl/conhome/5068/proceeding},
isbn = {0-8186-8209-4},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/ats/1997.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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the dblp computer science bibliography is funded and supported by:
