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@inproceedings{DBLP:conf/dft/AnNM13,
author = {Ting An and
Lirida Alves de Barros Naviner and
Philippe Matherat},
title = {A low cost reliable architecture for S-Boxes in {AES} processors},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {155--160},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653599},
doi = {10.1109/DFT.2013.6653599},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/AnNM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BaranowskiCILW13,
author = {Rafal Baranowski and
Alejandro Cook and
Michael E. Imhof and
Chang Liu and
Hans{-}Joachim Wunderlich},
title = {Synthesis of workload monitors for on-line stress prediction},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {137--142},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653596},
doi = {10.1109/DFT.2013.6653596},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BaranowskiCILW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BawaRT13,
author = {Asad Amin Bawa and
Muhammad Tauseef Rab and
Nur A. Touba},
title = {Efficient compression of x-masking control data via dynamic channel
allocation},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {125--130},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653594},
doi = {10.1109/DFT.2013.6653594},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BawaRT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BianWKL13,
author = {Kun Bian and
D. M. H. Walker and
Sunil P. Khatri and
Shayak Lahiri},
title = {Mixed structural-functional path delay test generation and compaction},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {7--12},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653575},
doi = {10.1109/DFT.2013.6653575},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BianWKL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BolchiniCMDKV13,
author = {Cristiana Bolchini and
Matteo Carminati and
Antonio Miele and
Anup Das and
Akash Kumar and
Bharadwaj Veeravalli},
title = {Run-time mapping for reliable many-cores based on energy/performance
trade-offs},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {58--64},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653583},
doi = {10.1109/DFT.2013.6653583},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BolchiniCMDKV13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/BolchiniQSG13,
author = {Cristiana Bolchini and
Elisa Quintarelli and
Fabio Salice and
Paolo Garza},
title = {A data mining approach to incremental adaptive functional diagnosis},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {13--18},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653576},
doi = {10.1109/DFT.2013.6653576},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/BolchiniQSG13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/CampitelliOPMFL13,
author = {Stefano Campitelli and
Marco Ottavi and
Salvatore Pontarelli and
Alessandro Marchioro and
Daniele Felici and
Fabrizio Lombardi},
title = {{F-DICE:} {A} multiple node upset tolerant flip-flop for highly radioactive
environments},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {107--111},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653591},
doi = {10.1109/DFT.2013.6653591},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/CampitelliOPMFL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ChapmanTKK13,
author = {Glenn H. Chapman and
Rohit Thomas and
Israel Koren and
Zahava Koren},
title = {Improved image accuracy in Hot Pixel degraded digital cameras},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {172--177},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653602},
doi = {10.1109/DFT.2013.6653602},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ChapmanTKK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ContrerasRT13,
author = {Gustavo K. Contreras and
Md. Tauhidur Rahman and
Mohammad Tehranipoor},
title = {Secure Split-Test for preventing {IC} piracy by untrusted foundry
and assembly},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {196--203},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653606},
doi = {10.1109/DFT.2013.6653606},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ContrerasRT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DalirsaniKW13,
author = {Atefe Dalirsani and
Michael A. Kochte and
Hans{-}Joachim Wunderlich},
title = {SAT-based code synthesis for fault-secure circuits},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {39--44},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653580},
doi = {10.1109/DFT.2013.6653580},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DalirsaniKW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DaraHT13,
author = {Chandra Babu Dara and
Themistoklis Haniotakis and
Spyros Tragoudas},
title = {Low power and high speed current-mode memristor-based TLGs},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {89--94},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653588},
doi = {10.1109/DFT.2013.6653588},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DaraHT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DhiaNM13,
author = {Arwa Ben Dhia and
Lirida A. B. Naviner and
Philippe Matherat},
title = {Evaluating {CLB} designs under multiple SETs in SRAM-based FPGAs},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {112--117},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653592},
doi = {10.1109/DFT.2013.6653592},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DhiaNM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/DogaruSR13,
author = {Emanuel Dogaru and
Filipe Vinci dos Santos and
William Rebernak},
title = {LMS-based {RF} {BIST} architecture for multistandard transmitters},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653595},
doi = {10.1109/DFT.2013.6653595},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/DogaruSR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GaneshA13,
author = {Natesh Ganesh and
Neal G. Anderson},
title = {On-chip error correction with unreliable decoders: Fundamental physical
limits},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {284--289},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653620},
doi = {10.1109/DFT.2013.6653620},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GaneshA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/GuoHJW13,
author = {Jianghao Guo and
Qiang Han and
Wen{-}Ben Jone and
Yu{-}Liang Wu},
title = {A cross-layer fault-tolerant design method for high manufacturing
yield and system reliability},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {71--76},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653585},
doi = {10.1109/DFT.2013.6653585},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/GuoHJW13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/HungPGP13,
author = {J.{-}Y. Hung and
Noh{-}Jin Park and
K. M. George and
Nohpill Park},
title = {Modeling and analysis of repair and maintenance processes in Fault
Tolerant Systems},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {261--265},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653616},
doi = {10.1109/DFT.2013.6653616},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/HungPGP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KhaleghiR13,
author = {Soroush Khaleghi and
Wenjing Rao},
title = {Spare sharing network enhancement for scalable systems},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {249--254},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653614},
doi = {10.1109/DFT.2013.6653614},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KhaleghiR13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KhanK13,
author = {Muhammad Aamir Khan and
Hans G. Kerkhoff},
title = {Analysing degradation effects in charge-redistribution {SAR} ADCs},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {65--70},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653584},
doi = {10.1109/DFT.2013.6653584},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KhanK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KleebergerMS13,
author = {Veit Kleeberger and
Daniel Mueller{-}Gritschneder and
Ulf Schlichtmann},
title = {Technology-aware system failure analysis in the presence of soft errors
by Mixture Importance Sampling},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {118--124},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653593},
doi = {10.1109/DFT.2013.6653593},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KleebergerMS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/KumarSLGK13,
author = {Manoj Kumar and
Pankaj Kumar Srivastava and
Vijay Laxmi and
Manoj Singh Gaur and
Seok{-}Bum Ko},
title = {Reconfigurable distributed fault tolerant routing algorithm for on-chip
networks},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {290--295},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653621},
doi = {10.1109/DFT.2013.6653621},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/KumarSLGK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LeeT13,
author = {Yu{-}Wei Lee and
Nur A. Touba},
title = {Unified 3D test architecture for variable test data bandwidth across
pre-bond, partial stack, and post-bond test},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {184--189},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653604},
doi = {10.1109/DFT.2013.6653604},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LeeT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LiT13,
author = {Jianli Li and
Qingping Tan},
title = {SmartInjector: Exploiting intelligent fault injection for {SDC} rate
analysis},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {236--242},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653612},
doi = {10.1109/DFT.2013.6653612},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LiT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LiuCANNP13,
author = {Kaikai Liu and
Hao Cai and
Ting An and
Lirida A. B. Naviner and
Jean{-}Fran{\c{c}}ois Naviner and
Herv{\'{e}} Petit},
title = {Reliability analysis of combinational circuits with the influences
of noise and single-event transients},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {218--223},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653609},
doi = {10.1109/DFT.2013.6653609},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LiuCANNP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/LiuRYK13,
author = {Chen Liu and
Jeyavijayan Rajendran and
Chengmo Yang and
Ramesh Karri},
title = {Shielding heterogeneous MPSoCs from untrustworthy 3PIPs through security-driven
task scheduling},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {101--106},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653590},
doi = {10.1109/DFT.2013.6653590},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/LiuRYK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MaebashiNK13,
author = {Kouta Maebashi and
Kazuteru Namba and
Masato Kitakami},
title = {Testing of switch blocks in TSV-reduced Three-Dimensional {FPGA}},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {302--307},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653623},
doi = {10.1109/DFT.2013.6653623},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MaebashiNK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MansoorGY13,
author = {Naseef Mansoor and
Amlan Ganguly and
Manoj Prashanth Yuvaraj},
title = {An energy-efficient and robust millimeter-wave Wireless Network-on-Chip
architecture},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {19--24},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653577},
doi = {10.1109/DFT.2013.6653577},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MansoorGY13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MirbahaDT13,
author = {Amir{-}Pasha Mirbaha and
Jean{-}Max Dutertre and
Assia Tria},
title = {Differential analysis of Round-Reduced {AES} faulty ciphertexts},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {204--211},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653607},
doi = {10.1109/DFT.2013.6653607},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MirbahaDT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MohammadiGYM13,
author = {Hassan Ghasemzadeh Mohammadi and
Pierre{-}Emmanuel Gaillardon and
Majid Yazdani and
Giovanni De Micheli},
title = {A fast TCAD-based methodology for Variation analysis of emerging nano-devices},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {83--88},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653587},
doi = {10.1109/DFT.2013.6653587},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MohammadiGYM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/MoreiraOMC13,
author = {Matheus T. Moreira and
Bruno S. Oliveira and
Fernando Gehm Moraes and
Ney Laert Vilar Calazans},
title = {Charge sharing aware {NCL} gates design},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {212--217},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653608},
doi = {10.1109/DFT.2013.6653608},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/MoreiraOMC13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/NambaL13,
author = {Kazuteru Namba and
Fabrizio Lombardi},
title = {A novel scheme for concurrent error detection of {OLS} parallel decoders},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {52--57},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653582},
doi = {10.1109/DFT.2013.6653582},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/NambaL13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/NepalSDMB13,
author = {Kundan Nepal and
Xi Shen and
Jennifer Dworak and
Theodore W. Manikas and
R. Iris Bahar},
title = {Built-in Self-Repair in a 3D die stack using programmable logic},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {243--248},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653613},
doi = {10.1109/DFT.2013.6653613},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/NepalSDMB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/PalerKPH13,
author = {Alexandru Paler and
Josef Kinseher and
Ilia Polian and
John P. Hayes},
title = {Approximate simulation of circuits with probabilistic behavior},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {95--100},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653589},
doi = {10.1109/DFT.2013.6653589},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/PalerKPH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Pomeranz13,
author = {Irith Pomeranz},
title = {Classes of difficult-to-diagnose transition fault clusters},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {1--6},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653574},
doi = {10.1109/DFT.2013.6653574},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Pomeranz13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RaoRP13,
author = {Sushmita Kadiyala Rao and
Ryan W. Robucci and
Chintan Patel},
title = {Framework for dynamic estimation of power-supply noise and path delay},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {272--277},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653618},
doi = {10.1109/DFT.2013.6653618},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/RaoRP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RehmanBA13,
author = {Saif{-}Ur Rehman and
Mounir Benabdenbi and
Lorena Anghel},
title = {{BIST} for logic and local interconnect resources in a novel mesh
of cluster {FPGA}},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {296--301},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653622},
doi = {10.1109/DFT.2013.6653622},
timestamp = {Mon, 26 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/RehmanBA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ReviriegoLMLTD13,
author = {Pedro Reviriego and
Shih{-}Fu Liu and
Juan Antonio Maestro and
S. Lee and
Nur A. Touba and
Rudrajit Datta},
title = {Implementing triple adjacent Error Correction in double error correction
Orthogonal Latin Squares Codes},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {167--171},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653601},
doi = {10.1109/DFT.2013.6653601},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ReviriegoLMLTD13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/RodriguesK13,
author = {Rance Rodrigues and
Sandip Kundu},
title = {A low power architecture for online detection of execution errors
in {SMT} processors},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {33--38},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653579},
doi = {10.1109/DFT.2013.6653579},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/RodriguesK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SalmaniT13,
author = {Hassan Salmani and
Mohammad Tehranipoor},
title = {Analyzing circuit vulnerability to hardware Trojan insertion at the
behavioral level},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {190--195},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653605},
doi = {10.1109/DFT.2013.6653605},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SalmaniT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SarafianosLGSRDT13,
author = {Alexandre Sarafianos and
Mathieu Lisart and
Olivier Gagliano and
Valerie Serradeil and
Cyril Roscian and
Jean{-}Max Dutertre and
Assia Tria},
title = {Robustness improvement of an {SRAM} cell against laser-induced fault
injection},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {149--154},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653598},
doi = {10.1109/DFT.2013.6653598},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SarafianosLGSRDT13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SerafyS13,
author = {Caleb Serafy and
Ankur Srivastava},
title = {Online {TSV} health monitoring and built-in self-repair to overcome
aging},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {224--229},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653610},
doi = {10.1109/DFT.2013.6653610},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SerafyS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SimevskiKK13,
author = {Aleksandar Simevski and
Rolf Kraemer and
Milos Krstic},
title = {Automated integration of fault injection into the {ASIC} design flow},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {255--260},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653615},
doi = {10.1109/DFT.2013.6653615},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SimevskiKK13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/SkitsasNM13,
author = {Michael A. Skitsas and
Chrysostomos Nicopoulos and
Maria K. Michael},
title = {DaemonGuard: O/S-assisted selective software-based Self-Testing for
multi-core systems},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {45--51},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653581},
doi = {10.1109/DFT.2013.6653581},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/SkitsasNM13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/Skoncej13,
author = {Patryk Skoncej},
title = {Fault Injection Framework for embedded memories},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {77--82},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653586},
doi = {10.1109/DFT.2013.6653586},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/Skoncej13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TanTX13,
author = {Lanfang Tan and
Ying Tan and
Jianjun Xu},
title = {{CFEDR:} Control-flow error detection and recovery using encoded signatures
monitoring},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {25--32},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653578},
doi = {10.1109/DFT.2013.6653578},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TanTX13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/TaouilHMB13,
author = {Mottaqiallah Taouil and
Said Hamdioui and
Erik Jan Marinissen and
Sudipta Bhawmik},
title = {Impact of mid-bond testing in 3D stacked ICs},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {178--183},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653603},
doi = {10.1109/DFT.2013.6653603},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/TaouilHMB13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/VatajeluTDBGPTVWS13,
author = {Elena I. Vatajelu and
Georgios Tsiligiannis and
Luigi Dilillo and
Alberto Bosio and
Patrick Girard and
Serge Pravossoudovitch and
Aida Todri and
Arnaud Virazel and
Frederic Wrobel and
Fr{\'{e}}d{\'{e}}ric Saign{\'{e}}},
title = {On the correlation between Static Noise Margin and Soft Error Rate
evaluated for a 40nm {SRAM} cell},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {143--148},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653597},
doi = {10.1109/DFT.2013.6653597},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/VatajeluTDBGPTVWS13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/YoshimuraOH13,
author = {Masayoshi Yoshimura and
Amy Ogita and
Toshinori Hosokawa},
title = {A smart Trojan circuit and smart attack method in {AES} encryption
circuits},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {278--283},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653619},
doi = {10.1109/DFT.2013.6653619},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/YoshimuraOH13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/YuF13,
author = {Qiaoyan Yu and
Jonathan Frey},
title = {Exploiting error control approaches for Hardware Trojans on Network-on-Chip
links},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {266--271},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653617},
doi = {10.1109/DFT.2013.6653617},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/YuF13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ZhangA13,
author = {Meilin Zhang and
Paul Ampadu},
title = {Variation-tolerant cache by two-layer error control codes},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653600},
doi = {10.1109/DFT.2013.6653600},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ZhangA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/dft/ZhongKA13,
author = {Shida Zhong and
S. Saqib Khursheed and
Bashir M. Al{-}Hashimi},
title = {Impact of {PVT} variation on delay test of resistive open and resistive
bridge defects},
booktitle = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
pages = {230--235},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://doi.org/10.1109/DFT.2013.6653611},
doi = {10.1109/DFT.2013.6653611},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/dft/ZhongKA13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/dft/2013,
title = {2013 {IEEE} International Symposium on Defect and Fault Tolerance
in {VLSI} and Nanotechnology Systems, {DFTS} 2013, New York City,
NY, USA, October 2-4, 2013},
publisher = {{IEEE} Computer Society},
year = {2013},
url = {https://ieeexplore.ieee.org/xpl/conhome/6644330/proceeding},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/dft/2013.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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