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@inproceedings{DBLP:conf/itc/AbadirR85,
author = {Magdy S. Abadir and
Hassan K. Reghbati},
title = {Functional Test Generation for {LSI} Circuits Described by Binary
Decision Diagrams},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {483--492},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 15:59:32 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbadirR85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Abramovici85,
author = {Miron Abramovici},
title = {Low-Cost Fault Simulation: Why, When and How},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {795},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Abramovici85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbramoviciKMM85,
author = {Miron Abramovici and
James J. Kulikowski and
Premachandran R. Menon and
David T. Miller},
title = {Test Generation In Lamp2: System Overview},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {45--48},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbramoviciKMM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AbramoviciKMM85a,
author = {Miron Abramovici and
James J. Kulikowski and
Premachandran R. Menon and
David T. Miller},
title = {Test Generation In Lamp2: Concepts and Algorithms},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {49--56},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AbramoviciKMM85a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AdilettaCG85,
author = {Matthew Adiletta and
Elizabeth M. Cooper and
Keith Gutfreund},
title = {Automatic Test Generation for Generic Scan Designs},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {40--44},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AdilettaCG85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AgarwalR85,
author = {Vinod K. Agarwal and
Janusz Rajski},
title = {Testing Properties and Applications of Inverter-Free PLA's},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {500--507},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AgarwalR85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Agrawal85,
author = {Vishwani D. Agrawal},
title = {{STAFAN} Takes a Middle Course},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {796},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Agrawal85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Allaire85,
author = {William P. Allaire},
title = {Case Study: {ATE} Networking Using Peripheral Emulation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {954--961},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Allaire85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Apfelbaum85,
author = {Larry Apfelbaum},
title = {An Expert System for In-Circuit Fault Diagnosis},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {868--874},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Apfelbaum85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/AthertonM85,
author = {Robert W. Atherton and
John L. Mudge},
title = {Microprocessor Speed Optimization Using Pattern-Recognition Analysis
of Parametric Test Data},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {938--948},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/AthertonM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BardellM85,
author = {Paul H. Bardell and
William H. McAnney},
title = {Self-Test of Random Access Memories},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {352--355},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BardellM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BarzilaiIRS85,
author = {Zeev Barzilai and
Vijay S. Iyengar and
Barry K. Rosen and
Gabriel M. Silberman},
title = {Accurate Fault Modeling and Efficient Simulation of Differential {CVS}
Circuits},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {722--731},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BarzilaiIRS85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/BastoK85,
author = {Luis A. Basto and
John R. Kuban},
title = {Test Features ot the {MC68881} Floating-Point Coprocessor},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {752--759},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/BastoK85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Beenker85,
author = {Frans P. M. Beenker},
title = {Systematic and Structured Methods for Digital Board Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {380--385},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Beenker85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Bhavsar85,
author = {Dilip K. Bhavsar},
title = {"Concatenable Polydividers": Bit-Sliced {LFSR} Chips for Board Self-Test},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {88--93},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Bhavsar85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Boulton85,
author = {Herb Boulton},
title = {New Concepts of Applying Thermographic Testing to Printed Circuit
Boards and Finished Products},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {413--419},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Boulton85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Brglez85,
author = {Franc Brglez},
title = {A Fast Fault Grader: Analysis and Applications},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {785--794},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Brglez85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Brglez85a,
author = {Franc Brglez},
title = {Fault Coverage Tools: Case Studies},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {797--800},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Brglez85a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Browning85,
author = {Clyde Browning},
title = {Testing {A/D} Converters on Microcomputers},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {818--824},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Browning85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChandramouliS85,
author = {R. Chandramouli and
Hector R. Sucar},
title = {Defect Analysis and Fault Modeling in {MOS} Technology},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {313--321},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChandramouliS85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChenMN85,
author = {Harry H. Chen and
Robert G. Mathews and
John A. Newkirk},
title = {An Algorithm to Generate Tests for {MOS} Circuits at the Switch Level},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {304--312},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Tue, 27 Jun 2006 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/ChenMN85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChengP85,
author = {Wu{-}Tung Cheng and
Janak H. Patel},
title = {Multiple-Fault Detection in Iterative Logic Arrays},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {493--499},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChengP85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ChinM85,
author = {Cary K. Chin and
Edward J. McCluskey},
title = {Test Length for Pseudo Random Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {94--99},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ChinM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Chu85,
author = {David C. Chu},
title = {Calibration of Systematic Errors in Precision Time-Interval Counters},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {185--190},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Chu85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Congdon85,
author = {James Congdon},
title = {Driver/Sensor Design for High-Performance {ATE}},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {629--633},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Congdon85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Contini85,
author = {Maurizio Contini},
title = {The Autopal Test Process},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {279--285},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Contini85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CorleyC85,
author = {William Corley and
David S. Curry},
title = {{RF} Calibration in {ATE} Systems},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {180--184},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CorleyC85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/CraigK85,
author = {Gary L. Craig and
Charles R. Kime},
title = {Pseudo-Exhaustive Adjacency Testing: {A} {BIST} Approach for Stuck-Open
Faults},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {126--139},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/CraigK85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Curry85,
author = {David S. Curry},
title = {Semiconductor Test Equipment Viewed as an Auto-Alignment System},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {153--158},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Curry85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Dapron85,
author = {Michael Dapron},
title = {Linking Design Tools to In-Circuit Test Systems},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {962--971},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Dapron85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/DayhoffA85,
author = {Judith E. Dayhoff and
Robert W. Atherton},
title = {Financial Implications of a Detailed Analysis of Test Floor Operations},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {23--32},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/DayhoffA85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Downey85,
author = {Arthur E. Downey},
title = {Waveform: {A} Software Tool for Efficient Test Program Development},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {672--677},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Downey85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Eichelberger85,
author = {Edward B. Eichelberger},
title = {Experiences and Expectations in {VLSI} Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {4},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Eichelberger85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/EigerC85,
author = {Martin I. Eiger and
Michele J. Chabot},
title = {Algorithms for High-Performance Fixture Wiring},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {602--609},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/EigerC85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FalkenstromKPRW85,
author = {L. J. Falkenstrom and
David C. Keezer and
A. Patterson and
Robert M. Rolfe and
J. Wolcott},
title = {Tester Independent Support Software System {(TISSS)}},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {685--691},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 18 Sep 2006 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/FalkenstromKPRW85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FasangSSG85,
author = {Patrick P. Fasang and
Michael A. Schuette and
John Paul Shen and
William A. Gwaltney},
title = {Automated Design for Testability of Semicustom Integrated Circuits},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {558--564},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FasangSSG85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FeiziR85,
author = {Ali Feizi and
Damu Radhakrishnan},
title = {Multiple Output Pass Networks: Design and Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {907--911},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FeiziR85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FeugateM85,
author = {Robert J. Feugate Jr. and
Steven M. McIntyre},
title = {Training Tomorrow's Test Engineers: Experiences in Teaching an Undergraduate
Course in {VLSI} Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {224--229},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FeugateM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Filippone85,
author = {Stephen F. Filippone},
title = {Automating Test-Bed Fault Detection and Diagnosis},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {386--392},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Filippone85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FujiedaA85,
author = {T. Fujieda and
N. Arai},
title = {Considerations of the Testing of RAMs with Dual Ports},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {456--461},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FujiedaA85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FujiiA85,
author = {Robert H. Fujii and
Jacob A. Abraham},
title = {Self-Test for Microprocessors},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {356--361},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FujiiA85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/FujiwaraSK85,
author = {Hideo Fujiwara and
Kewal K. Saluja and
Kozo Kinoshita},
title = {A Testable Design of Programmable Logic Arrays with Universal Control
and Minimal Overhead},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {574--582},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/FujiwaraSK85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GilesBHM85,
author = {David Giles and
Kenneth R. Bowden and
Mike Haney and
Gregory A. Maston},
title = {Maintaining Simulation Accuracy through Physical Device Models},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {692--695},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GilesBHM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GilesH85,
author = {Grady Giles and
Craig Hunter},
title = {A Methodology for Testing Content Addressable Memories},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {471--475},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GilesH85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Gillette85,
author = {Garry C. Gillette},
title = {Timing Accuracy Measurement System},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {220--223},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Gillette85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoelH85,
author = {Prabhakar Goel and
Chi{-}Lai Huang},
title = {Statistical Fault Sampling and Full Fault Simulation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {801--802},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoelH85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GoldbergL85,
author = {Andrew V. Goldberg and
Karl J. Lieberherr},
title = {Efficient Test Generation Algorithms},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {508--517},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GoldbergL85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GrillmeyerW85,
author = {Oliver Grillmeyer and
A. Jesse Wilkinson},
title = {The Design and Construction of a Rule Base and an Inference Engine
for Test System Diagnosis},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {857--867},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GrillmeyerW85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/GrubbsN85,
author = {Albert B. Grubbs Jr. and
Glenn Neland},
title = {Future Trends in Test of Electronic Circuits With Implications tor
Entry Level Test Professionals},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {230--234},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/GrubbsN85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HaR85,
author = {Dong Sam Ha and
Sudhakar M. Reddy},
title = {On the Design of Testable Domino PLAs},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {567--573},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HaR85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hansen85,
author = {Peter Hansen},
title = {Converting Device Test Vectors to an In-Circuit Board Test Environment},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {972--979},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Hansen85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HealyU85,
author = {Jim Healy and
Gary Ure},
title = {A Method of Reducing {ATE} System Error Components and Guaranteeing
Subnanosecond Measurement Accuracies},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {191--202},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HealyU85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Helms85,
author = {Howard D. Helms},
title = {Various Architectures of Systems for Measuring Early-Life Failure
Rates of Semiconductor Components},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {540--543},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Helms85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Hendriks85,
author = {Josef H. Hendriks},
title = {Overdriving {NMOS} and {CMOS} {VLSI} Circuits},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {534--539},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Hendriks85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HielscherP85,
author = {Frank H. Hielscher and
John C. Pagano},
title = {Backdrive Stress-Testing of {CMOS} Gate Array Circuits},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {523--533},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HielscherP85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/HungW85,
author = {Angelo C. Hung and
Francis C. Wang},
title = {A Method for Test Generation Directly from Testability Analysis},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {62--78},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/HungW85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/JacobB85,
author = {James Jacob and
Nripendra N. Biswas},
title = {: {A} Testable {PLA} Design with Minimal Hardware and Test Set},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {583--588},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/JacobB85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jacobson85,
author = {David M. Jacobson},
title = {A Fast, Probabilistic Algorithm for Functional Testing of Random Access
Memory Systems},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {169--179},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Jacobson85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Jones85,
author = {Scott T. Jones},
title = {Flexible Inspection Systems {(FIS)} for Printed Circuit Board Production:
{ATE} Finds a Quality Partner},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {403--412},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Jones85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KawamuraH85,
author = {Masahiko Kawamura and
Kanji Hirabayashi},
title = {{AFS} : An Approximate Fault Simulator},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {717--721},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KawamuraH85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Kazakos85,
author = {D. Kazakos},
title = {Statistical Failure Detection Methods for Linear Analog Systems},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {808--812},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Kazakos85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KitayoshiSST85,
author = {H. Kitayoshi and
S. Sumida and
K. Shirakawa and
S. Takeshita},
title = {{DSP} Synthesized Signal Source for Analog Testing Stimulus and New
Test Method},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {825--834},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KitayoshiSST85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Klosterman85,
author = {Sherri Klosterman},
title = {A Computer System Diagnostic Strategy Based on ROM-Resident Diagnostics},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {140--144},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Klosterman85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KoPH85,
author = {Uming Ko and
Dinesh G. Patel and
Francois J. Henley},
title = {Contactless {VLSI} Laser Probing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {930--937},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KoPH85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KooL85,
author = {Frances D. Koo and
Gene W. Lee},
title = {Isolating Failures within {VLSI} Chips That Incorporate Signature
Analysis and Set/Scan Techniques},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {372--379},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KooL85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KovijanicK85,
author = {Predrag G. Kovijanic and
Ramesh G. Kulkarni},
title = {Testability Analysis of Programmable Array Logic},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {760--768},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KovijanicK85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrasniewskiA85,
author = {Andrzej Krasniewski and
Alexander Albicki},
title = {Automatic Design of Exhaustively Self-Testing Chips with Bilbo Modules},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {362--371},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrasniewskiA85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KrishnamurthyS85,
author = {Balakrishnan Krishnamurthy and
Richard Li{-}Cheng Sheng},
title = {A New Approach to the Use of Testability Analysis in Test Generation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {769--778},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KrishnamurthyS85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/KujiT85,
author = {Norio Kuji and
Teruo Tamama},
title = {Automated Fault Diagnostic {EB} Tester and Its Application to a 40K-Gate
{VLSI} Circuit},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {643--651},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/KujiT85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LahmanJ85,
author = {H. S. Lahman and
C. L. Johnson},
title = {A Computerized Solution to the Fixture-Wiring Problem},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {610--617},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LahmanJ85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LamCL85,
author = {Albert Lam and
Savio N. Chau and
Huy Luong},
title = {Design of a Class of Self-Exercising Combinational Circuits},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {589--601},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LamCL85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LeeL85,
author = {S. Daniel Lee and
Lisa Deerr Li},
title = {A Comprehensive Approach to Test Program Debugging for High Performance
{VLSI} Test Systems},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {652--665},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LeeL85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lenhert85,
author = {Donald H. Lenhert},
title = {The Uses and Costs of the Addition of Remote Operation Capability
to New Products},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {159--168},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lenhert85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LinS85,
author = {Tonysheng Lin and
Stephen Y. H. Su},
title = {{VLSI} Functional Test Pattern Generation: {A} Design and Implementation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {922--929},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LinS85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Lindsay85,
author = {Ken Lindsay},
title = {Low Cost Test System Speeds Design Verification for Custom {VLSI}},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {33--39},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Lindsay85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Liu85,
author = {Bell Liu},
title = {The Challenge of Configurable Logic Array Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {912--921},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Liu85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/LuskyS85,
author = {Stephen L. Lusky and
Thirumalai Sridhar},
title = {Detectable {CMOS} Faults in Switch-Level Simulation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {875--883},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Tue, 09 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/LuskyS85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MahmoodME85,
author = {Aamer Mahmood and
Edward J. McCluskey and
Aydin Ersoz},
title = {Concurrent System-Level Error Detection Using a Watchdog Processor},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {145--152},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MahmoodME85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Malaiya85,
author = {Yashwant K. Malaiya},
title = {Faults in Microprogrammed and Hardwired Control},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {732},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Malaiya85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MallelaW85,
author = {Sivanarayana Mallela and
Shianling Wu},
title = {A Sequential Circuit Test Generation System},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {57--61},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MallelaW85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Manzo85,
author = {John Manzo},
title = {Complexity, Test, and the Productivity Challenge of the 90s},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {7--9},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Manzo85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Marro85,
author = {Dom Marro},
title = {Automatic Visual Test of Surface Mount Assemblies},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {399--402},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Marro85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MatthiesenO85,
author = {F. Matthiesen and
Michael J. Ohletz},
title = {Test of Digital Transversal Filters},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {842--847},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MatthiesenO85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McCluskey85,
author = {Edward J. McCluskey},
title = {Test Teaching},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {235},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McCluskey85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McPhee85,
author = {Jill M. McPhee},
title = {The Effects of Backdriving Integrated Circuits : An Accurate Electro-Thermal
Model},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {518--522},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McPhee85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/McWilliams85,
author = {Thomas M. McWilliams},
title = {Easing the Transition from Design to Test},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {6},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/McWilliams85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Miczo85,
author = {Alexander Miczo},
title = {What Do You Say When Writing a Text About Test ?},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {236--238},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Miczo85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Middleton85,
author = {Tom Middleton},
title = {Recycling Functional Test Vectors: Techniques and Tools for Pattern
Conversion},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {291--303},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Middleton85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MiyamotoMMAYN85,
author = {Hiroshi Miyamoto and
Koichiro Mashiko and
Yoshikazu Morooka and
Kazutami Arimoto and
Michihiro Yamada and
T. Nakano},
title = {Test Pattern Considerations for Fault Tolerant High Density {DRAM}},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {451--455},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MiyamotoMMAYN85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MooreG85,
author = {Tim Moore and
Stephen Garner},
title = {Auto-Probing on the {L200} Functional Tester},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {618--628},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MooreG85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Morris85,
author = {D. R. Morris},
title = {Universal Signal Routing Card},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {428--430},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Morris85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/MuranagaSO85,
author = {Keiji Muranaga and
Kyoshiro Sakurada and
Yukio Oikawa},
title = {Language Independent Test Generation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {263--270},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/MuranagaSO85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Nelson85,
author = {Steven R. Nelson},
title = {Distributed Factory Data Management-Breaking the Network Bottleneck},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {980--986},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Nelson85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/NystromC85,
author = {Peter Nystrom and
Steven Cosgrove},
title = {Power Conditioning Provides Documented Productivity Gains in Semiconductor
Fabrication and {ATE}},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {19--22},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/NystromC85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Orsello85,
author = {Robert J. Orsello},
title = {Programmable Logic: Testability by Design},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {565--566},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Tue, 26 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Orsello85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Pany85,
author = {Claude J. Pany},
title = {Simplifying Analog Device Test Program Generation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {286--290},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Pany85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Petrich85,
author = {Dennis Petrich},
title = {Achieving Accurate Timing Measurements on {TTL/CMOS} Devices in a
Manufacturing/Incoming Inspection Environment},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {203--219},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Petrich85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Phillips85,
author = {Jaffery C. Phillips},
title = {A Programmable Bus Emulation Technique for Processor Based and Peripheral
Printed Circuit Boards},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {393--398},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Phillips85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RichmanB85,
author = {Jeremy Richman and
Kenneth R. Bowden},
title = {The Modern Fault Dictionary},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {696--702},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RichmanB85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RodgersS85,
author = {D. Rodgers and
M. Shepherd},
title = {Asynchronous FIFO's Require Special Attention},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {445--450},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RodgersS85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RogersA85,
author = {William A. Rogers and
Jacob A. Abraham},
title = {{CHIEFS} : {A} Concurrent, Hierarchical and Extensible Fault Simulator},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {710--716},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RogersA85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Rose85,
author = {Kenneth Rose},
title = {Test Technology In a University Setting},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {239--240},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Rose85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Russo85,
author = {Paul M. Russo},
title = {The Growth of Application Specific Integrated Circuits: Opportunities
and Challenges},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {5},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Russo85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/RyanW85,
author = {Patricia M. Ryan and
A. Jesse Wilkinson},
title = {Knowledge Acquisition for {ATE} Diagnosis},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {848--856},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/RyanW85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SalickUM85,
author = {John Salick and
Bill Underwood and
M. Ray Mercer},
title = {Built-In Self Test Input Generator for Programmable Logic Arrays},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {115--125},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SalickUM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SavirMV85,
author = {Jacob Savir and
William H. McAnney and
Salvatore R. Vecchio},
title = {Random Pattern Testing for Data-Line Faults in an Embedded Multiport
Memory},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {100--105},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SavirMV85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SavirMV85a,
author = {Jacob Savir and
William H. McAnney and
Salvatore R. Vecchio},
title = {Random Pattern Testing for Address-Line Faults in an Embedded Multiport
Memory},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {106--114},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SavirMV85a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Schusheim85,
author = {Brent Schusheim},
title = {Employing Multiple Test Techniques for Complex Telecommunications
Devices},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {835--841},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Schusheim85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Seth85,
author = {Sharad C. Seth},
title = {Predicting Fault Coverage from Probabilistic Testability},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {803--807},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Seth85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Shalem85,
author = {Shmuel Shalem},
title = {{DIP} : {A} Diagnostics Processor},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {271--278},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Shalem85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SharmaMLA85,
author = {Brijendra Sharma and
Colin McIntyre and
Gerard Labonville and
Jose Avila},
title = {Integrated Test Program Development Package},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {666--671},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SharmaMLA85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShimizuONM85,
author = {M. Shimizu and
N. Okino and
J. Nishiura and
H. Maruyama},
title = {Memory Embedded {VLSI} Gate Array Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {438--444},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShimizuONM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShimonoOTKF85,
author = {T. Shimono and
K. Oozeki and
M. Takahashi and
Masato Kawai and
Shigehiro Funatsu},
title = {An {AC/DC} Test Generation System for Gate Array LSIs},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {329--333},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Thu, 23 Feb 2012 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShimonoOTKF85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/ShiragasawaSMN85,
author = {T. Shiragasawa and
M. Sugano and
Yoshihisa Mano and
M. Noyori},
title = {An On-Lined Laser Probing System for Diagnosing Scaled {VLSI}},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {634--642},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/ShiragasawaSMN85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Smith85,
author = {Gordon L. Smith},
title = {Model for Delay Faults Based upon Paths},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {342--351},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Smith85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/SodenH85,
author = {Jerry M. Soden and
Charles F. Hawkins},
title = {Electrical Characteristics and Testing Considerations for Gate Oxide
Shorts in {CMOS} ICs},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {544--557},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/SodenH85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Son85,
author = {Kyushik Son},
title = {Rule Based Testability Checker and Test Generator},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {884--891},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Son85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Sridhar85,
author = {Thirumalai Sridhar},
title = {A New Parallel Test Approach for Large Memories},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {462--470},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Tue, 09 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Sridhar85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StaelinA85,
author = {Carl Staelin and
Alexander Albicki},
title = {Evaluation ot Monitor Complexity for Concurrently Testing Microprogrammed
Control Units},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {733--736},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StaelinA85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StenbakkenS85,
author = {Gerard N. Stenbakken and
T. Michael Souders},
title = {: Modeling and Test Point Selection for Data Converter Testing},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {813--817},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StenbakkenS85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Stevens85,
author = {Antony K. Stevens},
title = {MHz Frequency Counting with {VLSI} Testers 420},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {420--427},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Stevens85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/StoneIN85,
author = {John Stone and
Howard Ignatius and
Randall Nuss},
title = {Parallel Programming Significantly Improves Production {NVM} Wafer
Sort},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {10--18},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/StoneIN85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tobey85,
author = {John D. Tobey},
title = {Reducing Test Program Development Time for Memory Devices},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {949--953},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Tobey85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Trischler85,
author = {Erwin Trischler},
title = {Guided Inconsistent Path Sensitization: Method And Experimental Results},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {79--87},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Trischler85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tsui85,
author = {Frank F. Tsui},
title = {The Cost and Speed Barriers in {LSI/VLSI} Testing : Can They Be Overcome
By Testability Design ?},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {892--906},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Tsui85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/TurnerLPM85,
author = {Mark E. Turner and
Duane G. Leet and
Ronald J. Prilik and
David J. McLean},
title = {Testing {CMOS} {VLSI:} Tools, Concepts, and Experimental Results},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {322--328},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/TurnerLPM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Tuszynski85,
author = {Al A. Tuszynski},
title = {Curriculum for a Rapidly Changing Technology},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {241--243},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Tuszynski85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Ulrich85,
author = {Ernst G. Ulrich},
title = {Concurrent Simulation at the Switch, Gate, and Register Levels},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {703--709},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Tue, 17 Nov 2015 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Ulrich85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VasanthavadaM85,
author = {Nagesh Vasanthavada and
Peter N. Marinos},
title = {An Operationally Efficient Scheme for Exhaustive Test-Pattern Generation
Using Linear Codes},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {476--482},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/VasanthavadaM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VelazcoZK85,
author = {Raoul Velazco and
Haissam Ziade and
E. Kolokithas},
title = {A Microprocessor Test Approach Allowing Fault Localization},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {737--743},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Tue, 13 Jul 2004 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VelazcoZK85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/VerbeekB85,
author = {D. K. Verbeek and
William C. Bruce},
title = {Testability Features of the {MC68HC11}},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {744--751},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/itc/VerbeekB85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wagner85,
author = {Kenneth D. Wagner},
title = {The Error Latency of Delay Faults in Combinational and Sequential
Circuits},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {334--341},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wagner85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/WaicukauskiLEFM85,
author = {John A. Waicukauski and
Eric Lindbloom and
Edward B. Eichelberger and
Donato O. Forlenza and
Tim McCarthy},
title = {A Statistical Calculation of Fault Detection Probabilities By Fast
Fault Simulation},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {779--784},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/WaicukauskiLEFM85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/White85,
author = {Reed I. White},
title = {{TRS} and {DTS} : {IC} Test Result Standards},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {678--684},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/White85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/Wilber85,
author = {James G. Wilber},
title = {Enhancing Device Test Programming Productivity: The CATalyst Automated
Test Program Generator},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {252--262},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/Wilber85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/itc/YoshinoT85,
author = {Ryozou Yoshino and
Ryuichi Takagi},
title = {Custom {VLSI} Test System},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
pages = {431--437},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/YoshinoT85.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/1985,
title = {Proceedings International Test Conference 1985, Philadelphia, PA,
USA, November 1985},
publisher = {{IEEE} Computer Society},
year = {1985},
timestamp = {Mon, 11 Nov 2002 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/itc/1985.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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