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@article{DBLP:journals/mr/AbbateBI10,
author = {Carmine Abbate and
Giovanni Busatto and
Francesco Iannuzzo},
title = {{IGBT} {RBSOA} non-destructive testing methods: Analysis and discussion},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1731--1737},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.050},
doi = {10.1016/J.MICROREL.2010.07.050},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AbbateBI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AhmedFSGC10,
author = {Mansur Ahmed and
Tama Fouzder and
Ahmed Sharif and
Asit Kumar Gain and
Y. C. Chan},
title = {Influence of Ag micro-particle additions on the microstructure, hardness
and tensile properties of Sn-9Zn binary eutectic solder alloy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1134--1141},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.017},
doi = {10.1016/J.MICROREL.2010.03.017},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AhmedFSGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlaeddineKDB10,
author = {A. Alaeddine and
M. Kadi and
K. Daoud and
B. Beydoun},
title = {Characteristics degradation of the SiGe {HBT} under electromagnetic
field stress},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1961--1966},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.002},
doi = {10.1016/J.MICROREL.2010.07.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlaeddineKDB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Alagi10,
author = {F. Alagi},
title = {{DMOS} {FET} parameter drift kinetics from microscopic modeling},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {57--62},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.004},
doi = {10.1016/J.MICROREL.2009.08.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Alagi10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Algora10,
author = {Carlos Algora},
title = {Reliability of {III-V} concentrator solar cells},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1193--1198},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.045},
doi = {10.1016/J.MICROREL.2010.07.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Algora10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlivovFNCBM10,
author = {Ya. I. Alivov and
Qian Fan and
Xianfeng Ni and
Sergey A. Chevtchenko and
I. B. Bhat and
Hadis Morko{\c{c}}},
title = {n-Al0.15Ga0.85 N/p-6H-SiC heterostructure and based bipolar transistor},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2090--2092},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.016},
doi = {10.1016/J.MICROREL.2010.06.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AlivovFNCBM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Allers10,
author = {K.{-}H. Allers},
title = {Intrinsic and extrinsic reliability of a serial connection of capacitors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {881--886},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.021},
doi = {10.1016/J.MICROREL.2010.02.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Allers10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AlvaradoBKF10,
author = {Joaqu{\'{\i}}n Alvarado and
El Hafed Boufouss and
Valeria Kilchytska and
Denis Flandre},
title = {Compact model for single event transients and total dose effects at
high temperatures for partially depleted {SOI} MOSFETs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1852--1856},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.040},
doi = {10.1016/J.MICROREL.2010.07.040},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AlvaradoBKF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AmyAR10,
author = {Robin Alastair Amy and
Guglielmo S. Aglietti and
Guy Richardson},
title = {Accuracy of simplified printed circuit board finite element models},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {86--97},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.001},
doi = {10.1016/J.MICROREL.2009.09.001},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AmyAR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AtanassovaNPS10,
author = {Elena Atanassova and
Nenad Novkovski and
Albena Paskaleva and
D. Spassov},
title = {Constant current stress-induced leakage current in mixed HfO\({}_{\mbox{2}}\)-Ta\({}_{\mbox{2}}\)O\({}_{\mbox{5}}\)
stacks},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {794--800},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.005},
doi = {10.1016/J.MICROREL.2010.01.005},
timestamp = {Fri, 24 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AtanassovaNPS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AubertRMLF10,
author = {A. Aubert and
J. P. Rebrasse and
Lionel Dantas de Morais and
Nathalie Labat and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {Failure analysis case study on a Cu/low-k technology in package: New
front-side approach using laser and plasma de-processing},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1688--1691},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.036},
doi = {10.1016/J.MICROREL.2010.07.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/AubertRMLF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/AutranMRGMUSSYRLWZ10,
author = {Jean{-}Luc Autran and
Daniela Munteanu and
Philippe Roche and
Gilles Gasiot and
S. Martinie and
S. Uznanski and
S. Sauze and
S. Semikh and
Evgeny Yakushev and
S. Rozov and
Pia Loaiza and
G. Warot and
M. Zampaolo},
title = {Soft-errors induced by terrestrial neutrons and natural alpha-particle
emitters in advanced memory circuits at ground level},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1822--1831},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.033},
doi = {10.1016/J.MICROREL.2010.07.033},
timestamp = {Thu, 30 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/AutranMRGMUSSYRLWZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BagatinGPCIN10,
author = {Marta Bagatin and
Simone Gerardin and
Alessandro Paccagnella and
Giorgio Cellere and
F. Irom and
D. N. Nguyen},
title = {Destructive events in {NAND} Flash memories irradiated with heavy
ions},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1832--1836},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.032},
doi = {10.1016/J.MICROREL.2010.07.032},
timestamp = {Sat, 22 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BagatinGPCIN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BagnoliZ10,
author = {Paolo Emilio Bagnoli and
Yabin Zhang},
title = {Electro-thermal simulation of metal interconnections under high current
flow},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1672--1677},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.029},
doi = {10.1016/J.MICROREL.2010.07.029},
timestamp = {Tue, 20 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BagnoliZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BaillotDBBPAVSO10,
author = {Raphael Baillot and
Yannick Deshayes and
Laurent B{\'{e}}chou and
T. Buffeteau and
I. Pianet and
C. Armand and
F. Voillot and
S. Sorieul and
Yves Ousten},
title = {Effects of silicone coating degradation on GaN {MQW} LEDs performances
using physical and chemical analyses},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1568--1573},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.056},
doi = {10.1016/J.MICROREL.2010.07.056},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BaillotDBBPAVSO10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BashirMKL10,
author = {Muhammad Bashir and
Linda S. Milor and
Dae Hyun Kim and
Sung Kyu Lim},
title = {Methodology to determine the impact of linewidth variation on chip
scale copper/low-k backend dielectric breakdown},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1341--1346},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.091},
doi = {10.1016/J.MICROREL.2010.07.091},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BashirMKL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BastosSKRR10,
author = {Rodrigo Possamai Bastos and
Gilles Sicard and
Fernanda Lima Kastensmidt and
Marc Renaudin and
Ricardo Reis},
title = {Asynchronous circuits as alternative for mitigation of long-duration
transient faults in deep-submicron technologies},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1241--1246},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.014},
doi = {10.1016/J.MICROREL.2010.07.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BastosSKRR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bayerer10,
author = {Reinhold Bayerer},
title = {Advanced packaging yields higher performance and reliability in power
electronics},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1715--1719},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.016},
doi = {10.1016/J.MICROREL.2010.07.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bayerer10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelaidD10,
author = {Mohamed Ali Bela{\"{\i}}d and
K. Daoud},
title = {Evaluation of hot-electron effects on critical parameter drifts in
power {RF} {LDMOS} transistors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1763--1767},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.070},
doi = {10.1016/J.MICROREL.2010.07.070},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BelaidD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BellottiM10,
author = {M. Bellotti and
R. Mariani},
title = {How future automotive functional safety requirements will impact microprocessors
design},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1320--1326},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.041},
doi = {10.1016/J.MICROREL.2010.07.041},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BellottiM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BelmehdiADW10,
author = {Yassine Belmehdi and
Stephane Azzopardi and
Jean{-}Yves Del{\'{e}}tage and
Eric Woirgard},
title = {Experimental electro-mechanical static characterization of {IGBT}
bare die under controlled temperature},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1815--1821},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.048},
doi = {10.1016/J.MICROREL.2010.07.048},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BelmehdiADW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BenbakhtiAKLHBMTA10,
author = {Brahim Benbakhti and
J. S. Ayubi{-}Moak and
Karol Kalna and
D. Lin and
Geert Hellings and
Guy Brammertz and
Kristin De Meyer and
Iain Thayne and
Asen Asenov},
title = {Impact of interface state trap density on the performance characteristics
of different {III-V} {MOSFET} architectures},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {360--364},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.017},
doi = {10.1016/J.MICROREL.2009.11.017},
timestamp = {Fri, 06 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BenbakhtiAKLHBMTA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BernardoniDCM10,
author = {Mirko Bernardoni and
Nicola Delmonte and
Paolo Cova and
Roberto Menozzi},
title = {Thermal modeling of planar transformer for switching power converters},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1778--1782},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.129},
doi = {10.1016/J.MICROREL.2010.07.129},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BernardoniDCM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BertoluzzaCDPP10,
author = {Fulvio Bertoluzza and
Paolo Cova and
Nicola Delmonte and
Pietro Pampili and
Marco Portesine},
title = {Coupled measurement-simulation procedure for very high power fast
recovery - Soft behavior diode design and testing},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1720--1724},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.123},
doi = {10.1016/J.MICROREL.2010.07.123},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BertoluzzaCDPP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BibergerBGH10,
author = {Roland Biberger and
Guenther Benstetter and
Holger Goebel and
Alexander Hofer},
title = {Intermittent-contact capacitance spectroscopy - {A} new method for
determining {C(V)} curves with sub-micron lateral resolution},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1511--1513},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.052},
doi = {10.1016/J.MICROREL.2010.07.052},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BibergerBGH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoddaertBBGC10,
author = {Xavier Boddaert and
B. Bensaid and
Patrick Benaben and
Romain Gwoziecki and
Romain Coppard},
title = {Mechanical and thermal reliability of printed organic thin-film transistor},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1884--1887},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.018},
doi = {10.1016/J.MICROREL.2010.07.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoddaertBBGC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoncaloAUV10,
author = {Oana Boncalo and
Alexandru Amaricai and
Mihai Udrescu and
Mircea Vladutiu},
title = {Quantum circuit's reliability assessment with VHDL-based simulated
fault injection},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {304--311},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.008},
doi = {10.1016/J.MICROREL.2009.11.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoncaloAUV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BoostandoostKB10,
author = {Mahyar Boostandoost and
Uwe Kerst and
Christian Boit},
title = {Extraction of local thin-film solar cell parameters by bias-dependent
{IR-LBIC}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1899--1902},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.060},
doi = {10.1016/J.MICROREL.2010.07.060},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BoostandoostKB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BouabdallahBB10,
author = {B. Bouabdallah and
Y. Bourezig and
B. Benichou},
title = {Improved resolution method to study at 3D the conduction phenomena
inside GaAs {PIN} photodiode},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {447--453},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.018},
doi = {10.1016/J.MICROREL.2009.11.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BouabdallahBB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Bouarroudj-BerkaniOLMKS10,
author = {M. Bouarroudj{-}Berkani and
D. Othman and
St{\'{e}}phane Lefebvre and
S. Moumen and
Zoubir Khatir and
T. Ben Sallah},
title = {Ageing of SiC {JFET} transistors under repetitive current limitation
conditions},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1532--1537},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.035},
doi = {10.1016/J.MICROREL.2010.07.035},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Bouarroudj-BerkaniOLMKS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BourgeatEGBM10,
author = {J. Bourgeat and
Christophe Entringer and
Philippe Galy and
Marise Bafleur and
D. Marin{-}Cudraz},
title = {Evaluation of the {ESD} performance of local protections based on
{SCR} or bi-SCR with dynamic or static trigger circuit in 32 nm},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1379--1382},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.025},
doi = {10.1016/J.MICROREL.2010.07.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BourgeatEGBM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BrandCHP10,
author = {Sebastian Brand and
P. Czurratis and
P. Hoffrogge and
Matthias Petzold},
title = {Automated inspection and classification of flip-chip-contacts using
scanning acoustic microscopy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1469--1473},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.139},
doi = {10.1016/J.MICROREL.2010.07.139},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/BrandCHP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BreachW10,
author = {C. D. Breach and
F. Wulff},
title = {A brief review of selected aspects of the materials science of ball
bonding},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {1--20},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.003},
doi = {10.1016/J.MICROREL.2009.08.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BreachW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BriatVBBDW10,
author = {Olivier Briat and
Jean{-}Michel Vinassa and
Nicolas Bertrand and
H. El Brouji and
Jean{-}Yves Del{\'{e}}tage and
Eric Woirgard},
title = {Contribution of calendar ageing modes in the performances degradation
of supercapacitors during power cycling},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1796--1803},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.118},
doi = {10.1016/J.MICROREL.2010.07.118},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BriatVBBDW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoCIPSV10,
author = {Giovanni Busatto and
Giuseppe Curr{\`{o}} and
Francesco Iannuzzo and
Alberto Porzio and
Annunziata Sanseverino and
Francesco Velardi},
title = {Experimental study and numerical investigation on the formation of
single event gate damages induced on medium voltage power {MOSFET}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1842--1847},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.039},
doi = {10.1016/J.MICROREL.2010.07.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoCIPSV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BusattoI10,
author = {Giovanni Busatto and
Francesco Iannuzzo},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1191--1192},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.08.013},
doi = {10.1016/J.MICROREL.2010.08.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BusattoI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ButzenBRR10,
author = {Paulo F. Butzen and
Vin{\'{\i}}cius Dal Bem and
Andr{\'{e}} In{\'{a}}cio Reis and
Renato P. Ribas},
title = {Transistor network restructuring against {NBTI} degradation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1298--1303},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.140},
doi = {10.1016/J.MICROREL.2010.07.140},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ButzenBRR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BychikhinHRVGP10,
author = {Sergey Bychikhin and
Georg Haberfehlner and
J. Rhayem and
Daniel Vanderstraeten and
Renaud Gillon and
Dionyz Pogany},
title = {Investigation of smart power {DMOS} devices under repetitive stress
conditions using transient thermal mapping and numerical simulation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1427--1430},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.138},
doi = {10.1016/J.MICROREL.2010.07.138},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BychikhinHRVGP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CarastroCCW10,
author = {Fabio Carastro and
Alberto Castellazzi and
Jon C. Clare and
Patrick Wheeler},
title = {Control technique for power device electro-thermal stress minimisation
in non-linear load variable-frequency resonant power converters},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1738--1743},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.044},
doi = {10.1016/J.MICROREL.2010.07.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CarastroCCW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CassidyHRB10,
author = {Daniel T. Cassidy and
Chadwick K. Hall and
Othman Rehioui and
Laurent B{\'{e}}chou},
title = {Strain estimation in {III-V} materials by analysis of the degree of
polarization of luminescence},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {462--466},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.003},
doi = {10.1016/J.MICROREL.2009.11.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CassidyHRB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CassidyTKS10,
author = {C. Cassidy and
J. Teva and
Jochen Kraft and
Franz Schrank},
title = {Through Silicon Via {(TSV)} defect investigations using lateral emission
microscopy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1413--1416},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.116},
doi = {10.1016/J.MICROREL.2010.07.116},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CassidyTKS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CatelaniCL10,
author = {Marcantonio Catelani and
Lorenzo Ciani and
Valentina Luongo},
title = {The {FMEDA} approach to improve the safety assessment according to
the {IEC61508}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1230--1235},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.121},
doi = {10.1016/J.MICROREL.2010.07.121},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CatelaniCL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CavalliniPC10,
author = {Anna Cavallini and
Laura Polenta and
Antonio Castaldini},
title = {Charge carrier recombination and generation analysis in materials
and devices by electron and optical beam microscopy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1398--1406},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.136},
doi = {10.1016/J.MICROREL.2010.07.136},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CavalliniPC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CeliDPRPBLV10,
author = {Guillaume Celi and
Sylvain Dudit and
Philippe Perdu and
Antoine Reverdy and
Thierry Parrassin and
Emmanuel Bechet and
Dean Lewis and
Michel Vallet},
title = {Facing the defect characterization and localization challenges of
bridge defects on a submicronic technology {(45} nm and below)},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1499--1505},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.115},
doi = {10.1016/J.MICROREL.2010.07.115},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CeliDPRPBLV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CesterBFWMXAB10,
author = {Andrea Cester and
Daniele Bari and
J. Framarin and
Nicola Wrachien and
Gaudenzio Meneghesso and
S. Xia and
V. Adamovich and
J. J. Brown},
title = {Thermal and electrical stress effects of electrical and optical characteristics
of Alq3/NPD {OLED}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1866--1870},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.114},
doi = {10.1016/J.MICROREL.2010.07.114},
timestamp = {Tue, 22 Jun 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CesterBFWMXAB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChakrabortyS10,
author = {Amrita Chakraborty and
Chandan Kumar Sarkar},
title = {Electron transport in two dimensional electron gas formed at the heterojunction
of Al\({}_{\mbox{x}}\)Ga\({}_{\mbox{(1-}}\)\({}_{\mbox{x}}\)\({}_{\mbox{)}}\)N/GaN
at microwave frequencies},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {965--970},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.005},
doi = {10.1016/J.MICROREL.2010.03.005},
timestamp = {Fri, 06 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChakrabortyS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangC10,
author = {Yang{-}Hua Chang and
Jian{-}Wen Chen},
title = {Extraction of {VBIC} model parameters for InGaAsSb DHBTs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {370--375},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.005},
doi = {10.1016/J.MICROREL.2009.12.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangLC10,
author = {Yang{-}Hua Chang and
Shih{-}Wei Lin and
Chia{-}Hao Chang},
title = {Optimization of high voltage LDMOSFETs with complex multiple-resistivity
drift region and field plate},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {949--953},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.019},
doi = {10.1016/J.MICROREL.2010.03.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangLC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangPSL10,
author = {Hao{-}Yuan Chang and
Wen{-}Fung Pan and
Meng{-}Kai Shih and
Yi{-}Shao Lai},
title = {Geometric design for ultra-long needle probe card for digital light
processing wafer testing},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {556--563},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.013},
doi = {10.1016/J.MICROREL.2009.11.013},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChangPSL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangS10,
author = {Yang{-}Hua Chang and
Rong{-}Hao Syu},
title = {Simulation of electrical characteristics of InP double-heterojunction
bipolar transistors with InGaAsSb base},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {70--74},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.009},
doi = {10.1016/J.MICROREL.2009.08.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangTLCK10,
author = {Kow{-}Ming Chang and
Wen{-}Hsien Tzeng and
Kou{-}Chen Liu and
Yi{-}Chun Chan and
Chun{-}Chih Kuo},
title = {Investigation on the abnormal resistive switching induced by ultraviolet
light exposure based on HfOx film},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1931--1934},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.012},
doi = {10.1016/J.MICROREL.2010.05.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangTLCK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangWYLTWWC10,
author = {Yu{-}Ming Chang and
Hua{-}Chiang Wen and
Chu{-}Shou Yang and
Derming Lian and
Chien{-}Huang Tsai and
Jyh{-}Shyang Wang and
Wen{-}Fa Wu and
Chang{-}Pin Chou},
title = {Evaluating the abrasive wear of Zn\({}_{\mbox{1-}}\)\({}_{\mbox{x}}\)Mn\({}_{\mbox{x}}\)O
heteroepitaxial layers using a nanoscratch technique},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1111--1115},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.003},
doi = {10.1016/J.MICROREL.2010.05.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangWYLTWWC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChangY10,
author = {Yang{-}Hua Chang and
Kun{-}Ying Yang},
title = {Extraction of bias-dependent parasitic source/drain resistance in
MOSFETs with an advanced mobility model},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {174--178},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.011},
doi = {10.1016/J.MICROREL.2009.11.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChangY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CharavelRMGBVDMB10,
author = {R. Charavel and
Jaume Roig and
S. Mouhoubi and
P. Gassot and
Filip Bauwens and
Piet Vanmeerbeek and
B. Desoete and
Peter Moens and
Eddy De Backer},
title = {Next generation of Deep Trench Isolation for Smart Power technologies
with 120 {V} high-voltage devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1758--1762},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.117},
doi = {10.1016/J.MICROREL.2010.07.117},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CharavelRMGBVDMB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenHL10,
author = {Henry J. H. Chen and
Ming{-}Tien Huang and
Y. B. Liu},
title = {Fabrication of Au/PEDOT stacked electrodes for organic thin film transistors
by imprinting technology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {717--721},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.033},
doi = {10.1016/J.MICROREL.2010.01.033},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenHL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenK10,
author = {Shih{-}Hung Chen and
Ming{-}Dou Ker},
title = {Investigation on NMOS-based power-rail {ESD} clamp circuits with gate-driven
mechanism in a 0.13-{\(\mathrm{\mu}\)}m {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {821--830},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.030},
doi = {10.1016/J.MICROREL.2010.01.030},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenL10,
author = {H. W. Chen and
Chuan{-}Hsi Liu},
title = {Impact of Hf content on positive bias temperature instability reliability
of HfSiON gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {614--617},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.012},
doi = {10.1016/J.MICROREL.2010.01.012},
timestamp = {Mon, 29 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ChenL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenLHH10,
author = {Jiunn Chen and
Yi{-}Shao Lai and
Chueh{-}An Hsieh and
Chia Yi Hu},
title = {Redistribution in wafer level chip size packaging technology for high
power device applications: Process and design considerations},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {522--527},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.004},
doi = {10.1016/J.MICROREL.2009.10.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenLHH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenUY10,
author = {Peng Yu Chen and
Herng Yih Ueng and
Meiso Yokoyama},
title = {High efficiency p-i-n organic light-emitting diodes with a novel n-doping
layer},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {696--698},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.023},
doi = {10.1016/J.MICROREL.2010.01.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenUY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChenWWH10,
author = {Kuen{-}Suan Chen and
C. C. Wang and
Chin{-}Hsin Wang and
Cheng{-}Fu Huang},
title = {Application of {RPN} analysis to parameter optimization of passive
components},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2012--2019},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.014},
doi = {10.1016/J.MICROREL.2010.06.014},
timestamp = {Thu, 23 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChenWWH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChengL10,
author = {Hui{-}Wen Cheng and
Yiming Li},
title = {Optimization on configuration of surface conduction electron-emitters},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {699--703},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.011},
doi = {10.1016/J.MICROREL.2010.01.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChengL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuCYFW10,
author = {Hsien{-}Chin Chiu and
Chao{-}Hung Chen and
Chih{-}Wei Yang and
Jeffrey S. Fu and
Cheng{-}Shun Wang},
title = {Electrical and reliability characteristics of GaAs MOSHEMTs utilizing
high-k {IIIB} and {IVB} oxide layers},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {631--634},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.018},
doi = {10.1016/J.MICROREL.2010.01.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuCYFW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuHYMW10,
author = {Pin{-}Hsiang Chiu and
Chien{-}Jung Huang and
Cheng{-}Fu Yang and
Teen{-}Hang Meen and
Yeong{-}Her Wang},
title = {Red polymer light-emitting devices based on dye-dispersed poly (9,
9-dioctylfluorene-alt-benzothiadiazole)},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {692--695},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.031},
doi = {10.1016/J.MICROREL.2010.01.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuHYMW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuLYG10,
author = {Tz{-}Cheng Chiu and
Jyun{-}Ji Lin and
Hung{-}Chun Yang and
Vikas Gupta},
title = {Reliability model for bridging failure of Pb-free ball grid array
solder joints under compressive load},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2037--2050},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.012},
doi = {10.1016/J.MICROREL.2010.06.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuLYG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChiuYCLFTT10,
author = {Hsien{-}Chin Chiu and
Chih{-}Wei Yang and
Chao{-}Hung Chen and
Che{-}Kai Lin and
Jeffrey S. Fu and
Hsing{-}Yuan Tu and
Shiang{-}Feng Tang},
title = {High thermal stability AlGaAs/InGaAs enhancement-mode pHEMT using
palladium-gate technology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {847--850},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.022},
doi = {10.1016/J.MICROREL.2010.02.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChiuYCLFTT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChoCLPKP10,
author = {Seunghyun Cho and
Tae{-}Eun Chang and
Joseph Y. Lee and
Hyung{-}Pil Park and
Youngbae Ko and
GyunMyoung Park},
title = {New dummy design and stiffener on warpage reduction in Ball Grid Array
Printed Circuit Board},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {242--250},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.009},
doi = {10.1016/J.MICROREL.2009.10.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChoCLPKP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChouYC10,
author = {Jung{-}Chuan Chou and
Hung{-}Yu Yang and
Cheng{-}Wei Chen},
title = {Glucose biosensor of ruthenium-doped TiO\({}_{\mbox{2}}\) sensing
electrode by co-sputtering system},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {753--756},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.025},
doi = {10.1016/J.MICROREL.2010.01.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChouYC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ChuMCYCK10,
author = {Min{-}Ching Chu and
Jagan Singh Meena and
Chih{-}Chia Cheng and
Hsin{-}Chiang You and
Feng{-}Chih Chang and
Fu{-}Hsiang Ko},
title = {Plasma-enhanced flexible metal-insulator-metal capacitor using high-k
ZrO\({}_{\mbox{2}}\) film as gate dielectric with improved reliability},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1098--1102},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.004},
doi = {10.1016/J.MICROREL.2010.05.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ChuMCYCK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CiappaKDF10,
author = {Mauro Ciappa and
Alexander Koschik and
Maurizio Dapor and
Wolfgang Fichtner},
title = {Modeling secondary electron images for linewidth measurement by critical
dimension scanning electron microscopy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1407--1412},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.120},
doi = {10.1016/J.MICROREL.2010.07.120},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CiappaKDF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CilentoSYMLCG10,
author = {Tommaso Cilento and
M. Schenkel and
C. Yun and
R. Mishra and
Junjun Li and
Kiran V. Chatty and
Robert Gauthier},
title = {Simulation of {ESD} protection devices in an advanced {CMOS} technology
using a {TCAD} workbench based on an {ESD} calibration methodology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1367--1372},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.132},
doi = {10.1016/J.MICROREL.2010.07.132},
timestamp = {Thu, 02 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CilentoSYMLCG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CoqTSB10,
author = {C{\'{e}}dric Le Coq and
Adellah Tougui and
Marie{-}Pascale Stempin and
Laurent Barreau},
title = {Experimental study of {WL-CSP} reliability subjected to a four-point
bend-test},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {1007--1013},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.015},
doi = {10.1016/J.MICROREL.2010.03.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CoqTSB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CrosbieL10,
author = {Paul Crosbie and
Yeong J. Lee},
title = {Multiple impact characterization of wafer level packaging {(WLP)}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {577--582},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.012},
doi = {10.1016/J.MICROREL.2009.11.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/CrosbieL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CzernyKWL10,
author = {Bernhard Czerny and
Golta Khatibi and
Brigitte Weiss and
T. Licht},
title = {A fast test technique for life time estimation of ultrasonically welded
Cu-Cu interconnects},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1641--1644},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.130},
doi = {10.1016/J.MICROREL.2010.07.130},
timestamp = {Tue, 15 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CzernyKWL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DaiY10,
author = {Mingzhi Dai and
Kinleong Yap},
title = {Observation and mechanism explanation of the parasitic charge pumping
current},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1915--1919},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.004},
doi = {10.1016/J.MICROREL.2010.07.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DaiY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Dakhel10,
author = {A. A. Dakhel},
title = {Effect of ytterbium doping on the optical and electrical properties
of intrinsic In\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) thin films},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {211--216},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.007},
doi = {10.1016/J.MICROREL.2009.11.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Dakhel10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DanduFLD10,
author = {Pridhvi Dandu and
Xuejun Fan and
Y. Liu and
C. Diao},
title = {Finite element modeling on electromigration of solder joints in wafer
level packages},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {547--555},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.003},
doi = {10.1016/J.MICROREL.2009.12.003},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DanduFLD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DasB10,
author = {P. S. Das and
Abhijit Biswas},
title = {Charge trapping and reliability characteristics of ultra-thin HfYO\({}_{\mbox{x}}\)
films on n-GaAs substrates},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1924--1930},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.009},
doi = {10.1016/J.MICROREL.2010.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DasB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DemirtasJA10,
author = {Sefa Demirtas and
Jungwoo Joh and
Jes{\'{u}}s A. del Alamo},
title = {High voltage degradation of GaN High Electron Mobility Transistors
on silicon substrate},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {758--762},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.016},
doi = {10.1016/J.MICROREL.2010.02.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DemirtasJA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DeyineSPBL10,
author = {A. Deyine and
Kevin Sanchez and
Philippe Perdu and
F. Battistella and
Dean Lewis},
title = {CADless laser assisted methodologies for failure analysis and device
reliability},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1236--1240},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.131},
doi = {10.1016/J.MICROREL.2010.07.131},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DeyineSPBL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DokmeATU10,
author = {Ilbilge D{\"{o}}kme and
Semsettin Altindal and
Tuncay Tun{\c{c}} and
Ibrahim Uslu},
title = {Temperature dependent electrical and dielectric properties of Au/polyvinyl
alcohol (Ni, Zn-doped)/n-Si Schottky diodes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {39--44},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.005},
doi = {10.1016/J.MICROREL.2009.09.005},
timestamp = {Mon, 08 Nov 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DokmeATU10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DompierreFBAC10,
author = {B. Dompierre and
W. C. Maia Filho and
M. Brizoux and
V{\'{e}}ronique Aubin and
Eric Charkaluk},
title = {Thermal ageing induces drastic changes on mechanical and damage behavior
of Sn3.0Ag0.5Cu alloy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1661--1665},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.125},
doi = {10.1016/J.MICROREL.2010.07.125},
timestamp = {Sat, 26 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DompierreFBAC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DongZLSB10,
author = {X. Dong and
P. Zhu and
Zhonghua Li and
Jun Sun and
J. D. Boyd},
title = {Electromigration-induced stress in a confined bamboo interconnect
with randomly distributed grain sizes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {391--397},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.002},
doi = {10.1016/J.MICROREL.2010.01.002},
timestamp = {Tue, 06 Oct 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/DongZLSB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DowneyMCF10,
author = {Brian P. Downey and
Suzanne E. Mohney and
Trevor E. Clark and
Joseph R. Flemish},
title = {Reliability of aluminum-bearing ohmic contacts to SiC under high current
density},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1967--1972},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.007},
doi = {10.1016/J.MICROREL.2010.07.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DowneyMCF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DupontBLCMBR10,
author = {Laurent Dupont and
J. L. Blanchard and
Richard Lallemand and
Gerard Coquery and
Jean{-}Michel Morelle and
G. Blondel and
B. Rouleau},
title = {Experimental and numerical results correlation during extreme use
of power {MOSFET} designed for avalanche functional mode},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1804--1809},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.127},
doi = {10.1016/J.MICROREL.2010.07.127},
timestamp = {Thu, 25 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DupontBLCMBR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ErslandM10,
author = {Peter Ersland and
Roberto Menozzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {757},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.011},
doi = {10.1016/J.MICROREL.2010.03.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ErslandM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/EspinetAGNV10,
author = {P. Espinet and
Carlos Algora and
Jos{\'{e}} Ram{\'{o}}n Gonz{\'{a}}lez and
Neftal{\'{\i}} N{\'{u}}{\~{n}}ez and
Manuel V{\'{a}}zquez},
title = {Degradation mechanism analysis in temperature stress tests on {III-V}
ultra-high concentrator solar cells using a 3D distributed model},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1875--1879},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.128},
doi = {10.1016/J.MICROREL.2010.07.128},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/EspinetAGNV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FakhriGHB10,
author = {M. Fakhri and
A.{-}K. Geinzer and
Ralf Heiderhoff and
L. J. Balk},
title = {Nanoscale thermally induced stress analysis by complementary Scanning
Thermal Microscopy techniques},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1459--1463},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.134},
doi = {10.1016/J.MICROREL.2010.07.134},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FakhriGHB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanVH10,
author = {X. J. Fan and
B. Varia and
Q. Han},
title = {Design and optimization of thermo-mechanical reliability in wafer
level packaging},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {536--546},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.010},
doi = {10.1016/J.MICROREL.2009.11.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FanVH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FanY10,
author = {Hai Bo Fan and
Matthew M. F. Yuen},
title = {A multi-scale approach for investigation of interfacial delamination
in electronic packages},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {893--899},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.029},
doi = {10.1016/J.MICROREL.2010.02.029},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FanY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FaqirBMLCLVF10,
author = {Mustapha Faqir and
Mohsine Bouya and
Nathalie Malbert and
Nathalie Labat and
D. Carisetti and
Benoit Lambert and
Giovanni Verzellesi and
Fausto Fantini},
title = {Analysis of current collapse effect in AlGaN/GaN {HEMT:} Experiments
and numerical simulations},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1520--1522},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.020},
doi = {10.1016/J.MICROREL.2010.07.020},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FaqirBMLCLVF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FarleyZAADCD10,
author = {D. Farley and
Y. Zhou and
F. Askari and
M. Al{-}Bassyiouni and
A. Dasgupta and
J. F. J. Caers and
J. W. C. DeVries},
title = {Copper trace fatigue models for mechanical cycling, vibration and
shock/drop of high-density PWAs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {937--947},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.004},
doi = {10.1016/J.MICROREL.2010.03.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FarleyZAADCD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FlaquerDNR10,
author = {Josep Torras Flaquer and
Jean{-}Marc Daveau and
Lirida A. B. Naviner and
Philippe Roche},
title = {Fast reliability analysis of combinatorial logic circuits using conditional
probabilities},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1215--1218},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.058},
doi = {10.1016/J.MICROREL.2010.07.058},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FlaquerDNR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FouzderGCSY10,
author = {Tama Fouzder and
Asit Kumar Gain and
Y. C. Chan and
Ahmed Sharif and
Winco K. C. Yung},
title = {Effect of nano Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) additions on
the microstructure, hardness and shear strength of eutectic Sn-9Zn
solder on Au/Ni metallized Cu pads},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2051--2058},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.013},
doi = {10.1016/J.MICROREL.2010.06.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FouzderGCSY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FuTWY10,
author = {C. M. Fu and
Cher Ming Tan and
S. H. Wu and
H. B. Yao},
title = {Width dependence of the effectiveness of reservoir length in improving
electromigration for Cu/Low-k interconnects},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1332--1335},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.133},
doi = {10.1016/J.MICROREL.2010.07.133},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FuTWY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FuYYKCCCX10,
author = {Jeffrey S. Fu and
Dong{-}Hua Yang and
Chin{-}I Yeh and
Nemai C. Karmakar and
Jui{-}Ching Cheng and
Kuo{-}Sheng Chin and
Hsien{-}Chin Chiu and
Jian Kang Xiao},
title = {Electromechanical controlled phased array dumbbell {EBG} beam steerer},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2093--2097},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.007},
doi = {10.1016/J.MICROREL.2010.05.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FuYYKCCCX10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FutaneCCS10,
author = {N. P. Futane and
Shubhajit Roy Chowdhury and
C. Roy Chowdhury and
Hiranmay Saha},
title = {{ANN} based {CMOS} {ASIC} design for improved temperature-drift compensation
of piezoresistive micro-machined high resolution pressure sensor},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {282--291},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.012},
doi = {10.1016/J.MICROREL.2009.09.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FutaneCCS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GaddiKUJLRSKY10,
author = {Roberto Gaddi and
Robertus Petrus Van Kampen and
Anartz Unamuno and
Vikram Joshi and
D. Lacey and
Mickael Renault and
Charles Smith and
Richard Knipe and
Dennis Yost},
title = {{MEMS} technology integrated in the {CMOS} back end},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1593--1598},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.113},
doi = {10.1016/J.MICROREL.2010.07.113},
timestamp = {Wed, 25 Aug 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GaddiKUJLRSKY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Gallois-GarreignotFN10,
author = {S{\'{e}}bastien Gallois{-}Garreignot and
Vincent Fiori and
D. Nelias},
title = {Fracture phenomena induced by Front-End/Back-End interactions: Dedicated
failure analysis and numerical developments},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {75--85},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.009},
doi = {10.1016/J.MICROREL.2009.09.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Gallois-GarreignotFN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GalyDVLBPBDJJCBV10,
author = {Philippe Galy and
Sylvain Dudit and
Michel Vallet and
Ph. Larre and
M. Bilinski and
E. Petit and
J. Beltritti and
A. Dray and
Jean Jimenez and
Frank Jezequel and
R. Chevallier and
C. Boutonnat and
V. Varo},
title = {Inventory of silicon signatures induced by {CDM} event on deep sub-micronic
{CMOS-BICMOS} technologies},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1388--1392},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.137},
doi = {10.1016/J.MICROREL.2010.07.137},
timestamp = {Thu, 28 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GalyDVLBPBDJJCBV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GeneraliCTFM10,
author = {Gianluca Generali and
Raffaella Capelli and
Stefano Toffanin and
Antonio Facchetti and
Michele Muccini},
title = {Ambipolar field-effect transistor based on alpha, omega-dihexylquaterthiophene
and alpha, omega-diperfluoroquaterthiophene vertical heterojunction},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1861--1865},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.047},
doi = {10.1016/J.MICROREL.2010.07.047},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GeneraliCTFM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GerardinBPCVB10,
author = {Simone Gerardin and
Marta Bagatin and
Alessandro Paccagnella and
G. Cellere and
Angelo Visconti and
Mauro Bonanomi},
title = {Impact of total dose on heavy-ion upsets in floating gate arrays},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1837--1841},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.142},
doi = {10.1016/J.MICROREL.2010.07.142},
timestamp = {Sat, 22 Apr 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GerardinBPCVB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GerrerRRGV10,
author = {L. Gerrer and
M. Rafik and
G. Ribes and
G{\'{e}}rard Ghibaudo and
E. Vincent},
title = {Unified soft breakdown MOSFETs compact model: From experiments to
circuit simulation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1259--1262},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.143},
doi = {10.1016/J.MICROREL.2010.07.143},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GerrerRRGV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhoshMMGKZ10,
author = {Sudip Ghosh and
Fran{\c{c}}ois Marc and
Cristell Maneux and
Brice Grandchamp and
G. A. Kon{\'{e}} and
Thomas Zimmer},
title = {Thermal aging model of InP/InGaAs/InP {DHBT}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1554--1558},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.097},
doi = {10.1016/J.MICROREL.2010.07.097},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhoshMMGKZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GhoshalPKCC10,
author = {Anindya Ghoshal and
William H. Prosser and
Heung Soo Kim and
Aditi Chattopadhyay and
Ben Copeland},
title = {Development of embedded piezoelectric acoustic sensor array architecture},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {857--863},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.037},
doi = {10.1016/J.MICROREL.2010.01.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GhoshalPKCC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GorollP10,
author = {Michael Goroll and
Reinhard Pufall},
title = {New aspects in characterization of adhesion of moulding compounds
on different surfaces by using a simple button-shear-test method for
lifetime prediction of power devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1684--1687},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.038},
doi = {10.1016/J.MICROREL.2010.07.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GorollP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GossnerSS10,
author = {Harald Gossner and
Werner Simb{\"{u}}rger and
Matthias Stecher},
title = {System {ESD} robustness by co-design of on-chip and on-board protection
measures},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1359--1366},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.146},
doi = {10.1016/J.MICROREL.2010.07.146},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GossnerSS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GrutznerBB10,
author = {Markus Gr{\"{u}}tzner and
Christian Burmer and
Christof Brillert},
title = {Ultra-fast {CAD} scan chain highlighting for failure analysis assistance},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1494--1498},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.145},
doi = {10.1016/J.MICROREL.2010.07.145},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GrutznerBB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GualousGATOBM10,
author = {Hamid Gualous and
Roland Gallay and
G. Alcicek and
Boubekeur Tala{-}Ighil and
Amrane Oukaour and
Bertrand Boudart and
Ph. Makany},
title = {Supercapacitor ageing at constant temperature and constant voltage
and thermal shock},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1783--1788},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.144},
doi = {10.1016/J.MICROREL.2010.07.144},
timestamp = {Mon, 30 Mar 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/GualousGATOBM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/GuojunRLB10,
author = {Hu Guojun and
Roberto Rossi and
Jing{-}en Luan and
Xavier Baraton},
title = {Interface delamination analysis of {TQFP} package during solder reflow},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {1014--1020},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.012},
doi = {10.1016/J.MICROREL.2010.03.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/GuojunRLB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanLH10,
author = {Ming{-}Hung Han and
Yiming Li and
Chih{-}Hong Hwang},
title = {The impact of high-frequency characteristics induced by intrinsic
parameter fluctuations in nano-MOSFET device and circuit},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {657--661},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.048},
doi = {10.1016/J.MICROREL.2010.01.048},
timestamp = {Fri, 24 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HanLH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HanOPH10,
author = {Changwoon Han and
Chulmin Oh and
Nochang Park and
Wonsik Hong},
title = {Creep lifetime prediction of solder joint for heat sink assembly},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1645--1649},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.110},
doi = {10.1016/J.MICROREL.2010.07.110},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HanOPH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HartmannW10,
author = {Claus Hartmann and
M. Wieberneit},
title = {Investigation on {BIST} assisted failure analysis on digital integrated
circuits},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1464--1468},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.148},
doi = {10.1016/J.MICROREL.2010.07.148},
timestamp = {Fri, 04 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HartmannW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HattaSHZ10,
author = {Sharifah Wan Muhamad Hatta and
Norhayati Soin and
D. Abd Hadi and
Jianfu Zhang},
title = {{NBTI} degradation effect on advanced-process 45 nm high-k PMOSFETs
with geometric and process variations},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1283--1289},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.022},
doi = {10.1016/J.MICROREL.2010.07.022},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HattaSHZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeCWLYLWC10,
author = {Bo{-}Ching He and
Chun{-}Hu Cheng and
Hua{-}Chiang Wen and
Yi{-}Shao Lai and
Ping{-}Feng Yang and
Meng{-}Hung Lin and
Wen{-}Fa Wu and
Chang{-}Pin Chou},
title = {Evaluation of the nanoindentation behaviors of SiGe epitaxial layer
on Si substrate},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {63--69},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.005},
doi = {10.1016/J.MICROREL.2009.08.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeCWLYLWC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeT10,
author = {Feifei He and
Cher Ming Tan},
title = {Circuit level interconnect reliability study using 3D circuit model},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {376--390},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.009},
doi = {10.1016/J.MICROREL.2009.12.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeT10a,
author = {Feifei He and
Cher Ming Tan},
title = {Modeling the effect of barrier thickness and low-k dielectric on circuit
reliability using 3D model},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1327--1331},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.111},
doi = {10.1016/J.MICROREL.2010.07.111},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeT10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeWLLWC10,
author = {Bo{-}Ching He and
Hua{-}Chiang Wen and
Meng{-}Hung Lin and
Yi{-}Shao Lai and
Wen{-}Fa Wu and
Chang{-}Pin Chou},
title = {Effect of annealing treatment and nanomechanical properties for multilayer
Si\({}_{\mbox{0.8}}\)Ge\({}_{\mbox{0.2}}\)-Si films},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {851--856},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.013},
doi = {10.1016/J.MICROREL.2010.02.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeWLLWC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HerkommerPR10,
author = {Dominik Herkommer and
Jeff M. Punch and
Michael Reid},
title = {A reliability model for {SAC} solder covering isothermal mechanical
cycling and thermal cycling conditions},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {116--126},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.008},
doi = {10.1016/J.MICROREL.2009.08.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HerkommerPR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HerthLBRL10,
author = {Etienne Herth and
Bernard Legrand and
Lionel Buchaillot and
Nathalie Rolland and
Tuami Lasri},
title = {Optimization of SiN\({}_{\mbox{X}}\): {H} films deposited by {PECVD}
for reliability of electronic, microsystems and optical applications},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1103--1106},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.011},
doi = {10.1016/J.MICROREL.2010.04.011},
timestamp = {Fri, 04 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HerthLBRL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HochstenbachDYZB10,
author = {Hendrik Pieter Hochstenbach and
Willem D. van Driel and
Dao{-}Guo Yang and
Jeroen J. M. Zaal and
E. Bagerman},
title = {Designing for reliability using a new Wafer Level Package structure},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {528--535},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.011},
doi = {10.1016/J.MICROREL.2009.09.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HochstenbachDYZB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HokkaMLTK10,
author = {Jussi Hokka and
Toni T. Mattila and
Jue Li and
Jarmo Teeri and
Jorma K. Kivilahti},
title = {A novel impact test system for more efficient reliability testing},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1125--1133},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.015},
doi = {10.1016/J.MICROREL.2010.04.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HokkaMLTK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HsuFYCCJLL10,
author = {Chia{-}Wei Hsu and
Yean{-}Kuen Fang and
Wen{-}Kuan Yeh and
Chun{-}Yu Chen and
Yen{-}Ting Chiang and
Feng{-}Renn Juang and
Chien{-}Ting Lin and
Chieh{-}Ming Lai},
title = {Improvement of {TDDB} reliability, characteristics of HfO\({}_{\mbox{2}}\)
high-k/metal gate {MOSFET} device with oxygen post deposition annealing},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {618--621},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.045},
doi = {10.1016/J.MICROREL.2010.01.045},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HsuFYCCJLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuFWLN10,
author = {Yeu{-}Jent Hu and
Chia{-}Hui Fang and
Jen{-}Cheng Wang and
Hung{-}Lun Lo and
Tzer{-}En Nee},
title = {Exciton wavefunction coupled surface plasmon resonance for In-rich
InGaN film with perforated aluminum cylindrical micropillar arrays},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1107--1110},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.018},
doi = {10.1016/J.MICROREL.2010.04.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuFWLN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangCC10,
author = {Chiao{-}Tzu Huang and
Kuen{-}Suan Chen and
Tsang{-}Chuan Chang},
title = {An application of {DMADV} methodology for increasing the yield rate
of surveillance cameras},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {266--272},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.003},
doi = {10.1016/J.MICROREL.2009.10.003},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HuangCC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HuangWCHLMC10,
author = {Po{-}Chin Huang and
San Lein Wu and
Shoou Jinn Chang and
Yao Tsung Huang and
Chien Ting Lin and
Mike Ma and
Osbert Cheng},
title = {Electrical characteristics of nMOSFETs fabricated on hybrid orientation
substrate with amorphization/templated recrystallization method},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {662--665},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.039},
doi = {10.1016/J.MICROREL.2010.01.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HuangWCHLMC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HungKCY10,
author = {H. J. Hung and
James B. Kuo and
D. Chen and
Chih{-}Sheng Yeh},
title = {Gate tunneling leakage current behavior of 40 nm {PD} {SOI} {NMOS}
device considering the floating body effect},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {607--609},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.015},
doi = {10.1016/J.MICROREL.2010.01.015},
timestamp = {Thu, 09 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/HungKCY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HwangLH10,
author = {Chih{-}Hong Hwang and
Yiming Li and
Ming{-}Hung Han},
title = {Statistical variability in FinFET devices with intrinsic parameter
fluctuations},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {635--638},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.041},
doi = {10.1016/J.MICROREL.2010.01.041},
timestamp = {Fri, 24 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HwangLH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IannacciRFTMB10,
author = {Jacopo Iannacci and
A. Repchankova and
Alessandro Faes and
Augusto Tazzoli and
Gaudenzio Meneghesso and
Gian{-}Franco Dalla Betta},
title = {Enhancement of {RF-MEMS} switch reliability through an active anti-stiction
heat-based mechanism},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1599--1603},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.108},
doi = {10.1016/J.MICROREL.2010.07.108},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IannacciRFTMB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/InfantePL10,
author = {Fulvio Infante and
Philippe Perdu and
Dean Lewis},
title = {Magnetic microscopy for ground plane current detection: a fast and
reliable technique for current leakage localization by means of magnetic
simulations},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1700--1705},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.109},
doi = {10.1016/J.MICROREL.2010.07.109},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/InfantePL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/IyerS10,
author = {Satyanarayan Iyer and
Krishnaswami Srihari},
title = {Assembly reliability assessment and life estimation for a stacked
area array device},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {978--985},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.018},
doi = {10.1016/J.MICROREL.2010.03.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/IyerS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangCSLH10,
author = {Sheng{-}Lyang Jang and
Chia{-}Wei Chang and
Yi{-}Jhe Song and
Cheng{-}Chen Liu and
Chun{-}Wei Hsu},
title = {On the injection methods in a top-series-injection-locked frequency
divider},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {589--593},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.038},
doi = {10.1016/J.MICROREL.2010.01.038},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JangCSLH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangLYSCY10,
author = {Sheng{-}Lyang Jang and
Cheng{-}Chen Liu and
Ren{-}Kai Yang and
Chih{-}Chieh Shih and
Chia{-}Wei Chang and
Hsiu{-}An Yeh},
title = {A 0.35 {\(\mathrm{\mu}\)}m {CMOS} divide-by-2 quadrature injection-locked
frequency divider based on voltage-current feedback topology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {594--598},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.020},
doi = {10.1016/J.MICROREL.2010.01.020},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JangLYSCY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JangYWHH10,
author = {Changsoo Jang and
Byeng Dong Youn and
Ping F. Wang and
Bongtae Han and
Suk{-}Jin Ham},
title = {Forward-stepwise regression analysis for fine leak batch testing of
wafer-level hermetic {MEMS} packages},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {507--513},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.014},
doi = {10.1016/J.MICROREL.2009.11.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JangYWHH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Jankovic10,
author = {Nebojsa D. Jankovic},
title = {Carbon Nanotubes: Science and Applications, M. Meyyappan (Ed.). {CRC}
Press {LLC} (2005), 289 pp., {\textdollar}103.13, Hardcover, {ISBN:}
0-8493-2111-5},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1189},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.008},
doi = {10.1016/J.MICROREL.2010.06.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Jankovic10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JavaheriS10,
author = {M. Reza Javaheri and
Reza Sedaghat},
title = {Strength violation effect on soft-error detection in sub-micron technology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {971--977},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.002},
doi = {10.1016/J.MICROREL.2010.03.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JavaheriS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JeongK10,
author = {Jae{-}Seong Jeong and
Young Jeon Kim},
title = {Failure mechanism of {COF} based Line Driver {IC} for Flat Panel Display
by contamination},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1488--1493},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.063},
doi = {10.1016/J.MICROREL.2010.07.063},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JeongK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JiGY10,
author = {Li{-}Na Ji and
Yi Gong and
Zhen{-}Guo Yang},
title = {Failure investigation on copper-plated blind vias in {PCB}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1163--1170},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.006},
doi = {10.1016/J.MICROREL.2010.04.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JiGY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JinLK10,
author = {Tongdan Jin and
Haitao Liao and
Madhu Kilari},
title = {Reliability growth modeling for in-service electronic systems considering
latent failure modes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {324--331},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.001},
doi = {10.1016/J.MICROREL.2010.01.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JinLK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/JohGPA10,
author = {Jungwoo Joh and
Feng Gao and
Tom{\'{a}}s Palacios and
Jes{\'{u}}s A. del Alamo},
title = {A model for the critical voltage for electrical degradation of GaN
high electron mobility transistors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {767--773},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.015},
doi = {10.1016/J.MICROREL.2010.02.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/JohGPA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KakushimaOKKTKSANTSHI10,
author = {Kuniyuki Kakushima and
K. Okamoto and
T. Koyanagi and
M. Kouda and
Kiichi Tachi and
Takamasa Kawanago and
J. Song and
Parhat Ahmet and
Hiroshi Nohira and
Kazuo Tsutsui and
Nobuyuki Sugii and
Takeo Hattori and
Hiroshi Iwai},
title = {SrO capping effect for La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/Ce-silicate
gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {356--359},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.004},
doi = {10.1016/J.MICROREL.2009.12.004},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KakushimaOKKTKSANTSHI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KakushimaTATSHI10,
author = {Kuniyuki Kakushima and
Kiichi Tachi and
Parhat Ahmet and
Kazuo Tsutsui and
Nobuyuki Sugii and
Takeo Hattori and
Hiroshi Iwai},
title = {Advantage of further scaling in gate dielectrics below 0.5 nm of equivalent
oxide thickness with La\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\) gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {790--793},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.001},
doi = {10.1016/J.MICROREL.2010.02.001},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KakushimaTATSHI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KamaraLBHMT10,
author = {E. Kamara and
Hua Lu and
Chris Bailey and
Chris Hunt and
Davide Di Maio and
Owen Thomas},
title = {A multi-disciplinary study of vibration based reliability of lead-free
electronic interconnects},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1706--1710},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.152},
doi = {10.1016/J.MICROREL.2010.07.152},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KamaraLBHMT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaoCCCL10,
author = {Chyuan Haur Kao and
T. C. Chan and
Kung Shao Chen and
Yu{-}Teng Chung and
Wen{-}Shih Luo},
title = {Physical and electrical characteristics of the high-k Nd\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
polyoxide deposited on polycrystalline silicon},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {709--712},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.005},
doi = {10.1016/J.MICROREL.2010.02.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaoCCCL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KapoorEOB10,
author = {Raman Kapoor and
Enrique Escobedo{-}Cousin and
S. H. Olsen and
S. J. Bull},
title = {Characterising gate dielectrics in high mobility devices using novel
nanoscale techniques},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1484--1487},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.124},
doi = {10.1016/J.MICROREL.2010.07.124},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KapoorEOB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KaratasT10,
author = {S. Karatas and
Abdulmecit T{\"{u}}r{\"{u}}t},
title = {The frequency-dependent electrical characteristics of interfaces in
the Sn/p-Si metal semiconductor structures},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {351--355},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.017},
doi = {10.1016/J.MICROREL.2009.10.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KaratasT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KarppinenLMP10,
author = {Juha Karppinen and
Jue Li and
Toni T. Mattila and
Mervi Paulasto{-}Kr{\"{o}}ckel},
title = {Thermomechanical reliability characterization of a handheld product
in accelerated tests and use environment},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1994--2000},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.011},
doi = {10.1016/J.MICROREL.2010.07.011},
timestamp = {Thu, 03 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KarppinenLMP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KeaneKWK10,
author = {John Keane and
Tony Tae{-}Hyoung Kim and
Xiaofei Wang and
Chris H. Kim},
title = {On-chip reliability monitors for measuring circuit degradation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1039--1053},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.024},
doi = {10.1016/J.MICROREL.2010.04.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KeaneKWK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KellerT10,
author = {C. Keller and
S. Tus},
title = {Investigation of open bond wires in {MEMS} devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1697--1699},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.107},
doi = {10.1016/J.MICROREL.2010.07.107},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KellerT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhatirDI10,
author = {Zoubir Khatir and
Laurent Dupont and
Ali Ibrahim},
title = {Investigations on junction temperature estimation based on junction
voltage measurements},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1506--1510},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.102},
doi = {10.1016/J.MICROREL.2010.07.102},
timestamp = {Thu, 25 Jan 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KhatirDI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhoMGBONL10,
author = {Ramun M. Kho and
A. J. Moonen and
V. M. Girault and
Jaap Bisschop and
E. H. T. Olthof and
S. Nath and
Z. N. Liang},
title = {Determination of the stress level for voltage screen of integrated
circuits},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1210--1214},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.103},
doi = {10.1016/J.MICROREL.2010.07.103},
timestamp = {Tue, 19 May 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KhoMGBONL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KhorMAA10,
author = {C. Y. Khor and
M. Abdul Mujeebu and
Mohd Zulkifly Abdullah and
F. Che Ani},
title = {Finite volume based {CFD} simulation of pressurized flip-chip underfill
encapsulation process},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {98--105},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.007},
doi = {10.1016/J.MICROREL.2009.08.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KhorMAA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kim10,
author = {Eun{-}Kyung Kim},
title = {Assessment of ultra-thin Si wafer thickness in 3D wafer stacking},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {195--198},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.002},
doi = {10.1016/J.MICROREL.2009.10.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kim10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Kim10a,
author = {Injoong Kim},
title = {Reliability Object Model Tree (ROM-Tree): {A} system design-for-reliability
method},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {438--446},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.008},
doi = {10.1016/J.MICROREL.2009.12.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Kim10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimASZPK10,
author = {Hee{-}Dong Kim and
Ho{-}Myoung An and
Yujeong Seo and
Yongjie Zhang and
Jongsun Park and
Tae Geun Kim},
title = {Hydrogen passivation effects under negative bias temperature instability
stress in metal/silicon-oxide/silicon-nitride/silicon-oxide/silicon
capacitors for flash memories},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {21--25},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.008},
doi = {10.1016/J.MICROREL.2009.09.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimASZPK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKK10,
author = {Hyomi Kim and
Jongmin Kim and
Jooheon Kim},
title = {Effects of novel carboxylic acid-based reductants on the wetting characteristics
of anisotropic conductive adhesive with low melting point alloy filler},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {258--265},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.009},
doi = {10.1016/J.MICROREL.2009.11.009},
timestamp = {Fri, 11 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimKK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimKK10a,
author = {Youngrae Kim and
Sung{-}Keun Kang and
Sarah Eunkyung Kim},
title = {Study of thinned Si wafer warpage in 3D stacked wafers},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1988--1993},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.006},
doi = {10.1016/J.MICROREL.2010.05.006},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimKK10a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimOCP10,
author = {Jin{-}Young Kim and
Jun{-}Seok Oh and
Won{-}Ju Cho and
Jong Tae Park},
title = {{NBTI} and hot carrier effect of Schottky-barrier p-MOSFETs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1290--1293},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.084},
doi = {10.1016/J.MICROREL.2010.07.084},
timestamp = {Thu, 21 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimOCP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimPC10,
author = {Yeong K. Kim and
In Soo Park and
Jooho Choi},
title = {Warpage mechanism analyses of strip panel type {PBGA} chip packaging},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {398--406},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.010},
doi = {10.1016/J.MICROREL.2009.12.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KimPC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KimPP10,
author = {Dong Wook Kim and
Woo Sang Park and
Jong Tae Park},
title = {The optimum fin width in p-MuGFETs with the consideration of {NBTI}
and hot carrier degradation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1316--1319},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.088},
doi = {10.1016/J.MICROREL.2010.07.088},
timestamp = {Fri, 22 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KimPP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoC10,
author = {Cheng{-}Ta Ko and
Kuan{-}Neng Chen},
title = {Wafer-level bonding/stacking technology for 3D integration},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {481--488},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.015},
doi = {10.1016/J.MICROREL.2009.09.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KoC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KobayashiKARTI10,
author = {Yusuke Kobayashi and
Kuniyuki Kakushima and
Parhat Ahmet and
V. Ramgopal Rao and
Kazuo Tsutsui and
Hiroshi Iwai},
title = {Analysis of dependence of short-channel effects in double-gate MOSFETs
on channel thickness},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {332--337},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.003},
doi = {10.1016/J.MICROREL.2010.01.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KobayashiKARTI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KokkoPF10,
author = {Kati Kokko and
Anniina Parviainen and
Laura Frisk},
title = {Corrosion protection of anisotropically conductive adhesive joined
flip chips},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1152--1158},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.010},
doi = {10.1016/J.MICROREL.2010.04.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KokkoPF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoneGHMMLZNG10,
author = {G. A. Kon{\'{e}} and
Brice Grandchamp and
C. Hainaut and
Fran{\c{c}}ois Marc and
Cristell Maneux and
Nathalie Labat and
Thomas Zimmer and
Virginie Nodjiadjim and
Jean Godin},
title = {Preliminary results of storage accelerated aging test on InP/InGaAs
{DHBT}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1548--1553},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.141},
doi = {10.1016/J.MICROREL.2010.07.141},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KoneGHMMLZNG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KoszewskiSDO10,
author = {A. Koszewski and
F. Souchon and
Ch. Dieppedale and
Thierry Ouisse},
title = {Modeling of dielectric charging in electrostatic {MEMS} switches},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1609--1614},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.104},
doi = {10.1016/J.MICROREL.2010.07.104},
timestamp = {Fri, 01 Mar 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KoszewskiSDO10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KrammerS10,
author = {Oliv{\'{e}}r Krammer and
B{\'{a}}lint Sinkovics},
title = {Improved method for determining the shear strength of chip component
solder joints},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {235--241},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.016},
doi = {10.1016/J.MICROREL.2009.10.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KrammerS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KumarDP10,
author = {Sachin Kumar and
Eli Dolev and
Michael G. Pecht},
title = {Parameter selection for health monitoring of electronic products},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {161--168},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.016},
doi = {10.1016/J.MICROREL.2009.09.016},
timestamp = {Fri, 04 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KumarDP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuoC10,
author = {Chinguo Kuo and
Jen{-}Jun Chen},
title = {Development of a novel stack package to fabricate high density memory
modules for high-end application},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1116--1120},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.025},
doi = {10.1016/J.MICROREL.2010.04.025},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KuoC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KuoLLYCHLL10,
author = {Shou{-}Yi Kuo and
Kou{-}Chen Liu and
Fang{-}I Lai and
Jui{-}Fu Yang and
Wei{-}Chun Chen and
Ming{-}Yang Hsieh and
Hsin{-}I Lin and
Woei{-}Tyng Lin},
title = {Effects of {RF} power on the structural, optical and electrical properties
of Al-doped zinc oxide films},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {730--733},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.042},
doi = {10.1016/J.MICROREL.2010.01.042},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KuoLLYCHLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LambertJBOMDTFBM10,
author = {Benoit Lambert and
G. Jonsson and
J. Bataille and
C. Ollivier and
P. Mezenge and
H. Derewonko and
H. Thomas and
D. Floriot and
Herv{\'{e}} Blanck and
C. Moreau},
title = {Reliability of high voltage/high power L/S-band Hbt technology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1543--1547},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.105},
doi = {10.1016/J.MICROREL.2010.07.105},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LambertJBOMDTFBM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LancellottiFRSD10,
author = {Laura Lancellotti and
Raffaele Fucci and
Antonio Romano and
Angelo Sarno and
Santolo Daliento},
title = {Induced degradation on c-Si solar cells for concentration terrestrial
applications},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1903--1906},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.106},
doi = {10.1016/J.MICROREL.2010.07.106},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LancellottiFRSD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Langfelder10,
author = {Giacomo Langfelder},
title = {Design of a fully {CMOS} compatible 3-{\(\mathrm{\mu}\)}m size color
pixel},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {169--173},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.008},
doi = {10.1016/J.MICROREL.2009.10.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Langfelder10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LanzaPNAWH10,
author = {Mario Lanza and
Marc Porti and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
E. Whittaker and
B. Hamilton},
title = {{UHV} {CAFM} characterization of high-k dielectrics: Effect of the
technique resolution on the pre- and post-breakdown electrical measurements},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1312--1315},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.049},
doi = {10.1016/J.MICROREL.2010.07.049},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LanzaPNAWH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LarcherP10,
author = {Luca Larcher and
Andrea Padovani},
title = {High-kappa related reliability issues in advanced non-volatile memories},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1251--1258},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.099},
doi = {10.1016/J.MICROREL.2010.07.099},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LarcherP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LatryDMMSCEM10,
author = {Olivier Latry and
Pascal Dherb{\'{e}}court and
Karine Mourgues and
Hichame Maanane and
Jean Pierre Sipma and
F. Cornu and
Philippe Eudeline and
Mohamed Masmoudi},
title = {A 5000 h {RF} life test on 330 {W} {RF-LDMOS} transistors for radars
applications},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1574--1576},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.086},
doi = {10.1016/J.MICROREL.2010.07.086},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LatryDMMSCEM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LauYLTLLSC10,
author = {W. S. Lau and
Peizhen Yang and
Eng Hua Lim and
Yee Ling Tang and
Seow Wei Lai and
V. L. Lo and
S. Y. Siah and
L. Chan},
title = {Observation of halo implant from the drain side reaching the source
side and vice versa in extremely short p-channel transistors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {346--350},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.006},
doi = {10.1016/J.MICROREL.2009.12.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LauYLTLLSC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LecceEBMZFC10,
author = {Valerio Di Lecce and
Michele Esposto and
Matteo Bonaiuti and
Gaudenzio Meneghesso and
Enrico Zanoni and
Fausto Fantini and
Alessandro Chini},
title = {Experimental and simulated dc degradation of GaN HEMTs by means of
gate-drain and gate-source reverse bias stress},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1523--1527},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.126},
doi = {10.1016/J.MICROREL.2010.07.126},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LecceEBMZFC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LecuyerFLB10,
author = {Pascal Lecuyer and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont and
Jean{-}Pierre Landesman and
Manoubi Auguste Bahi},
title = {Wearout estimation using the Robustness Validation methodology for
components in 150 degreeC ambient automotive applications},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1744--1749},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.076},
doi = {10.1016/J.MICROREL.2010.07.076},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LecuyerFLB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLC10,
author = {Cheng{-}Ling Lee and
Kuo{-}Hsiang Lin and
Nan{-}Kuang Chen},
title = {Analysis of optical properties of fundamental-mode in waveguide tapered
fibers},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {726--729},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.032},
doi = {10.1016/J.MICROREL.2010.01.032},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeLC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeLLSH10,
author = {Kuo{-}Fu Lee and
Yiming Li and
Tien{-}Yeh Li and
Zhong{-}Cheng Su and
Chin{-}Hong Hwang},
title = {Device and circuit level suppression techniques for random-dopant-induced
static noise margin fluctuation in 16-nm-gate {SRAM} cell},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {647--651},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.021},
doi = {10.1016/J.MICROREL.2010.01.021},
timestamp = {Fri, 24 Feb 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeLLSH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeSK10,
author = {Seok Hwan Lee and
Jaeyong Sung and
Sarah Eunkyung Kim},
title = {Dynamic flow measurements of capillary underfill through a bump array
in flip chip package},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2078--2083},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.001},
doi = {10.1016/J.MICROREL.2010.07.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeSK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeTTWT10,
author = {Tseng{-}Chin Lee and
Bing{-}Yue Tsui and
Pei{-}Jer Tzeng and
Ching{-}Chiun Wang and
Ming{-}Jinn Tsai},
title = {A process for high yield and high performance carbon nanotube field
effect transistors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {666--669},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.008},
doi = {10.1016/J.MICROREL.2010.01.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeTTWT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LeeWJLRSLCC10,
author = {Maw{-}Shung Lee and
Sean Wu and
Shih{-}Bin Jhong and
Kuan{-}Ting Liu and
Ruyen Ro and
Chia{-}Chi Shih and
Zhi{-}Xun Lin and
Kang{-}I Chen and
Shou{-}Chang Cheng},
title = {Influence of substrate temperature to prepare {(1} 0 3) oriented AlN
films},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1984--1987},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.010},
doi = {10.1016/J.MICROREL.2010.06.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LeeWJLRSLCC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiBBL10,
author = {Binhong Li and
Alexandre Boyer and
Sonia Bendhia and
Christophe Lemoine},
title = {Ageing effect on electromagnetic susceptibility of a phase locked
loop},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1304--1308},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.100},
doi = {10.1016/J.MICROREL.2010.07.100},
timestamp = {Mon, 20 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiBBL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiZZ10,
author = {Hongge Li and
Wei Zhao and
Youguang Zhang},
title = {Micropower fully integrated {CMOS} readout interface for neural recording
application},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {273--281},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.013},
doi = {10.1016/J.MICROREL.2009.09.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiZZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiaoKCMN10,
author = {Joy Y. Liao and
Steven Kasapi and
Bruce Cory and
Howard L. Marks and
Yin S. Ng},
title = {Scan chain failure analysis using laser voltage imaging},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1422--1426},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.101},
doi = {10.1016/J.MICROREL.2010.07.101},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiaoKCMN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LibertinoCMMPPCSGCLRL10,
author = {Sebania Libertino and
Domenico Corso and
G. Mur{\`{e}} and
A. Marino and
Felix Palumbo and
Fabio Principato and
G. Cannella and
T. Schillaci and
S. Giarusso and
F. Celi and
Michael Lisiansky and
Yakov Roizin and
Salvatore Lombardo},
title = {Radiation effects in nitride read-only memories},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1857--1860},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.068},
doi = {10.1016/J.MICROREL.2010.07.068},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LibertinoCMMPPCSGCLRL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinCJYDTTL10,
author = {Cheng{-}Chen Lin and
Liann{-}Be Chang and
Ming{-}Jer Jeng and
Chia{-}Yi Yen and
Atanu Das and
Chung{-}Yi Tang and
Ming{-}Yi Tsai and
Mu{-}Jen Lai},
title = {Fabrication and thermal analysis of flip-chip light-emitting diodes
with different numbers of Au stub bumps},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {683--687},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.036},
doi = {10.1016/J.MICROREL.2010.01.036},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinCJYDTTL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinKH10,
author = {Chun{-}Yu Lin and
Ming{-}Dou Ker and
Yuan{-}Wen Hsiao},
title = {Design of differential low-noise amplifier with cross-coupled-SCR
{ESD} protection scheme},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {831--838},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.020},
doi = {10.1016/J.MICROREL.2010.02.020},
timestamp = {Wed, 04 May 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LinKH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LinLCLCLKFW10,
author = {Ray{-}Ming Lin and
Yung{-}Hsiang Lin and
Chung{-}Hao Chiang and
Mu{-}Jen Lai and
Yi{-}Lun Chou and
Yuan{-}Chieh Lu and
Shou{-}Yi Kuo and
Bor{-}Ren Fang and
Meng{-}Chyi Wu},
title = {Inserting a low-temperature n-GaN underlying layer to separate nonradiative
recombination centers improves the luminescence efficiency of blue
InGaN/GaN LEDs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {679--682},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.017},
doi = {10.1016/J.MICROREL.2010.01.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LinLCLCLKFW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiouL10,
author = {Juin J. Liou and
Chao{-}Sung Lai},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {583},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.010},
doi = {10.1016/J.MICROREL.2010.02.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiouL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Liu10,
author = {Yong Liu},
title = {Trends of power semiconductor wafer level packaging},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {514--521},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.002},
doi = {10.1016/J.MICROREL.2009.09.002},
timestamp = {Mon, 09 Mar 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Liu10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuC10,
author = {Chuan{-}Hsi Liu and
H. W. Chen},
title = {Electrical characteristics and reliability properties of metal-oxide-semiconductor
capacitors with HfZrLaO gate dielectrics},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {599--602},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.014},
doi = {10.1016/J.MICROREL.2010.01.014},
timestamp = {Mon, 29 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuCLHT10,
author = {De{-}Shin Liu and
Chi{-}Min Chang and
John Liu and
Shu{-}Ching Ho and
Hao{-}Yin Tsai},
title = {Novel analysis model for investigation of contact force and scrub
length for design of probe card},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {872--880},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.011},
doi = {10.1016/J.MICROREL.2010.02.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuCLHT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuLLY10,
author = {Hongxia Liu and
Bin Li and
Jin Li and
Bo Yuan},
title = {A comparative study of self-heating effect of nMOSFETs fabricated
on {SGOI} and {SGSOAN} substrates},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1942--1950},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.013},
doi = {10.1016/J.MICROREL.2010.05.013},
timestamp = {Mon, 07 Feb 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuLLY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuTCCKC10,
author = {Kou{-}Chen Liu and
Wen{-}Hsien Tzeng and
Kow{-}Ming Chang and
Yi{-}Chun Chan and
Chun{-}Chih Kuo and
Chun{-}Wen Cheng},
title = {The resistive switching characteristics of a Ti/Gd\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/Pt
{RRAM} device},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {670--673},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.006},
doi = {10.1016/J.MICROREL.2010.02.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuTCCKC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuTH10,
author = {Hongxia Liu and
Baojun Tang and
Yue Hao},
title = {Characteristics analysis and optimization design of a new {ESD} power
clamp circuit},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1087--1093},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.004},
doi = {10.1016/J.MICROREL.2010.04.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuTH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuYL10,
author = {Xiang Liu and
Jiann{-}Shiun Yuan and
Juin J. Liou},
title = {Electro-thermal stress effect on InGaP/GaAs heterojunction bipolar
low-noise amplifier performance},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {365--369},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.007},
doi = {10.1016/J.MICROREL.2009.12.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuYL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuZCC10,
author = {De{-}Shin Liu and
Zhen{-}Wei Zhuang and
Ching{-}Yang Chen and
Cho{-}Liang Chung},
title = {Modeling of multi-layered structure containing heterogeneous material
layer with randomly distributed particles using infinite element method},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {106--115},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.002},
doi = {10.1016/J.MICROREL.2009.08.002},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LiuZCC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuZLKESH10,
author = {Jie Liu and
Jicheng Zhou and
Hongwei Luo and
Xuedong Kong and
Yunfei En and
Qian Shi and
Yujuan He},
title = {Total-dose-induced edge effect in {SOI} {NMOS} transistors with different
layouts},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {45--47},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.003},
doi = {10.1016/J.MICROREL.2009.09.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuZLKESH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LiuZZLW10,
author = {Lijuan Liu and
Wei Zhou and
Hongbo Zhang and
Baoling Li and
Ping Wu},
title = {Electromigration behavior in Cu/Sn-8Zn-3Bi/Cu solder joint},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {251--257},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.018},
doi = {10.1016/J.MICROREL.2009.09.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LiuZZLW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LloydCHRW10,
author = {J. R. Lloyd and
N. A. Connelly and
Xiaoli He and
K. J. Ryan and
B. H. Wood},
title = {Fast diffusers in a thermal gradient (solder ball)},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1355--1358},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.067},
doi = {10.1016/J.MICROREL.2010.07.067},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LloydCHRW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuWYCHAL10,
author = {Tseng{-}Fu Lu and
Jer{-}Chyi Wang and
Chia{-}Ming Yang and
Chung{-}Po Chang and
Kuan{-}I Ho and
Chi{-}Fong Ai and
Chao{-}Sung Lai},
title = {Non-ideal effects improvement of SF\({}_{\mbox{6}}\) plasma treated
hafnium oxide film based on electrolyte-insulator-semiconductor structure
for pH-sensor application},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {742--746},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.029},
doi = {10.1016/J.MICROREL.2010.01.029},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LuWYCHAL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LueWPYWLL10,
author = {Cheng{-}En Lue and
Jer{-}Chyi Wang and
Dorota G. Pijanowska and
Chia{-}Ming Yang and
I{-}Shun Wang and
Huang{-}Chia Lee and
Chao{-}Sung Lai},
title = {Hysteresis effect on traps of Si\({}_{\mbox{3}}\)N\({}_{\mbox{4}}\)
sensing membranes for pH difference sensitivity},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {738--741},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.026},
doi = {10.1016/J.MICROREL.2010.01.026},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LueWPYWLL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LuoSHHR10,
author = {J. S. Luo and
C. S. Sung and
W. S. Hsu and
L. Y. Huang and
Jeremy D. Russell},
title = {Electron beam induced carbon deposition using hydrocarbon contamination
for {XTEM} analysis},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1446--1450},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.046},
doi = {10.1016/J.MICROREL.2010.07.046},
timestamp = {Mon, 06 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/LuoSHHR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaJZDSERGF10,
author = {Xiaosong Ma and
Kaspar M. B. Jansen and
G. Q. Zhang and
Willem D. van Driel and
Olaf van der Sluis and
Leo J. Ernst and
C. Regards and
Christian Gautier and
H{\'{e}}l{\`{e}}ne Fr{\'{e}}mont},
title = {A fast moisture sensitivity level qualification method},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1654--1660},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.066},
doi = {10.1016/J.MICROREL.2010.07.066},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MaJZDSERGF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaWZZHZ10,
author = {Chenyue Ma and
Hao Wang and
Chenfei Zhang and
Xiufang Zhang and
Jin He and
Xing Zhang},
title = {Temperature dependence of the interface state distribution due to
hot carrier effect in FinFET device},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1077--1080},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.017},
doi = {10.1016/J.MICROREL.2010.04.017},
timestamp = {Fri, 01 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MaWZZHZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaZWLZD10,
author = {Zhongfa Ma and
Peng Zhang and
Yong Wu and
Weihua Li and
Yiqi Zhuang and
Lei Du},
title = {A percolation study of {RTS} noise amplitudes in nano-MOSFETs by Monte
Carlo simulation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {179--182},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.017},
doi = {10.1016/J.MICROREL.2009.09.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaZWLZD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MahdaviM10,
author = {Seyyed Javad Seyyed Mahdavi and
Karim Mohammadi},
title = {Reliability enhancement of digital combinational circuits based on
evolutionary approach},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {415--423},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.016},
doi = {10.1016/J.MICROREL.2009.11.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MahdaviM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MaikapPBDL10,
author = {Siddheswar Maikap and
Amit Prakash and
W. Banerjee and
Anirban Das and
Chao{-}Sung Lai},
title = {Characteristics of pH sensors fabricated by using protein-mediated
CdSe/ZnS quantum dots},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {747--752},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.004},
doi = {10.1016/J.MICROREL.2010.02.004},
timestamp = {Wed, 10 Mar 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MaikapPBDL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MalandruccoloCRHF10,
author = {Vezio Malandruccolo and
Mauro Ciappa and
Hubert Rothleitner and
M. Hommel and
Wolfgang Fichtner},
title = {A new built-in screening methodology for Successive Approximation
Register Analog to Digital Converters},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1750--1757},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.096},
doi = {10.1016/J.MICROREL.2010.07.096},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MalandruccoloCRHF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarquesNN10,
author = {Elaine Crespo Marques and
Lirida A. B. Naviner and
Jean{-}Fran{\c{c}}ois Naviner},
title = {An efficient tool for reliability improvement based on {TMR}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1247--1250},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.095},
doi = {10.1016/J.MICROREL.2010.07.095},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MarquesNN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Martin-MartinezAGVRNAS10,
author = {Javier Mart{\'{\i}}n{-}Mart{\'{\i}}nez and
Esteve Amat and
M. B. Gonz{\'{a}}lez and
P. Verheyen and
Rosana Rodr{\'{\i}}guez and
Montserrat Nafr{\'{\i}}a and
Xavier Aymerich and
Eddy Simoen},
title = {{SPICE} modelling of hot-carrier degradation in Si\({}_{\mbox{1-}}\)\({}_{\mbox{x}}\)Ge\({}_{\mbox{x}}\)
{S/D} and HfSiON based pMOS transistors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1263--1266},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.150},
doi = {10.1016/J.MICROREL.2010.07.150},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Martin-MartinezAGVRNAS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MartineauMLDL10,
author = {Donatien Martineau and
Thomas Mazeaud and
Marc Legros and
Philippe Dupuy and
Colette Levade},
title = {Characterization of alterations on power {MOSFET} devices under extreme
electro-thermal fatigue},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1768--1772},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.065},
doi = {10.1016/J.MICROREL.2010.07.065},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MartineauMLDL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MashikoEFNI10,
author = {Yoji Mashiko and
Hiroaki Etoh and
Akiyoshi Furukawa and
Daisuke Nomiyama and
Osamu Ichimaru},
title = {Study of non-contact nano-probing technique using {FIB}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1451--1453},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.037},
doi = {10.1016/J.MICROREL.2010.07.037},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MashikoEFNI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MatmatKCIMEFE10,
author = {Mohamed Matmat and
K. Koukos and
Fabio Coccetti and
T. Idda and
Antoine Marty and
Christophe Escriba and
Jean{-}Yves Fourniols and
Daniel Est{\`{e}}ve},
title = {Life expectancy and characterization of capacitive {RF} {MEMS} switches},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1692--1696},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.064},
doi = {10.1016/J.MICROREL.2010.07.064},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MatmatKCIMEFE10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeenaCTYWK10,
author = {Jagan Singh Meena and
Min{-}Ching Chu and
Jitendra N. Tiwari and
Hsin{-}Chiang You and
Chung{-}Hsin Wu and
Fu{-}Hsiang Ko},
title = {Flexible metal-insulator-metal capacitor using plasma enhanced binary
hafnium-zirconium-oxide as gate dielectric layer},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {652--656},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.046},
doi = {10.1016/J.MICROREL.2010.01.046},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MeenaCTYWK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MelloRAA10,
author = {Domenico Mello and
R. Ricciari and
M. Aiello and
M. Astuto},
title = {Case study: Failure analysis for metal corrosion induced by pressure
pot test},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1436--1440},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.098},
doi = {10.1016/J.MICROREL.2010.07.098},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MelloRAA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghiniBBSYGMZ10,
author = {Matteo Meneghini and
Diego Barbisan and
Y. Bilenko and
Maxim S. Shatalov and
J. Yang and
R. Gaska and
Gaudenzio Meneghesso and
Enrico Zanoni},
title = {Defect-related degradation of Deep-UV-LEDs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1538--1542},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.089},
doi = {10.1016/J.MICROREL.2010.07.089},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeneghiniBBSYGMZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghiniTOYTUZM10,
author = {Matteo Meneghini and
Nicola Trivellin and
Kenji Orita and
Masaaki Yuri and
Tsuyoshi Tanaka and
Daisuke Ueda and
Enrico Zanoni and
Gaudenzio Meneghesso},
title = {Reliability evaluation for Blu-Ray laser diodes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {467--470},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.034},
doi = {10.1016/J.MICROREL.2010.01.034},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeneghiniTOYTUZM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MerilampiBHRUS10,
author = {Sari Merilampi and
Toni Bj{\"{o}}rninen and
Veikko Haukka and
Pekka Ruuskanen and
Leena Ukkonen and
Lauri Syd{\"{a}}nheimo},
title = {Analysis of electrically conductive silver ink on stretchable substrates
under tensile load},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2001--2011},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.011},
doi = {10.1016/J.MICROREL.2010.06.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MerilampiBHRUS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MichalasPV10,
author = {Loukas Michalas and
George J. Papaioannou and
Apostolos T. Voutsas},
title = {Degradation of polycrystalline silicon TFTs due to alpha particles
irradiation stress},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1848--1851},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.090},
doi = {10.1016/J.MICROREL.2010.07.090},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MichalasPV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MirandaOH10,
author = {Enrique Miranda and
Eamon O'Connor and
Paul K. Hurley},
title = {Exploratory analysis of the breakdown spots spatial distribution in
metal gate/high-K/III-V stacks using functional summary statistics},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1294--1297},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.092},
doi = {10.1016/J.MICROREL.2010.07.092},
timestamp = {Tue, 11 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MirandaOH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MohammadiA10,
author = {Saeed Mohammadi and
Ali Afzali{-}Kusha},
title = {Modeling of drain current, capacitance and transconductance in thin
film undoped symmetric {DG} MOSFETs including quantum effects},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {338--345},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.002},
doi = {10.1016/J.MICROREL.2009.12.002},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MohammadiA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoreauPTHRGRSH10,
author = {Christian Moreau and
M. Le Pipec and
S. Tence and
J. Hemery and
J. Rigo and
C. Gu{\'{e}}rin and
D. Ruelloux and
C. Schneider and
P. Le Helleye},
title = {A complete methodology for assessing GaN behaviour for military applications},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1587--1592},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.093},
doi = {10.1016/J.MICROREL.2010.07.093},
timestamp = {Wed, 15 Jul 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MoreauPTHRGRSH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MoschouKKV10,
author = {Despina C. Moschou and
Giannis P. Kontogiannopoulos and
Dimitrios N. Kouvatsos and
Apostolos T. Voutsas},
title = {On the importance of the V\({}_{\mbox{g, max}}\)-V\({}_{\mbox{th}}\)
parameter on {LTPS} {TFT} stressing behavior},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {190--194},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.014},
doi = {10.1016/J.MICROREL.2009.10.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MoschouKKV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MuraV10,
author = {Giovanna Mura and
Massimo Vanzi},
title = {The interpretation of the {DC} characteristics of {LED} and laser
diodes to address their failure analysis},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {471--478},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.035},
doi = {10.1016/J.MICROREL.2010.01.035},
timestamp = {Tue, 21 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/MuraV10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Neitzert10,
author = {Heinz{-}Christoph Neitzert},
title = {{ESD} sensitivity of AlGaAs and InGaAsP based Fabry-Perot laser diodes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1563--1567},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.094},
doi = {10.1016/J.MICROREL.2010.07.094},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Neitzert10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NguyenLKP10,
author = {Tung T. Nguyen and
Donggun Lee and
Jae B. Kwak and
Seungbae Park},
title = {Effect of glue on reliability of flip chip {BGA} packages under thermal
cycling},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {1000--1006},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.003},
doi = {10.1016/J.MICROREL.2010.04.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NguyenLKP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NoijenEMOSS10,
author = {Sander Noijen and
Roy Engelen and
Joerg Martens and
Alexandru Opran and
Olaf van der Sluis and
Richard B. R. van Silfhout},
title = {Prediction of the epoxy moulding compound aging effect on package
reliability},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {917--922},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.025},
doi = {10.1016/J.MICROREL.2010.02.025},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NoijenEMOSS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NotermansSMJSZM10,
author = {Guido Notermans and
Theo Smedes and
Zeljko Mrcarica and
Peter C. de Jong and
Ralph Stephan and
Hans van Zwol and
Dejan M. Maksimovic},
title = {{ESD} protection for thin gate oxides in 65 nm},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {26--31},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.010},
doi = {10.1016/J.MICROREL.2009.09.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NotermansSMJSZM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NovikovVGNW10,
author = {Yu. N. Novikov and
A. V. Vishnyakov and
V. A. Gritsenko and
K. A. Nasyrov and
Hei Wong},
title = {Modeling the charge transport mechanism in amorphous Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
with multiphonon trap ionization effect},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {207--210},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.004},
doi = {10.1016/J.MICROREL.2009.11.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NovikovVGNW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NunezVGAE10,
author = {Neftal{\'{\i}} N{\'{u}}{\~{n}}ez and
Manuel V{\'{a}}zquez and
Jos{\'{e}} Ram{\'{o}}n Gonz{\'{a}}lez and
Carlos Algora and
P. Espinet},
title = {Novel accelerated testing method for {III-V} concentrator solar cells},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1880--1883},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.085},
doi = {10.1016/J.MICROREL.2010.07.085},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/NunezVGAE10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OngHVSJLSWROOZSLLYCYTS10,
author = {Yue Ying Ong and
Soon Wee Ho and
Kripesh Vaidyanathan and
Vasarla Nagendra Sekhar and
Ming Chinq Jong and
Samuel Lim Yak Long and
Vincent Lee Wen Sheng and
Leong Ching Wai and
Vempati Srinivasa Rao and
Jimmy Ong and
Xuefen Ong and
Xiaowu Zhang and
Yoon Uk Seung and
John H. Lau and
Yeow Kheng Lim and
David Yeo and
Kai Chong Chan and
Yanfeng Zhang and
Juan Boon Tan and
Dong Kyun Sohn},
title = {Design, assembly and reliability of large die and fine-pitch Cu/low-k
flip chip package},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {986--994},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.010},
doi = {10.1016/J.MICROREL.2010.03.010},
timestamp = {Wed, 27 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OngHVSJLSWROOZSLLYCYTS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OrioCS10,
author = {R. L. de Orio and
Hajdin Ceric and
Siegfried Selberherr},
title = {Physically based models of electromigration: From Black's equation
to modern {TCAD} models},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {775--789},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.007},
doi = {10.1016/J.MICROREL.2010.01.007},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/OrioCS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ortiz-CondeGLH10,
author = {Adelmo Ortiz{-}Conde and
Francisco J. Garc{\'{\i}}a{-}S{\'{a}}nchez and
Juin J. Liou and
Ching{-}Sung Ho},
title = {Integration-based approach to evaluate the sub-threshold slope of
MOSFETs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {312--315},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.001},
doi = {10.1016/J.MICROREL.2009.11.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ortiz-CondeGLH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PadovaniNASCCGG10,
author = {Sara Padovani and
A. Del Negro and
M. Antonipieri and
S. Sinesi and
Roberta Campesato and
Mariacristina Casale and
Giuseppe Gabetta and
Gabriele Gori},
title = {Triple junction InGaP/InGaAs/Ge solar cells for high concentration
photovoltaics application: Degradation tests of solar receivers},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1894--1898},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.087},
doi = {10.1016/J.MICROREL.2010.07.087},
timestamp = {Wed, 24 Aug 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PadovaniNASCCGG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PazirandehWT10,
author = {Reza Pazirandeh and
Joachim W{\"{u}}rfl and
G{\"{u}}nther Tr{\"{a}}nkle},
title = {Determination of GaN {HEMT} reliability by monitoring I\({}_{\mbox{DSS}}\)},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {763--766},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.017},
doi = {10.1016/J.MICROREL.2010.02.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PazirandehWT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PechtJ10,
author = {Michael G. Pecht and
Rubyca Jaai},
title = {A prognostics and health management roadmap for information and electronics-rich
systems},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {317--323},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.006},
doi = {10.1016/J.MICROREL.2010.01.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PechtJ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PekkanenKMKNM10,
author = {Ville Pekkanen and
Kimmo Kaija and
Matti M{\"{a}}ntysalo and
Esa Kunnari and
Juha Niittynen and
Pauliina Mansikkam{\"{a}}ki},
title = {Functional fluid jetting performance optimization},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {864--871},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.002},
doi = {10.1016/J.MICROREL.2010.02.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PekkanenKMKNM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PerduDDN10,
author = {Philippe Perdu and
Jerome Di{-}Battista and
Sylvain Dudit and
Tomonori Nakamura},
title = {{VLSI} functional analysis by dynamic emission microscopy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1431--1435},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.077},
doi = {10.1016/J.MICROREL.2010.07.077},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PerduDDN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PodgaynayaREPGSS10,
author = {A. Podgaynaya and
Ralf Rudolf and
B. Elattari and
Dionyz Pogany and
Erich Gornik and
Matthias Stecher and
Marc Strasser},
title = {Single pulse energy capability and failure modes of n- and p-channel
{LDMOS} with thick copper metallization},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1347--1351},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.075},
doi = {10.1016/J.MICROREL.2010.07.075},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PodgaynayaREPGSS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PoklonskiGSFLSWM10,
author = {N. A. Poklonski and
N. I. Gorbachuk and
S. V. Shpakovski and
V. A. Filipenia and
S. B. Lastovskii and
V. A. Skuratov and
Andreas D. Wieck and
V. P. Markevich},
title = {Impedance and barrier capacitance of silicon diodes implanted with
high-energy Xe ions},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {813--820},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.007},
doi = {10.1016/J.MICROREL.2010.02.007},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PoklonskiGSFLSWM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Postel-PellerinLMLRB10,
author = {J{\'{e}}r{\'{e}}my Postel{-}Pellerin and
Romain Laffont and
Gilles Micolau and
Fr{\'{e}}d{\'{e}}ric Lalande and
Arnaud R{\'{e}}gnier and
Bernard Bouteille},
title = {Leakage paths identification in {NVM} using biased data retention},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1474--1478},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.074},
doi = {10.1016/J.MICROREL.2010.07.074},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Postel-PellerinLMLRB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PozoCOLU10,
author = {Jose Maria Garcia del Pozo and
Santiago Celma and
Ar{\'{a}}nzazu Ot{\'{\i}}n and
I. Lope and
J. Urdangar{\'{\i}}n},
title = {1.8 {V-3} GHz {CMOS} limiting amplifier with efficient frequency compensation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2084--2089},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.006},
doi = {10.1016/J.MICROREL.2010.07.006},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PozoCOLU10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/QianSZS10,
author = {Qinsong Qian and
Weifeng Sun and
Jing Zhu and
Longxing Shi},
title = {Investigation of the shift of hot spot in lateral diffused {LDMOS}
under {ESD} conditions},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1935--1941},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.010},
doi = {10.1016/J.MICROREL.2010.05.010},
timestamp = {Tue, 12 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/QianSZS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RahamanM10,
author = {Sk. Ziaur Rahaman and
Siddheswar Maikap},
title = {Low power resistive switching memory using Cu metallic filament in
Ge\({}_{\mbox{0.2}}\)Se\({}_{\mbox{0.8}}\) solid-electrolyte},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {643--646},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.022},
doi = {10.1016/J.MICROREL.2010.01.022},
timestamp = {Fri, 11 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RahamanM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaoB10,
author = {Hemant Rao and
Gijs Bosman},
title = {Device reliability study of AlGaN/GaN high electron mobility transistors
under high gate and channel electric fields via low frequency noise
spectroscopy},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1528--1531},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.073},
doi = {10.1016/J.MICROREL.2010.07.073},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaoB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaoI10,
author = {Rosario Rao and
Fernanda Irrera},
title = {Threshold voltage instability in high-k based flash memories},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1273--1277},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.043},
doi = {10.1016/J.MICROREL.2010.07.043},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RaoI10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RathodSD10,
author = {Surendra S. Rathod and
Ashok K. Saxena and
Sudeb Dasgupta},
title = {A proposed DG-FinFET based {SRAM} cell design with RadHard capabilities},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1181--1188},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.020},
doi = {10.1016/J.MICROREL.2010.04.020},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RathodSD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RavipatiKSCK10,
author = {Srikanth Ravipati and
Chang{-}Jung Kuo and
Jiann Shieh and
Cheng{-}Tung Chou and
Fu{-}Hsiang Ko},
title = {Fabrication and enhanced field emission properties of novel silicon
nanostructures},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1973--1976},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.005},
doi = {10.1016/J.MICROREL.2010.06.005},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RavipatiKSCK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RaySDMD10,
author = {Samit Kumar Ray and
Rajkumar Singha and
Samaresh Das and
Santanu Manna and
Achintya Dhar},
title = {Ge based nanostructures for electronic and photonic devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {674--678},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.049},
doi = {10.1016/J.MICROREL.2010.01.049},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RaySDMD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RiccioRINBSTM10,
author = {Michele Riccio and
Lucio Rossi and
Andrea Irace and
Ettore Napoli and
Giovanni Breglio and
Paolo Spirito and
Ryuzo Tagami and
Yoshihito Mizuno},
title = {Analysis of large area Trench-IGBT current distribution under {UIS}
test with the aid of lock-in thermography},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1725--1730},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.072},
doi = {10.1016/J.MICROREL.2010.07.072},
timestamp = {Fri, 01 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RiccioRINBSTM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RohaniZ10,
author = {Alireza Rohani and
Hamid R. Zarandi},
title = {Two effective methods to mitigate soft error effects in SRAM-based
FPGAs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1171--1180},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.021},
doi = {10.1016/J.MICROREL.2010.04.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RohaniZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RonsisvalleE10,
author = {Cesare Ronsisvalle and
Vincenzo Enea},
title = {Improvement of high-voltage junction termination extension {(JTE)}
by an optimized profile of lateral doping {(VLD)}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1773--1777},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.078},
doi = {10.1016/J.MICROREL.2010.07.078},
timestamp = {Tue, 26 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RonsisvalleE10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RossiRNIBS10,
author = {Lucio Rossi and
Michele Riccio and
Ettore Napoli and
Andrea Irace and
Giovanni Breglio and
Paolo Spirito},
title = {A novel {UIS} test system with Crowbar feedback for reduced failure
energy in power devices testing},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1479--1483},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.080},
doi = {10.1016/J.MICROREL.2010.07.080},
timestamp = {Fri, 01 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/RossiRNIBS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SabatUM10,
author = {Samrat L. Sabat and
Siba K. Udgata and
K. P. N. Murthy},
title = {Small signal parameter extraction of {MESFET} using quantum particle
swarm optimization},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {199--206},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.005},
doi = {10.1016/J.MICROREL.2009.10.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SabatUM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SamantaZC10,
author = {Piyas Samanta and
Chunxiang Zhu and
Mansun Chan},
title = {Comparison of electrical stress-induced charge carrier generation/trapping
and related degradation of SiO\({}_{\mbox{2}}\) and HfO\({}_{\mbox{2}}\)/SiO\({}_{\mbox{2}}\)
gate dielectric stacks},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1907--1914},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.005},
doi = {10.1016/J.MICROREL.2010.07.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SamantaZC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SangameswaranCGW10,
author = {Sandeep Sangameswaran and
Jeroen De Coster and
Guido Groeseneken and
Ingrid De Wolf},
title = {Impact of design factors and environment on the {ESD} sensitivity
of {MEMS} micromirrors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1383--1387},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.079},
doi = {10.1016/J.MICROREL.2010.07.079},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SangameswaranCGW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SantosMNN10,
author = {G. G. dos Santos and
Elaine Crespo Marques and
Lirida A. B. Naviner and
Jean{-}Fran{\c{c}}ois Naviner},
title = {Using error tolerance of target application for efficient reliability
improvement of digital circuits},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1219--1222},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.147},
doi = {10.1016/J.MICROREL.2010.07.147},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SantosMNN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SasakiCMF10,
author = {Yuji Sasaki and
Mauro Ciappa and
Takayuki Masunaga and
Wolfgang Fichtner},
title = {Accurate extraction of the mechanical properties of thin films by
nanoindentation for the design of reliable {MEMS}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1621--1625},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.119},
doi = {10.1016/J.MICROREL.2010.07.119},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SasakiCMF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SassoCR10,
author = {Grazia Sasso and
Maurizio Costagliola and
Niccol{\`{o}} Rinaldi},
title = {Avalanche multiplication and pinch-in models for simulating electrical
instability effects in SiGe HBTs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1577--1580},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.081},
doi = {10.1016/J.MICROREL.2010.07.081},
timestamp = {Mon, 12 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SassoCR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SauterSSKY10,
author = {L. Sauter and
A. Seekamp and
Y. Shibata and
Y. Kanameda and
H. Yamashita},
title = {Whisker mitigation measures for Sn-plated Cu for different stress
tests},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1631--1635},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.083},
doi = {10.1016/J.MICROREL.2010.07.083},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SauterSSKY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SauterW10,
author = {Martin Sauter and
Joost A. Willemen},
title = {Simulation and modelling of {VDMOSFET} self protection under TLP-stress},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {183--189},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.007},
doi = {10.1016/J.MICROREL.2009.10.007},
timestamp = {Fri, 16 Sep 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SauterW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScheuermannS10,
author = {Uwe Scheuermann and
Stefan Schuler},
title = {Power cycling results for different control strategies},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1203--1209},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.135},
doi = {10.1016/J.MICROREL.2010.07.135},
timestamp = {Tue, 18 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ScheuermannS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SchlangenDLSAYAL10,
author = {Rudolf Schlangen and
Herv{\'{e}} Deslandes and
Ted R. Lundquist and
C. Schmidt and
Frank Altmann and
K. Yu and
A. Andreasyan and
S. Li},
title = {Dynamic lock-in thermography for operation mode-dependent thermally
active fault localization},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1454--1458},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.082},
doi = {10.1016/J.MICROREL.2010.07.082},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/SchlangenDLSAYAL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ScholzGKLB10,
author = {Philipp Scholz and
Christian Gallrapp and
Uwe Kerst and
Ted R. Lundquist and
Christian Boit},
title = {Optimizing focused ion beam created solid immersion lenses in bulk
silicon using design of experiments},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1441--1445},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.031},
doi = {10.1016/J.MICROREL.2010.07.031},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ScholzGKLB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SenguptaSZ10,
author = {Anirban Sengupta and
Reza Sedaghat and
Zhipeng Zeng},
title = {A high level synthesis design flow with a novel approach for efficient
design space exploration in case of multi-parametric optimization
objective},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {424--437},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.015},
doi = {10.1016/J.MICROREL.2009.11.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SenguptaSZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SeoSKCKS10,
author = {J. Y. Seo and
J. E. Seok and
W. S. Kim and
N. H. Cha and
J. S. Kang and
B. S. So},
title = {{PMOSFET} anti-fuse using GIDL-induced-HEIP mechanism},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1309--1311},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.053},
doi = {10.1016/J.MICROREL.2010.07.053},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SeoSKCKS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShazliT10,
author = {Syed Zafar Shazli and
Mehdi Baradaran Tahoori},
title = {Using Boolean satisfiability for computing soft error rates in early
design stages},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {149--159},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.08.006},
doi = {10.1016/J.MICROREL.2009.08.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShazliT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShenA10,
author = {Yu{-}Lin Shen and
K. Aluru},
title = {Numerical study of ductile failure morphology in solder joints under
fast loading conditions},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2059--2070},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.001},
doi = {10.1016/J.MICROREL.2010.06.001},
timestamp = {Fri, 17 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ShenA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShenCCL10,
author = {Li{-}Cheng Shen and
Chien{-}Wei Chien and
Hsien{-}Chie Cheng and
Chia{-}Te Lin},
title = {Development of three-dimensional chip stacking technology using a
clamped through-silicon via interconnection},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {489--497},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.012},
doi = {10.1016/J.MICROREL.2009.10.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShenCCL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ShiYLXLGL10,
author = {Yaowu Shi and
Yanfu Yan and
Jianping Liu and
Zhidong Xia and
Yongping Lei and
Fu Guo and
Xiaoyan Li},
title = {Constitutive modeling on creep deformation for a SnPb-based composite
solder reinforced with microsized Cu particles},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2020--2025},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.008},
doi = {10.1016/J.MICROREL.2010.07.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ShiYLXLGL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SilvaRR10,
author = {Digeorgia N. da Silva and
Andr{\'{e}} In{\'{a}}cio Reis and
Renato P. Ribas},
title = {Gate delay variability estimation method for parametric yield improvement
in nanometer {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1223--1229},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.071},
doi = {10.1016/J.MICROREL.2010.07.071},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SilvaRR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SmithCZM10,
author = {David J. Smith and
David A. Cullen and
Lin Zhou and
Martha R. McCartney},
title = {Applications of {TEM} imaging, analysis and electron holography to
III-nitride {HEMT} devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1514--1519},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.155},
doi = {10.1016/J.MICROREL.2010.07.155},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SmithCZM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SongHDMLMZ10,
author = {Bo Song and
Yan Han and
Shurong Dong and
Fei Ma and
Mingliang Li and
Meng Miao and
Kehan Zhu},
title = {Compact MOS-triggered {SCR} with faster turn-on speed for {ESD} protection},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1393--1397},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.112},
doi = {10.1016/J.MICROREL.2010.07.112},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SongHDMLMZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StathisWZ10,
author = {James H. Stathis and
M. Wang and
K. Zhao},
title = {Reliability of advanced high-k/metal-gate n-FET devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1199--1202},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.017},
doi = {10.1016/J.MICROREL.2010.07.017},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StathisWZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojadinovicDMPDDGP10,
author = {Ninoslav Stojadinovic and
Danijel Dankovic and
Ivica Manic and
Aneta Prijic and
Vojkan Davidovic and
Snezana Djoric{-}Veljkovic and
Snezana Golubovic and
Zoran Prijic},
title = {Threshold voltage instabilities in p-channel power VDMOSFETs under
pulsed {NBT} stress},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1278--1282},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.122},
doi = {10.1016/J.MICROREL.2010.07.122},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojadinovicDMPDDGP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StojcevMMN10,
author = {Mile K. Stojcev and
Igor Z. Milovanovic and
Emina I. Milovanovic and
Tatjana R. Nikolic},
title = {Address generators for linear systolic array},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {292--303},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.005},
doi = {10.1016/J.MICROREL.2009.11.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StojcevMMN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuTTT10,
author = {Y. A. Su and
Long Bin Tan and
T. Y. Tee and
Vincent B. C. Tan},
title = {Rate-dependent properties of Sn-Ag-Cu based lead-free solder joints
for {WLCSP}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {564--576},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.043},
doi = {10.1016/J.MICROREL.2010.01.043},
timestamp = {Mon, 26 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuTTT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SuzukiKK10,
author = {Masamichi Suzuki and
Masato Koyama and
Atsuhiro Kinoshita},
title = {Detailed investigation of the effects of La and Al content on the
electrical characteristics and reliability properties of La-Al-O gate
dielectrics},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1920--1923},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.06.009},
doi = {10.1016/J.MICROREL.2010.06.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SuzukiKK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SyedTNAKR10,
author = {Ahmer Syed and
Tong Yan Tee and
Hun Shen Ng and
Rex Anderson and
Choong Peng Khoo and
Boyd Rogers},
title = {Advanced analysis on board trace reliability of {WLCSP} under drop
impact},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {928--936},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.027},
doi = {10.1016/J.MICROREL.2010.02.027},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SyedTNAKR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/SzePSLMGTKG10,
author = {Theresa Sze and
Darko Popovic and
Jing Shi and
Yi{-}Shao Lai and
James G. Mitchell and
Bruce Guenin and
Tsung{-}Yueh Tsai and
Chin{-}Li Kao and
Matthew Giere},
title = {Early experience with in situ chip-to-chip alignment characterization
of Proximity Communication flip-chip package},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {498--506},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.003},
doi = {10.1016/J.MICROREL.2010.02.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/SzePSLMGTKG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TakahashiKNT10,
author = {Toshihide Takahashi and
Shuichi Komatsu and
Hiroshi Nishikawa and
Tadashi Takemoto},
title = {Thin film joining for high-temperature performance of power semi-conductor
devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {220--227},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.001},
doi = {10.1016/J.MICROREL.2009.10.001},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TakahashiKNT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamWKW10,
author = {Wing{-}Shan Tam and
Oi{-}Ying Wong and
Chi{-}Wah Kok and
Hei Wong},
title = {Generating sub-1V reference voltages from a resistorless {CMOS} bandgap
reference circuit by using a piecewise curvature temperature compensation
technique},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1054--1061},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.012},
doi = {10.1016/J.MICROREL.2010.04.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TamWKW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TamWNKW10,
author = {Wing{-}Shan Tam and
Oi{-}Ying Wong and
Tsz{-}Ching Ng and
Chi{-}Wah Kok and
Hei Wong},
title = {Analysis of {ESD} discharge current distribution and area optimization
of {VDMOS} gate protection structure},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {622--626},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.047},
doi = {10.1016/J.MICROREL.2010.01.047},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TamWNKW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanCT10,
author = {Cher Ming Tan and
Boon Khai Eric Chen and
Kok Peng Toh},
title = {Humidity study of a-Si {PV} cell},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1871--1874},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.021},
doi = {10.1016/J.MICROREL.2010.07.021},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TanCT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanTN10,
author = {Yung Chuen Tan and
Cher Ming Tan and
T. C. Ng},
title = {Addressing the challenges in solder resistance measurement for electromigration
test},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1352--1354},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.051},
doi = {10.1016/J.MICROREL.2010.07.051},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TanTN10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TanTZCY10,
author = {Yung Chuen Tan and
Cher Ming Tan and
Xiaowu Zhang and
Tai Chong Chai and
D. Q. Yu},
title = {Electromigration performance of Through Silicon Via {(TSV)} - {A}
modeling approach},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1336--1340},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.024},
doi = {10.1016/J.MICROREL.2010.07.024},
timestamp = {Tue, 04 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TanTZCY10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TazzoliBMRM10,
author = {Augusto Tazzoli and
Marco Barbato and
F. Mattiuzzo and
V. Ritrovato and
Gaudenzio Meneghesso},
title = {Study of the actuation speed, bounces occurrences, and contact reliability
of ohmic {RF-MEMS} switches},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1604--1608},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.034},
doi = {10.1016/J.MICROREL.2010.07.034},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TazzoliBMRM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TazzoliCCBM10,
author = {Augusto Tazzoli and
Martina Cordoni and
Paolo Colombo and
C. Bergonzoni and
Gaudenzio Meneghesso},
title = {Time-To-Latch-Up investigation of {SCR} devices as {ESD} protection
structures on 65 nm technology platform},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1373--1378},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.028},
doi = {10.1016/J.MICROREL.2010.07.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TazzoliCCBM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TeeFL10,
author = {Tong Yan Tee and
Xuejun Fan and
Yi{-}Shao Lai},
title = {Advances in Wafer Level Packaging {(WLP)}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {479--480},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.012},
doi = {10.1016/J.MICROREL.2010.02.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TeeFL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TestaCPPRPPL10,
author = {Antonio Testa and
Salvatore De Caro and
Saverio Panarello and
Salvatore Patan{\`{e}} and
Sebastiano Russo and
D. Patti and
S. Poma and
Romeo Letor},
title = {Reliability of planar, Super-Junction and trench low voltage power
MOSFETs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1789--1795},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.042},
doi = {10.1016/J.MICROREL.2010.07.042},
timestamp = {Fri, 30 Oct 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TestaCPPRPPL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TounsiOTGBA10,
author = {M. Tounsi and
Amrane Oukaour and
Boubekeur Tala{-}Ighil and
Hamid Gualous and
Bertrand Boudart and
Djamil A{\"{\i}}ssani},
title = {Characterization of high-voltage {IGBT} module degradations under
{PWM} power cycling test at high ambient temperature},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1810--1814},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.059},
doi = {10.1016/J.MICROREL.2010.07.059},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TounsiOTGBA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiCLCHHL10,
author = {Tsung{-}Han Tsai and
Huey{-}Ing Chen and
Kun{-}Wei Lin and
Tai{-}You Chen and
Chien{-}Chang Huang and
Kai{-}Siang Hsu and
Wen{-}Chau Liu},
title = {A hydrogen sensor based on a metamorphic high electron mobility transistor
{(MHEMT)}},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {734--737},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.009},
doi = {10.1016/J.MICROREL.2010.01.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsaiCLCHHL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiK10,
author = {Hui{-}Wen Tsai and
Ming{-}Dou Ker},
title = {Design of 2xVDD-tolerant mixed-voltage {I/O} buffer against gate-oxide
reliability and hot-carrier degradation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {48--56},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.004},
doi = {10.1016/J.MICROREL.2009.09.004},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsaiK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsaiLJHC10,
author = {Tzu{-}I Tsai and
Horng{-}Chih Lin and
Min{-}Feng Jian and
Tiao{-}Yuan Huang and
Tien{-}Sheng Chao},
title = {A simple method for sub-100 nm pattern generation with I-line double-patterning
technique},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {584--588},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.019},
doi = {10.1016/J.MICROREL.2010.01.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsaiLJHC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsengLHLCCL10,
author = {H. W. Tseng and
C. T. Lu and
Y. H. Hsiao and
P. L. Liao and
Y. C. Chuang and
T. Y. Chung and
Cheng{-}Yi Liu},
title = {Electromigration-induced failures at Cu/Sn/Cu flip-chip joint interfaces},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1159--1162},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.002},
doi = {10.1016/J.MICROREL.2010.05.002},
timestamp = {Fri, 20 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TsengLHLCCL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TsuiWCC10,
author = {Bing{-}Yue Tsui and
Pei{-}Yu Wang and
Ting{-}Yeh Chen and
Jung{-}Chien Cheng},
title = {Multi-gate non-volatile memories with nanowires as charge storage
material},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {603--606},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.040},
doi = {10.1016/J.MICROREL.2010.01.040},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TsuiWCC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TungaS10,
author = {Krishna Tunga and
Suresh K. Sitaraman},
title = {Laser moir{\'{e}} interferometry for fatigue life prediction
of lead-free solders},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2026--2036},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.005},
doi = {10.1016/J.MICROREL.2010.05.005},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/TungaS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/TyaginovSTCJCPEKKSMCG10,
author = {Stanislav Tyaginov and
Ivan A. Starkov and
Oliver Triebl and
Johann Cervenka and
C. Jungemann and
Sara Carniello and
Jong Mun Park and
Hubert Enichlmair and
Markus Karner and
Ch. Kernstock and
Ehrenfried Seebacher and
Rainer Minixhofer and
Hajdin Ceric and
Tibor Grasser},
title = {Interface traps density-of-states as a vital component for hot-carrier
degradation modeling},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1267--1272},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.030},
doi = {10.1016/J.MICROREL.2010.07.030},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/TyaginovSTCJCPEKKSMCG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Ubachs10,
author = {R. L. J. M. Ubachs},
title = {Electromigration in {WLCSP} solder bumps},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1678--1683},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.069},
doi = {10.1016/J.MICROREL.2010.07.069},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Ubachs10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Vanzi10,
author = {Massimo Vanzi},
title = {Editorial},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {455},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.008},
doi = {10.1016/J.MICROREL.2010.02.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Vanzi10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VazquezNNB10,
author = {Manuel V{\'{a}}zquez and
Neftal{\'{\i}} N{\'{u}}{\~{n}}ez and
Eduardo Nogueira and
A. Borreguero},
title = {Degradation of AlInGaP red LEDs under drive current and temperature
accelerated life tests},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1559--1562},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.057},
doi = {10.1016/J.MICROREL.2010.07.057},
timestamp = {Sat, 05 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VazquezNNB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VeyrieGSLB10,
author = {David Veyri{\'{e}} and
Olivier Gilard and
Kevin Sanchez and
S{\'{e}}bastien Lhuillier and
Fr{\'{e}}d{\'{e}}ric Bourcier},
title = {New methodology for the assessment of the thermal resistance of laser
diodes and light emitting diodes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {4},
pages = {456--461},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.002},
doi = {10.1016/J.MICROREL.2009.11.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VeyrieGSLB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VirkkiKF10,
author = {Johanna Virkki and
A. Koskenkorva and
Laura Frisk},
title = {Development of a matrix test board for capacitor reliability testing},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1711--1714},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.023},
doi = {10.1016/J.MICROREL.2010.07.023},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VirkkiKF10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VirkkiSFH10,
author = {Johanna Virkki and
Tomi Sepp{\"{a}}l{\"{a}} and
Laura Frisk and
Pekka Heino},
title = {Accelerated testing for failures of tantalum capacitors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {217--219},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.11.006},
doi = {10.1016/J.MICROREL.2009.11.006},
timestamp = {Wed, 20 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VirkkiSFH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VirkkiSR10,
author = {Johanna Virkki and
Tomi Sepp{\"{a}}l{\"{a}} and
Pasi Raumonen},
title = {Testing the effects of reflow on tantalum capacitors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1650--1653},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.055},
doi = {10.1016/J.MICROREL.2010.07.055},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VirkkiSR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VirkkiT10,
author = {Johanna Virkki and
Sampo Tuukkanen},
title = {Testing the effects of temperature cycling on tantalum capacitors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1121--1124},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.013},
doi = {10.1016/J.MICROREL.2010.04.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VirkkiT10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VitobelloB10,
author = {F. Vitobello and
A. R. Barnes},
title = {Preliminary, space focused, reliability tests on European GaN HEMTs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1581--1586},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.026},
doi = {10.1016/J.MICROREL.2010.07.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VitobelloB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VobeckyZK10,
author = {J. Vobeck{\'{y}} and
V. Z{\'{a}}hlava and
V. Komarnitskyy},
title = {Doping compensation for increased robustness of fast recovery silicon
diodes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {32--38},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.014},
doi = {10.1016/J.MICROREL.2009.09.014},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VobeckyZK10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VreugdJEB10,
author = {Jan de Vreugd and
Kaspar M. B. Jansen and
Leo J. Ernst and
C. Bohm},
title = {Prediction of cure induced warpage of micro-electronic products},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {910--916},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.028},
doi = {10.1016/J.MICROREL.2010.02.028},
timestamp = {Thu, 09 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/VreugdJEB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/VriesBD10,
author = {J. de Vries and
W. Balemans and
W. D. van Driel},
title = {Predictive modeling of board level shock-impact reliability of the
HVQFN-family},
journal = {Microelectron. Reliab.},
volume = {50},
number = {2},
pages = {228--234},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.10.015},
doi = {10.1016/J.MICROREL.2009.10.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/VriesBD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WadaYNAO10,
author = {K. Wada and
Yuji Yagi and
I. Nakagawa and
T. Atsumi and
Nobutada Ohno},
title = {Analysis of thermal expansion in elastic and elastoplastic layers
subjected to cyclic thermal loading},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1626--1630},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.012},
doi = {10.1016/J.MICROREL.2010.07.012},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WadaYNAO10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangCLLA10,
author = {Jer{-}Chyi Wang and
Pai{-}Chi Chou and
Chao{-}Sung Lai and
Wen{-}Hui Lee and
Chi{-}Fong Ai},
title = {Characteristics optimization of N\({}_{\mbox{2}}\)O annealing on tungsten
nanocrystal with W/Si dual-sputtered method for nonvolatile memory
application},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {639--642},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.027},
doi = {10.1016/J.MICROREL.2010.01.027},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangCLLA10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangKWC10,
author = {Bo{-}Chin Wang and
Ting{-}Kuo Kang and
San{-}Lein Wu and
Shoou{-}Jinn Chang},
title = {Tensile CESL-induced strain dependence on impact ionization efficiency
in nMOSFETs},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {610--613},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.028},
doi = {10.1016/J.MICROREL.2010.01.028},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangKWC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangLHHCYL10,
author = {Mu{-}Chun Wang and
Chuan{-}Hsi Liu and
Kuo{-}Shu Huang and
Zhen{-}Ying Hsieh and
Shuang{-}Yuan Chen and
Hsin{-}Chia Yang and
Chii{-}Ruey Lin},
title = {Promoting of charged-device model/electrostatic discharge immunity
in the dicing saw process},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {839--846},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.018},
doi = {10.1016/J.MICROREL.2010.02.018},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangLHHCYL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangWHPXWFW10,
author = {Jian Wang and
Wenhua Wang and
Ru Huang and
Yunpeng Pei and
Shoubin Xue and
Xin'an Wang and
Chunhui Fan and
Yangyuan Wang},
title = {Deteriorated radiation effects impact on the characteristics of {MOS}
transistors with multi-finger configuration},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1094--1097},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.008},
doi = {10.1016/J.MICROREL.2010.04.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WangWHPXWFW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WangXZ10,
author = {H. Y. Wang and
X. M. Xiong and
Jin{-}Xiu Zhang},
title = {Moisture effect on the dielectric and structure of BaTiO\({}_{\mbox{3}}\)-based
devices},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {887--890},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.004},
doi = {10.1016/J.MICROREL.2010.01.004},
timestamp = {Wed, 20 Jul 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WangXZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WeiLYCW10,
author = {Chen Wei and
Yong Chang Liu and
Li Ming Yu and
Hao Chen and
Xun Wang},
title = {Effects of Al on the failure mechanism of the Sn-Ag-Zn eutectic solder},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1142--1145},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.023},
doi = {10.1016/J.MICROREL.2010.04.023},
timestamp = {Wed, 26 May 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WeiLYCW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Weng10,
author = {Chun{-}Jen Weng},
title = {Feasible approach for processes integration of {CMOS} transistor gate/side-wall
spacer patterning fabrication},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1951--1960},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.010},
doi = {10.1016/J.MICROREL.2010.07.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Weng10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WongTLSCKW10,
author = {Oi{-}Ying Wong and
Wing{-}Shan Tam and
Jun Liu and
Oi{-}Kan Shea and
Shiu Hung Cheung and
Chi{-}Wah Kok and
Hei Wong},
title = {Modeling of high-frequency characteristics for epoxy-sealed micro
vacuum capacitors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {627--630},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.013},
doi = {10.1016/J.MICROREL.2010.01.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WongTLSCKW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WoodGPC10,
author = {G. S. Wood and
I. Gual and
P. Parmiter and
Rebecca Cheung},
title = {Temperature stability of electro-thermally and piezoelectrically actuated
silicon carbide {MEMS} resonators},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {1977--1983},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.011},
doi = {10.1016/J.MICROREL.2010.05.011},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WoodGPC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wu10,
author = {Mei{-}Ling Wu},
title = {Design of experiments to investigate reliability for solder joints
{PBGA} package under high cycle fatigue},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {127--139},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.007},
doi = {10.1016/J.MICROREL.2009.09.007},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/Wu10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuB10,
author = {Mei{-}Ling Wu and
Donald Barker},
title = {Rapid assessment of {BGA} life under vibration and bending, and influence
of input parameter uncertainties},
journal = {Microelectron. Reliab.},
volume = {50},
number = {1},
pages = {140--148},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.09.006},
doi = {10.1016/J.MICROREL.2009.09.006},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WuB10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuLYCTC10,
author = {Chun{-}Yu Wu and
Ta{-}Chuan Liao and
Ming{-}H Yu and
Sheng{-}Kai Chen and
Chung{-}Min Tsai and
Huang{-}Chung Cheng},
title = {Field enhancement of omega-shaped-gated poly-Si {TFT} {SONOS} memory
fabricated by a simple sidewall spacer formation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {704--708},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.016},
doi = {10.1016/J.MICROREL.2010.01.016},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/WuLYCTC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WuQLSS10,
author = {Hong Wu and
Qinsong Qian and
Siyang Liu and
Weifeng Sun and
Longxing Shi},
title = {Devices' optimization against hot-carrier degradation in high voltage
pLEDMOS transistor},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1071--1076},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.009},
doi = {10.1016/J.MICROREL.2010.04.009},
timestamp = {Tue, 27 Jun 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WuQLSS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/WunderleDHBWSRFMR10,
author = {Bernhard Wunderle and
E. Dermitzaki and
O. H{\"{o}}lck and
J{\"{o}}rg Bauer and
Hans Walter and
Q. Shaik and
K. R{\"{a}}tzke and
Franz Faupel and
Bernd Michel and
Herbert Reichl},
title = {Molecular dynamics approach to structure-property correlation in epoxy
resins for thermo-mechanical lifetime modeling},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {900--909},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.024},
doi = {10.1016/J.MICROREL.2010.02.024},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/WunderleDHBWSRFMR10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Wymyslowski10,
author = {Artur Wymyslowski},
title = {Guest Editorial: 2009 EuroSimE international conference on thermal,
mechanical and multi-physics simulation and experiments in micro-electronics
and micro-systems},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {891--892},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.013},
doi = {10.1016/J.MICROREL.2010.03.013},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Wymyslowski10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/XuXL10,
author = {Jing{-}Ping Xu and
X. Xiao and
Pui{-}To Lai},
title = {A carrier-mobility model for high-k gate-dielectric Ge MOSFETs with
metal gate electrode},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1081--1086},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.016},
doi = {10.1016/J.MICROREL.2010.04.016},
timestamp = {Mon, 02 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/XuXL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangC10,
author = {Taho Yang and
Yuan{-}Ting Cheng},
title = {The use of Mahalanobis-Taguchi System to improve flip-chip bumping
height inspection efficiency},
journal = {Microelectron. Reliab.},
volume = {50},
number = {3},
pages = {407--414},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2009.12.001},
doi = {10.1016/J.MICROREL.2009.12.001},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangKPHD10,
author = {Dao{-}Guo Yang and
Martien Kengen and
W. G. M. Peels and
David Heyes and
W. D. van Driel},
title = {Reliability modeling on a {MOSFET} power package based on embedded
die technology},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {923--927},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.026},
doi = {10.1016/J.MICROREL.2010.02.026},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangKPHD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangLLZROTVW10,
author = {Y. Yang and
Riet Labie and
F. Ling and
C. Zhao and
A. Radisic and
Jan Van Olmen and
Youssef Travaly and
Bert Verlinden and
Ingrid De Wolf},
title = {Processing assessment and adhesion evaluation of copper through-silicon
vias (TSVs) for three-dimensional stacked-integrated circuit {(3D-SIC)}
architectures},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1636--1640},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.019},
doi = {10.1016/J.MICROREL.2010.07.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangLLZROTVW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangLWHCCLC10,
author = {Shih{-}Chun Yang and
Pang Lin and
Chien{-}Ping Wang and
Sheng Bang Huang and
Chiu{-}Ling Chen and
Pei{-}Fang Chiang and
An{-}Tse Lee and
Mu{-}Tao Chu},
title = {Failure and degradation mechanisms of high-power white light emitting
diodes},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {959--964},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.007},
doi = {10.1016/J.MICROREL.2010.03.007},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangLWHCCLC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangSYL10,
author = {Hung{-}Pin D. Yang and
Chih{-}Tsung Shih and
Su{-}Mei Yang and
Tsin{-}Dong Lee},
title = {High-power broad-area InGaNAs/GaAs quantum-well lasers in the 1200
nm range},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {722--725},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.010},
doi = {10.1016/J.MICROREL.2010.01.010},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangSYL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YangYLKC10,
author = {Hung{-}Pin D. Yang and
Zao{-}En Yeh and
Gray Lin and
Hao{-}Chung Kuo and
Jim Y. Chi},
title = {InGaAs submonolayer quantum-dot photonic-crystal LEDs for fiber-optic
communications},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {688--691},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.044},
doi = {10.1016/J.MICROREL.2010.01.044},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YangYLKC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/Young10,
author = {Wen{-}Bin Young},
title = {Modeling of a non-Newtonian flow between parallel plates in a flip
chip encapsulation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {995--999},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.008},
doi = {10.1016/J.MICROREL.2010.03.008},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/Young10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YoussefFCPP10,
author = {Hicham Youssef and
Andr{\'{e}} Ferrand and
Pierre{-}Fran{\c{c}}ois Calmon and
Patrick Pons and
Robert Plana},
title = {Methods to improve reliability of bulge test technique to extract
mechanical properties of thin films},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1888--1893},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.013},
doi = {10.1016/J.MICROREL.2010.07.013},
timestamp = {Fri, 18 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YoussefFCPP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuCH10,
author = {Cheng{-}Fu Yu and
Chi{-}Ming Chan and
Ker{-}Chang Hsieh},
title = {The effect of tin grain structure on whisker growth},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1146--1151},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.019},
doi = {10.1016/J.MICROREL.2010.04.019},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuCH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuKPL10,
author = {Da Yu and
Jae B. Kwak and
Seungbae Park and
John Lee},
title = {Dynamic responses of {PCB} under product-level free drop impact},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {1028--1038},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.003},
doi = {10.1016/J.MICROREL.2010.03.003},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuKPL10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanM10,
author = {Jiann{-}Shiun Yuan and
J. Ma},
title = {Voltage stress effect on class {AB} power amplifier and mixed-signal
sample-hold circuit},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {801--806},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.009},
doi = {10.1016/J.MICROREL.2010.02.009},
timestamp = {Tue, 15 Dec 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuanM10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/YuanMYH10,
author = {Jiann{-}Shiun Yuan and
J. Ma and
Wen{-}Kuan Yeh and
Chia{-}Wei Hsu},
title = {Impact of strain on hot electron reliability of dual-band power amplifier
and integrated LNA-mixer {RF} performances},
journal = {Microelectron. Reliab.},
volume = {50},
number = {6},
pages = {807--812},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.02.019},
doi = {10.1016/J.MICROREL.2010.02.019},
timestamp = {Fri, 10 Dec 2021 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/YuanMYH10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZachariasseBFS10,
author = {Frank Zachariasse and
Gerben Boon and
Ga{\"{e}}l Faggion and
Keith Sarault},
title = {Laser modulation mapping on an unmodified laser scanning microscope},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1417--1421},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.054},
doi = {10.1016/J.MICROREL.2010.07.054},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZachariasseBFS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZaghloulKWCPPP10,
author = {Usama Zaghloul and
Matroni Koutsoureli and
H. Wang and
Fabio Coccetti and
George J. Papaioannou and
Patrick Pons and
Robert Plana},
title = {Assessment of dielectric charging in electrostatically driven {MEMS}
devices: {A} comparison of available characterization techniques},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1615--1620},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.027},
doi = {10.1016/J.MICROREL.2010.07.027},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZaghloulKWCPPP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZarbakhshKTBD10,
author = {Javad Zarbakhsh and
Balamurugan Karunamurthy and
Carlos O. Trejo{-}Caballero and
Endre Barti and
Thomas Detzel},
title = {Microscopic stress simulation of non-planar chip technologies},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1666--1671},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.015},
doi = {10.1016/J.MICROREL.2010.07.015},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZarbakhshKTBD10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangLDC10,
author = {Bo Zhang and
Pinkuan Liu and
Han Ding and
Wenwu Cao},
title = {Modeling of board-level package by Finite Element Analysis and laser
interferometer measurements},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {1021--1027},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.03.009},
doi = {10.1016/J.MICROREL.2010.03.009},
timestamp = {Wed, 02 Nov 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangLDC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangW10,
author = {Meng Zhang and
Mingxiang Wang},
title = {An investigation of drain pulse induced hot carrier degradation in
n-type low temperature polycrystalline silicon thin film transistors},
journal = {Microelectron. Reliab.},
volume = {50},
number = {5},
pages = {713--716},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.01.024},
doi = {10.1016/J.MICROREL.2010.01.024},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZhangW10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangXGSYCDJG10,
author = {Liang Zhang and
Songbai Xue and
Li{-}li Gao and
Zhong Sheng and
Sheng{-}lin Yu and
Yan Chen and
Wei Dai and
Feng Ji and
Zeng Guang},
title = {Reliability study of Sn-Ag-Cu-Ce soldered joints in quad flat packages},
journal = {Microelectron. Reliab.},
volume = {50},
number = {12},
pages = {2071--2077},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.05.008},
doi = {10.1016/J.MICROREL.2010.05.008},
timestamp = {Fri, 10 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangXGSYCDJG10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZhangZSLHC10,
author = {Lining Zhang and
Jian Zhang and
Yan Song and
Xinnan Lin and
Jin He and
Mansun Chan},
title = {Charge-based model for symmetric double-gate MOSFETs with inclusion
of channel doping effect},
journal = {Microelectron. Reliab.},
volume = {50},
number = {8},
pages = {1062--1070},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.005},
doi = {10.1016/J.MICROREL.2010.04.005},
timestamp = {Fri, 01 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/ZhangZSLHC10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/ZouFYTZ10,
author = {Xiao Zou and
Guojia Fang and
Longyan Yuan and
Xingsheng Tong and
Xingzhong Zhao},
title = {Improved electrical characteristics and reliability of amorphous InGaZnO
metal-insulator-semiconductor capacitor with high kappa HfO\({}_{\mbox{x}}\)N\({}_{\mbox{y}}\)
gate dielectric},
journal = {Microelectron. Reliab.},
volume = {50},
number = {7},
pages = {954--958},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.04.002},
doi = {10.1016/J.MICROREL.2010.04.002},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/ZouFYTZ10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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