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@inproceedings{DBLP:conf/dft/AcevedoK12,
  author       = {Oscar Acevedo and
                  Dimitri Kagaris},
  title        = {Using the Berlekamp-Massey algorithm to obtain {LFSR} characteristic
                  polynomials for {TPG}},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {233--238},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378229},
  doi          = {10.1109/DFT.2012.6378229},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/AcevedoK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/BawaRT12,
  author       = {Asad Amin Bawa and
                  Muhammad Tauseef Rab and
                  Nur A. Touba},
  title        = {Using partial masking in X-chains to increase output compaction for
                  an X-canceling {MISR}},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {19--24},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378193},
  doi          = {10.1109/DFT.2012.6378193},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BawaRT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/BernardeschiCDS12,
  author       = {Cinzia Bernardeschi and
                  Luca Cassano and
                  Andrea Domenici and
                  Luca Sterpone},
  title        = {Accurate simulation of SEUs in the configuration memory of SRAM-based
                  FPGAs},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {115--120},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378210},
  doi          = {10.1109/DFT.2012.6378210},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BernardeschiCDS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/BolchiniMSOPSMORRSVGBP12,
  author       = {Cristiana Bolchini and
                  Antonio Miele and
                  Chiara Sandionigi and
                  Marco Ottavi and
                  Salvatore Pontarelli and
                  Adelio Salsano and
                  Cecilia Metra and
                  Martin Oma{\~{n}}a and
                  Daniele Rossi and
                  Matteo Sonza Reorda and
                  Luca Sterpone and
                  Massimo Violante and
                  Simone Gerardin and
                  Marta Bagatin and
                  Alessandro Paccagnella},
  title        = {High-reliability fault tolerant digital systems in nanometric technologies:
                  Characterization and design methodologies},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {121--125},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378211},
  doi          = {10.1109/DFT.2012.6378211},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/BolchiniMSOPSMORRSVGBP12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ChapmanTKK12,
  author       = {Glenn H. Chapman and
                  Rohit Thomas and
                  Israel Koren and
                  Zahava Koren},
  title        = {Relating digital imager defect rates to pixel size, sensor area and
                  {ISO}},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {164--169},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378218},
  doi          = {10.1109/DFT.2012.6378218},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ChapmanTKK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ChengG12,
  author       = {Da Cheng and
                  Sandeep K. Gupta},
  title        = {A systematic methodology to improve yield per area of highly-parallel
                  CMPs},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {126--133},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378212},
  doi          = {10.1109/DFT.2012.6378212},
  timestamp    = {Fri, 22 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/ChengG12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/CortezDHS12,
  author       = {Mafalda Cortez and
                  Apurva Dargar and
                  Said Hamdioui and
                  Geert Jan Schrijen},
  title        = {Modeling {SRAM} start-up behavior for Physical Unclonable Functions},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378190},
  doi          = {10.1109/DFT.2012.6378190},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/CortezDHS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/DaRoltDNFRV12,
  author       = {Jean DaRolt and
                  Amitabh Das and
                  Giorgio Di Natale and
                  Marie{-}Lise Flottes and
                  Bruno Rouzeyre and
                  Ingrid Verbauwhede},
  title        = {A scan-based attack on Elliptic Curve Cryptosystems in presence of
                  industrial Design-for-Testability structures},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {43--48},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378197},
  doi          = {10.1109/DFT.2012.6378197},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/DaRoltDNFRV12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/FeitenSSCBPB12,
  author       = {Linus Feiten and
                  Matthias Sauer and
                  Tobias Schubert and
                  Alexander Czutro and
                  Eberhard B{\"{o}}hl and
                  Ilia Polian and
                  Bernd Becker},
  title        = {{\#}SAT-based vulnerability analysis of security components - {A}
                  case study},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {49--54},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378198},
  doi          = {10.1109/DFT.2012.6378198},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/FeitenSSCBPB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/GangadharT12,
  author       = {Sreenivas Gangadhar and
                  Spyros Tragoudas},
  title        = {Accurate calculation of {SET} propagation probability for hardening},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {104--108},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378208},
  doi          = {10.1109/DFT.2012.6378208},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GangadharT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/Geurkov12,
  author       = {Vadim Geurkov},
  title        = {Optimal choice of arithmetic compactors for mixed-signal systems},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {182--186},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378221},
  doi          = {10.1109/DFT.2012.6378221},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/Geurkov12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/GongKLH12,
  author       = {Jianping Gong and
                  Yong{-}Bin Kim and
                  Fabrizio Lombardi and
                  Jie Han},
  title        = {Hardening a memory cell for low power operation by gate leakage reduction},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {73--78},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378203},
  doi          = {10.1109/DFT.2012.6378203},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/GongKLH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/Guinee12,
  author       = {Richard A. Guinee},
  title        = {A novel pseudonoise tester for transmission line fault location and
                  identification using pseudorandom binary sequences},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {225--232},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378228},
  doi          = {10.1109/DFT.2012.6378228},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/Guinee12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/HuangCM12,
  author       = {Ke Huang and
                  John M. Carulli Jr. and
                  Yiorgos Makris},
  title        = {Parametric counterfeit {IC} detection via Support Vector Machines},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {7--12},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378191},
  doi          = {10.1109/DFT.2012.6378191},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/HuangCM12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/KhanHKRC12,
  author       = {Seyab Khan and
                  Said Hamdioui and
                  Halil Kukner and
                  Praveen Raghavan and
                  Francky Catthoor},
  title        = {Incorporating parameter variations in {BTI} impact on nano-scale logical
                  gates analysis},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {158--163},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378217},
  doi          = {10.1109/DFT.2012.6378217},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/KhanHKRC12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/LombardiPAK12,
  author       = {Fabrizio Lombardi and
                  Nohpill Park and
                  Haider A. F. Almurib and
                  T. Nandha Kumar},
  title        = {On the multiple fault detection of a nano crossbar},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {134--139},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378213},
  doi          = {10.1109/DFT.2012.6378213},
  timestamp    = {Mon, 26 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/LombardiPAK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/LuLPO12,
  author       = {Yang Lu and
                  Fabrizio Lombardi and
                  Salvatore Pontarelli and
                  Marco Ottavi},
  title        = {On the design of two single event tolerant slave latches for scan
                  delay testing},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {67--72},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378202},
  doi          = {10.1109/DFT.2012.6378202},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/LuLPO12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/MaghsoudlooZ12,
  author       = {Mohammad Maghsoudloo and
                  Hamid R. Zarandi},
  title        = {Dirty data vulnerability mitigation by means of sharing management
                  in cache coherence protocols},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {205--210},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378225},
  doi          = {10.1109/DFT.2012.6378225},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/MaghsoudlooZ12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ManzorK12,
  author       = {Yifat Manzor and
                  Osnat Keren},
  title        = {Amalgamated q-ary codes for multi-level flash memories},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {98--103},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378207},
  doi          = {10.1109/DFT.2012.6378207},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ManzorK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/MoraesHL12,
  author       = {Marcelo de Souza Moraes and
                  Marcos Barcellos Herv{\'{e}} and
                  Marcelo Lubaszewski},
  title        = {Low pin count DfT technique for {RFID} ICs},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {31--36},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378195},
  doi          = {10.1109/DFT.2012.6378195},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/MoraesHL12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/NambaKI12,
  author       = {Kazuteru Namba and
                  Takashi Katagiri and
                  Hideo Ito},
  title        = {Dual-edge-triggered {FF} with timing error detection capability},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {187--192},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378222},
  doi          = {10.1109/DFT.2012.6378222},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/NambaKI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/NazarC12,
  author       = {Gabriel L. Nazar and
                  Luigi Carro},
  title        = {Fast single-FPGA fault injection platform},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {152--157},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378216},
  doi          = {10.1109/DFT.2012.6378216},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/NazarC12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/OmanaRCML12,
  author       = {Martin Oma{\~{n}}a and
                  Daniele Rossi and
                  G. Collepalumbo and
                  Cecilia Metra and
                  Fabrizio Lombardi},
  title        = {Faults affecting the control blocks of {PV} arrays and techniques
                  for their concurrent detection},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {199--204},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378224},
  doi          = {10.1109/DFT.2012.6378224},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/OmanaRCML12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/Pomeranz12,
  author       = {Irith Pomeranz},
  title        = {Generation and compaction of mixed broadside and skewed-load n-detection
                  test sets for transition faults},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {37--42},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378196},
  doi          = {10.1109/DFT.2012.6378196},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/Pomeranz12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/Pomeranz12a,
  author       = {Irith Pomeranz},
  title        = {Built-in generation of multi-cycle broadside tests},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {146--151},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378215},
  doi          = {10.1109/DFT.2012.6378215},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/Pomeranz12a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/Pomeranz12b,
  author       = {Irith Pomeranz},
  title        = {Maintaining proximity to functional operation conditions under enhanced-scan
                  tests based on functional broadside tests},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {239--244},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378230},
  doi          = {10.1109/DFT.2012.6378230},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/Pomeranz12b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/RabBT12,
  author       = {Muhammad Tauseef Rab and
                  Asad Amin Bawa and
                  Nur A. Touba},
  title        = {Implementing defect tolerance in 3D-ICs by exploiting degrees of freedom
                  in assembly},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {178--181},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378220},
  doi          = {10.1109/DFT.2012.6378220},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/RabBT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/RahmatianKHB12,
  author       = {Mehryar Rahmatian and
                  Hessam Kooti and
                  Ian G. Harris and
                  Elaheh Bozorgzadeh},
  title        = {Minimization of Trojan footprint by reducing Delay/Area impact},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {59--62},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378200},
  doi          = {10.1109/DFT.2012.6378200},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/RahmatianKHB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/RodriguesKK12,
  author       = {Rance Rodrigues and
                  Israel Koren and
                  Sandip Kundu},
  title        = {A mechanism to verify cache coherence transactions in multicore systems},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {211--216},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378226},
  doi          = {10.1109/DFT.2012.6378226},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/RodriguesKK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/RohaniK12,
  author       = {Alireza Rohani and
                  Hans G. Kerkhoff},
  title        = {An on-line soft error mitigation technique for control logic of {VLIW}
                  processors},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {85--91},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378205},
  doi          = {10.1109/DFT.2012.6378205},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/RohaniK12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/SabenaRS12,
  author       = {Davide Sabena and
                  Matteo Sonza Reorda and
                  Luca Sterpone},
  title        = {On the development of Software-Based Self-Test methods for {VLIW}
                  processors},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {25--30},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378194},
  doi          = {10.1109/DFT.2012.6378194},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SabenaRS12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/SantosF12,
  author       = {Juan Carlos Mart{\'{\i}}nez Santos and
                  Yunsi Fei},
  title        = {Designing and implementing a Malicious 8051 processor},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {63--66},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378201},
  doi          = {10.1109/DFT.2012.6378201},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/SantosF12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ShahiZ12,
  author       = {Ali Arabi M. Shahi and
                  Payman Zarkesh{-}Ha},
  title        = {Prediction of gate delay variation for {CNFET} under {CNT} density
                  variation},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {140--145},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378214},
  doi          = {10.1109/DFT.2012.6378214},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ShahiZ12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ShimH12,
  author       = {Kyu{-}Nam Shim and
                  Jiang Hu},
  title        = {A low overhead built-in delay testing with voltage and frequency adaptation
                  for variation resilience},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {170--177},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378219},
  doi          = {10.1109/DFT.2012.6378219},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ShimH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ValadimasTAE12,
  author       = {Stefanos Valadimas and
                  Yiorgos Tsiatouhas and
                  Angela Arapoyanni and
                  Adrian Evans},
  title        = {Single event upset tolerance in flip-flop based microprocessor cores},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {79--84},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378204},
  doi          = {10.1109/DFT.2012.6378204},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ValadimasTAE12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/WangMKNB12,
  author       = {Xinmu Wang and
                  Tatini Mal{-}Sarkar and
                  Aswin Raghav Krishna and
                  Seetharam Narasimhan and
                  Swarup Bhunia},
  title        = {Software exploitable hardware Trojans in embedded processor},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {55--58},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378199},
  doi          = {10.1109/DFT.2012.6378199},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/WangMKNB12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/WatkinsT12,
  author       = {Adam Watkins and
                  Spyros Tragoudas},
  title        = {Transient pulse propagation using the Weibull distribution function},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {109--114},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378209},
  doi          = {10.1109/DFT.2012.6378209},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/WatkinsT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/YonedaI12,
  author       = {Tomohiro Yoneda and
                  Masashi Imai},
  title        = {Dependable routing in multi-chip NoC platforms for automotive applications},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {217--224},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378227},
  doi          = {10.1109/DFT.2012.6378227},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/YonedaI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ZhangNI12,
  author       = {Wenpo Zhang and
                  Kazuteru Namba and
                  Hideo Ito},
  title        = {Improving small-delay fault coverage for on-chip delay measurement},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {193--198},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378223},
  doi          = {10.1109/DFT.2012.6378223},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ZhangNI12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ZhangXT12,
  author       = {Xuehui Zhang and
                  Kan Xiao and
                  Mohammad Tehranipoor},
  title        = {Path-delay fingerprinting for identification of recovered ICs},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {13--18},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378192},
  doi          = {10.1109/DFT.2012.6378192},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ZhangXT12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/dft/ZhengSWH12,
  author       = {Chuanlei Zheng and
                  Parijat Shukla and
                  Shuai Wang and
                  Jie S. Hu},
  title        = {Exploring hardware transaction processing for reliable computing in
                  chip-multiprocessors against soft errors},
  booktitle    = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  pages        = {92--97},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://doi.org/10.1109/DFT.2012.6378206},
  doi          = {10.1109/DFT.2012.6378206},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/dft/ZhengSWH12.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/dft/2012,
  title        = {2012 {IEEE} International Symposium on Defect and Fault Tolerance
                  in {VLSI} and Nanotechnology Systems, {DFT} 2012, Austin, TX, USA,
                  October 3-5, 2012},
  publisher    = {{IEEE} Computer Society},
  year         = {2012},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/6362314/proceeding},
  isbn         = {978-1-4673-3043-5},
  timestamp    = {Wed, 16 Oct 2019 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/dft/2012.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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