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@inproceedings{DBLP:conf/itc-asia/AbrahamGCSDNRK17,
  author       = {Jais Abraham and
                  Uttam Garg and
                  Glenn Col{\'{o}}n{-}Bonet and
                  Ramesh Sharma and
                  Chennian Di and
                  Benoit Nadeau{-}Dostie and
                  Etienne Racine and
                  Martin Keim},
  title        = {Adapting an industrial memory {BIST} solution for testing CAMs},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {112--117},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097123},
  doi          = {10.1109/ITC-ASIA.2017.8097123},
  timestamp    = {Mon, 09 Aug 2021 14:54:04 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/AbrahamGCSDNRK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/AppelloLP17,
  author       = {Davide Appello and
                  M. Laurino and
                  Marco Pranzo},
  title        = {A mathematical model to assess the influence of parallelism in a semiconductor
                  back-end test floor},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {138--143},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097129},
  doi          = {10.1109/ITC-ASIA.2017.8097129},
  timestamp    = {Thu, 16 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/AppelloLP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/BecklerB17,
  author       = {Matthew Beckler and
                  R. D. Shawn Blanton},
  title        = {GPU-accelerated fault dictionary generation for the {TRAX} fault model},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {34--39},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097107},
  doi          = {10.1109/ITC-ASIA.2017.8097107},
  timestamp    = {Fri, 27 Dec 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/BecklerB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/BhattacharyaT17,
  author       = {Abhishek Bhattacharya and
                  Ramesh Tekumalla},
  title        = {Test strategy for storage SOCs},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {96--99},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097119},
  doi          = {10.1109/ITC-ASIA.2017.8097119},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/BhattacharyaT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ChenLCCL17,
  author       = {Po{-}Hao Chen and
                  Chi{-}Lin Lee and
                  Jing{-}Yu Chen and
                  Po{-}Wei Chen and
                  James Chien{-}Mo Li},
  title        = {Physical-aware diagnosis of multiple interconnect defects},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {40--45},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097108},
  doi          = {10.1109/ITC-ASIA.2017.8097108},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ChenLCCL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ChenLW17,
  author       = {Hao Chen and
                  Hung{-}Chih Lin and
                  Min{-}Jer Wang},
  title        = {Fan-out wafer level chip scale package testing},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {84--89},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097117},
  doi          = {10.1109/ITC-ASIA.2017.8097117},
  timestamp    = {Wed, 26 May 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ChenLW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/Cheng17,
  author       = {Tim Cheng},
  title        = {Keynote {I:} Hardware security - Verification, test, and defense mechanisms},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {xii--xv},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097097},
  doi          = {10.1109/ITC-ASIA.2017.8097097},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/Cheng17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ChiuTLWLW17,
  author       = {Tang{-}Jung Chiu and
                  Yu{-}Lun Tseng and
                  Yen{-}Cheng Lin and
                  Yi{-}Chen Wang and
                  Hung{-}Chih Lin and
                  Min{-}Jer Wang},
  title        = {Testing-for-manufacturing {(TFM)} for ultra-thin {IPD} on InFO},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {90--95},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097118},
  doi          = {10.1109/ITC-ASIA.2017.8097118},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ChiuTLWLW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ChuangWC17,
  author       = {Po{-}Yao Chuang and
                  Cheng{-}Wen Wu and
                  Harry H. Chen},
  title        = {Cell-aware test generation time reduction by using switch-level {ATPG}},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {27--32},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097105},
  doi          = {10.1109/ITC-ASIA.2017.8097105},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ChuangWC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/HongL17,
  author       = {Shuo{-}Lian Hong and
                  Kuen{-}Jong Lee},
  title        = {A run-pause-resume silicon debug technique for multiple clock domain
                  systems},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {46--51},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097109},
  doi          = {10.1109/ITC-ASIA.2017.8097109},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/HongL17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/HsiehLWLLKC17,
  author       = {Tsung{-}Fu Hsieh and
                  Jin{-}Fu Li and
                  Kuan{-}Te Wu and
                  Jenn{-}Shiang Lai and
                  Chih{-}Yen Lo and
                  Ding{-}Ming Kwai and
                  Yung{-}Fa Chou},
  title        = {Software-hardware-cooperated built-in self-test scheme for channel-based
                  DRAMs},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {107--111},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097122},
  doi          = {10.1109/ITC-ASIA.2017.8097122},
  timestamp    = {Tue, 17 Oct 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/HsiehLWLLKC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/HsuW17,
  author       = {Charles Chia{-}Hao Hsu and
                  Charles H.{-}P. Wen},
  title        = {Speeding up power verification by merging equivalent power domains
                  in {RTL} design with {UPF}},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {168--173},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097135},
  doi          = {10.1109/ITC-ASIA.2017.8097135},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/HsuW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/IchiharaFII17,
  author       = {Hideyuki Ichihara and
                  Motoi Fukuda and
                  Tsuyoshi Iwagaki and
                  Tomoo Inoue},
  title        = {State assignment for fault tolerant stochastic computing with linear
                  finite state machines},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {156--161},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097133},
  doi          = {10.1109/ITC-ASIA.2017.8097133},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/IchiharaFII17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/InceYJWO17,
  author       = {Mehmet Ince and
                  Ender Yilmaz and
                  Jae Woong Jeong and
                  LeRoy Winemberg and
                  Sule Ozev},
  title        = {Evaluation of loop transfer function based dynamic testing of LDOs},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {14--19},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097102},
  doi          = {10.1109/ITC-ASIA.2017.8097102},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/InceYJWO17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/KarmakarCK17,
  author       = {Rajit Karmakar and
                  Santanu Chattopadhyay and
                  Rohit Kapur},
  title        = {Enhancing security of logic encryption using embedded key generation
                  unit},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {131--136},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097127},
  doi          = {10.1109/ITC-ASIA.2017.8097127},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KarmakarCK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/KawabataASYK17,
  author       = {Masayuki Kawabata and
                  Koji Asami and
                  Shohei Shibuya and
                  Tomonori Yanagida and
                  Haruo Kobayashi},
  title        = {Low-distortion signal generation for analog/mixed-signal circuit testing
                  with digital {ATE}},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {2--7},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097100},
  doi          = {10.1109/ITC-ASIA.2017.8097100},
  timestamp    = {Thu, 06 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KawabataASYK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/KeGH17,
  author       = {Yi{-}Ju Ke and
                  Yi{-}Chieh Ghen and
                  Jng{-}Jer Huang},
  title        = {An integrated design environment of fault tolerant processors with
                  flexible {HW/SW} solutions for versatile performance/cost/coverage
                  tradeoffs},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {162--167},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097134},
  doi          = {10.1109/ITC-ASIA.2017.8097134},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KeGH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/KerkhoffAEI17,
  author       = {Hans G. Kerkhoff and
                  Ghazanfar Ali and
                  Hassan Ebrahimi and
                  Ahmed Ibrahim},
  title        = {An automotive MP-SoC featuring an advanced embedded instrument infrastructure
                  for high dependability},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {65--70},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097113},
  doi          = {10.1109/ITC-ASIA.2017.8097113},
  timestamp    = {Wed, 08 Jan 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KerkhoffAEI17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/KochteBW17,
  author       = {Michael A. Kochte and
                  Rafal Baranowski and
                  Hans{-}Joachim Wunderlich},
  title        = {Trustworthy reconfigurable access to on-chip infrastructure},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {119--124},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097125},
  doi          = {10.1109/ITC-ASIA.2017.8097125},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/KochteBW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/LeeC17,
  author       = {Yen{-}Long Lee and
                  Soon{-}Jyh Chang},
  title        = {A quick jitter tolerance estimation technique for bang-bang CDRs},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {8--13},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097101},
  doi          = {10.1109/ITC-ASIA.2017.8097101},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LeeC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/LeeCOKK17,
  author       = {Young{-}Woo Lee and
                  Inhyuk Choi and
                  Kang{-}Hoon Oh and
                  James Jinsoo Ko and
                  Sungho Kang},
  title        = {Test item priority estimation for high parallel test efficiency under
                  {ATE} debug time constraints},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {150--154},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097131},
  doi          = {10.1109/ITC-ASIA.2017.8097131},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LeeCOKK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/LuH17,
  author       = {Shyue{-}Kung Lu and
                  Hung{-}Kai Huang},
  title        = {Adaptive block-based refresh techniques for mitigation of data retention
                  faults and reduction of refresh power},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {101--106},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097121},
  doi          = {10.1109/ITC-ASIA.2017.8097121},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/LuH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/MarinissenFWKHS17,
  author       = {Erik Jan Marinissen and
                  Ferenc Fodor and
                  Bart De Wachter and
                  Jorg Kiesewetter and
                  Eric Hill and
                  Ken Smith},
  title        = {A fully automatic test system for characterizing large-array fine-pitch
                  micro-bump probe cards},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {144--149},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097130},
  doi          = {10.1109/ITC-ASIA.2017.8097130},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/MarinissenFWKHS17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/MiyakeSK17,
  author       = {Yousuke Miyake and
                  Yasuo Sato and
                  Seiji Kajihara},
  title        = {On the effects of real time and contiguous measurement with a digital
                  temperature and voltage sensor},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {125--130},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097126},
  doi          = {10.1109/ITC-ASIA.2017.8097126},
  timestamp    = {Fri, 27 Dec 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/MiyakeSK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/TilleGP17,
  author       = {Daniel Tille and
                  Benedikt Gottinger and
                  Ulrike Pfannkuchen},
  title        = {A lightweight X-masking scheme for IoT designs},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {77--82},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097115},
  doi          = {10.1109/ITC-ASIA.2017.8097115},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/TilleGP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/WangH17,
  author       = {Chih{-}Hao Wang and
                  Tong{-}Yu Hsieh},
  title        = {A hybrid concurrent error detection scheme for simultaneous improvement
                  on probability of detection and diagnosability},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {52--57},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097110},
  doi          = {10.1109/ITC-ASIA.2017.8097110},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/WangH17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/WuLHTC17,
  author       = {Cheng{-}Wen Wu and
                  Bing{-}Yang Lin and
                  Hsin{-}Wei Hung and
                  Shu{-}Mei Tseng and
                  Chi Chen},
  title        = {Symbiotic system models for efficient {IGT} system design and test},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {71--76},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097114},
  doi          = {10.1109/ITC-ASIA.2017.8097114},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/WuLHTC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/WuLR17,
  author       = {Cheng{-}Hung Wu and
                  Kuen{-}Jong Lee and
                  Sudhakar M. Reddy},
  title        = {Test generation for open and delay faults in {CMOS} circuits},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {21--26},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097104},
  doi          = {10.1109/ITC-ASIA.2017.8097104},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/WuLR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/ZambranoK17,
  author       = {Andreina Zambrano and
                  Hans G. Kerkhoff},
  title        = {A dependable {AMR} sensor system for automotive applications},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {59--64},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097112},
  doi          = {10.1109/ITC-ASIA.2017.8097112},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/ZambranoK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@inproceedings{DBLP:conf/itc-asia/Zorian17,
  author       = {Yervant Zorian},
  title        = {Tutorial {I:} Topic: Automotive test strategies},
  booktitle    = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  pages        = {ix--xi},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/ITC-ASIA.2017.8097096},
  doi          = {10.1109/ITC-ASIA.2017.8097096},
  timestamp    = {Wed, 13 Nov 2019 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/itc-asia/Zorian17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@proceedings{DBLP:conf/itc-asia/2017,
  title        = {International Test Conference in Asia, ITC-Asia 2017, Taipei, Taiwan,
                  September 13-15, 2017},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://ieeexplore.ieee.org/xpl/conhome/8086228/proceeding},
  isbn         = {978-1-5386-3051-8},
  timestamp    = {Mon, 09 Aug 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/conf/itc-asia/2017.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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