Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "toc:db/conf/vts/vts2005.bht:"
download as .bib file
@inproceedings{DBLP:conf/vts/AabergeMDBDH05,
author = {Darren Aaberge and
Ken Mockler and
Dieu Van Dinh and
Raoul Belleau and
Tim Donovan and
Reid Hewlitt},
title = {Meeting the Test Challenges of the 1 Gbps Parallel RapidIO Interface
with New Automatic Test Equipment Capabilities},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {75--84},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.55},
doi = {10.1109/VTS.2005.55},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AabergeMDBDH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AcarO05,
author = {Erkan Acar and
Sule Ozev},
title = {Diagnosis of Failing Component in {RF} Receivers through Adaptive
Full-Path Measurements},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {374--379},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.42},
doi = {10.1109/VTS.2005.42},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AcarO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AcharyyaP05,
author = {Dhruva Acharyya and
Jim Plusquellic},
title = {Hardware Results Demonstrating Defect Detection Using Power Supply
Signal Measurements},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {433--438},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.47},
doi = {10.1109/VTS.2005.47},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AcharyyaP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AhmedRTP05,
author = {Nisar Ahmed and
C. P. Ravikumar and
Mohammad Tehranipoor and
Jim Plusquellic},
title = {At-Speed Transition Fault Testing With Low Speed Scan Enable},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {42--47},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.31},
doi = {10.1109/VTS.2005.31},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AhmedRTP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AkbayC05,
author = {Selim Sermet Akbay and
Abhijit Chatterjee},
title = {Built-In Test of {RF} Components Using Mapped Feature Extraction Sensors},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {243--248},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.33},
doi = {10.1109/VTS.2005.33},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AkbayC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Al-YamaniCG05,
author = {Ahmad A. Al{-}Yamani and
Erik Chmelar and
Mikhail Grinchuck},
title = {Segmented Addressable Scan Architecture},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {405--411},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.74},
doi = {10.1109/VTS.2005.74},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Al-YamaniCG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AsadiT05,
author = {Ghazanfar Asadi and
Mehdi Baradaran Tahoori},
title = {Soft Error Mitigation for SRAM-Based FPGAs},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {207--212},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.75},
doi = {10.1109/VTS.2005.75},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AsadiT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/AzimaneMGL05,
author = {Mohamed Azimane and
Ananta K. Majhi and
Guido Gronthoud and
Maurice Lousberg},
title = {A New Algorithm for Dynamic Faults Detection in RAMs},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {177--182},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.9},
doi = {10.1109/VTS.2005.9},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/AzimaneMGL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BayraktarogluCW05,
author = {Ismet Bayraktaroglu and
Olivier Caty and
Yickkei Wong},
title = {Highly Configurable Programmable Built-In Self Test Architecture for
High-Speed Memories},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {21--26},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.49},
doi = {10.1109/VTS.2005.49},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BayraktarogluCW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BeckBPLP05,
author = {Matthias Beck and
Olivier Barondeau and
Frank Poehl and
Xijiang Lin and
Ron Press},
title = {Measures to Improve Delay Fault Testing on Low-Cost Testers - {A}
Case Study},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {223--228},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.54},
doi = {10.1109/VTS.2005.54},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BeckBPLP05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/BhattacharyaC05,
author = {Soumendu Bhattacharya and
Abhijit Chatterjee},
title = {Production Test Methods for Measuring 'Out-of-Band' Interference of
Ultra Wide Band {(UWB)} Devices},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {137--142},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.67},
doi = {10.1109/VTS.2005.67},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/BhattacharyaC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Bhavsar05,
author = {Dilip K. Bhavsar},
title = {A Built-in Self-Test Method for Write-only Content Addressable Memories},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {9--14},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.7},
doi = {10.1109/VTS.2005.7},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Bhavsar05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChakravartyCHJPPSSTW05,
author = {Sreejit Chakravarty and
Yi{-}Shing Chang and
Hiep Hoang and
Sridhar Jayaraman and
Silvio Picano and
Cheryl Prunty and
Eric W. Savage and
Rehan Sheikh and
Eric N. Tran and
Khen Wee},
title = {Experimental Evaluation of Bridge Patterns for a High Performance
Microprocessor},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {337--342},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.44},
doi = {10.1109/VTS.2005.44},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChakravartyCHJPPSSTW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChangCHTW05,
author = {Yi{-}Shing Chang and
Sreejit Chakravarty and
Hiep Hoang and
Nick Thorpe and
Khen Wee},
title = {Transition Tests for High Performance Microprocessors},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {29--34},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.87},
doi = {10.1109/VTS.2005.87},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChangCHTW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChenMBR05,
author = {Qikai Chen and
Hamid Mahmoodi{-}Meimand and
Swarup Bhunia and
Kaushik Roy},
title = {Modeling and Testing of {SRAM} for New Failure Mechanisms Due to Process
Variations in Nanoscale {CMOS}},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {292--297},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.58},
doi = {10.1109/VTS.2005.58},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChenMBR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ChiuL05,
author = {Min{-}Hao Chiu and
Chien{-}Mo James Li},
title = {Jump Scan: {A} {DFT} Technique for Low Power Testing},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {277--282},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.51},
doi = {10.1109/VTS.2005.51},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ChiuL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Davidson05,
author = {Scott Davidson},
title = {Towards an Understanding of No Trouble Found Devices},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {147--152},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.86},
doi = {10.1109/VTS.2005.86},
timestamp = {Tue, 12 Dec 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Davidson05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DesineniB05,
author = {Rao Desineni and
R. D. (Shawn) Blanton},
title = {Diagnosis of Arbitrary Defects Using Neighborhood Function Extraction},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {366--373},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.41},
doi = {10.1109/VTS.2005.41},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DesineniB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DililloGPVH05,
author = {Luigi Dilillo and
Patrick Girard and
Serge Pravossoudovitch and
Arnaud Virazel and
Magali Bastian Hage{-}Hassan},
title = {Data Retention Fault in {SRAM} Memories: Analysis and Detection Procedures},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {183--188},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.37},
doi = {10.1109/VTS.2005.37},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DililloGPVH05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DirilDCS05,
author = {Abdulkadir Utku Diril and
Yuvraj Singh Dhillon and
Abhijit Chatterjee and
Adit D. Singh},
title = {Design of Adaptive Nanometer Digital Systems for Effective Control
of Soft Error Tolerance},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {298--303},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.40},
doi = {10.1109/VTS.2005.40},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DirilDCS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Dryden05,
author = {Cameron Dryden},
title = {Survey of Design and Process Failure Modes for High-Speed SerDes in
Nanometer {CMOS}},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {285--291},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.79},
doi = {10.1109/VTS.2005.79},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Dryden05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/DumasALN05,
author = {Norbert Dumas and
Florence Aza{\"{\i}}s and
Laurent Latorre and
Pascal Nouet},
title = {On-Chip Electro-Thermal Stimulus Generation for a MEMS-Based Magnetic
Field Sensor},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {213--218},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.62},
doi = {10.1109/VTS.2005.62},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/DumasALN05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/GhoshBT05,
author = {Shalini Ghosh and
Sugato Basu and
Nur A. Touba},
title = {Synthesis of Low Power {CED} Circuits Based on Parity Codes},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {315--320},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.80},
doi = {10.1109/VTS.2005.80},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/GhoshBT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HakmiWGGS05,
author = {Abdul Wahid Hakmi and
Hans{-}Joachim Wunderlich and
Valentin Gherman and
Michael Garbers and
J{\"{u}}rgen Schl{\"{o}}ffel},
title = {Implementing a Scheme for External Deterministic Self-Test},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {101--106},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.50},
doi = {10.1109/VTS.2005.50},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HakmiWGGS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HalderC05,
author = {Achintya Halder and
Abhijit Chatterjee},
title = {Low-Cost Alternate {EVM} Test for Wireless Receiver Systems},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {255--260},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.53},
doi = {10.1109/VTS.2005.53},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HalderC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HarutunyanVZ05,
author = {Gurgen Harutunyan and
Valery A. Vardanian and
Yervant Zorian},
title = {Minimal March Tests for Unlinked Static Faults in Random Access Memories},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {53--59},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.56},
doi = {10.1109/VTS.2005.56},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HarutunyanVZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/HongDS05,
author = {Dongwoo Hong and
Cameron Dryden and
Gordon Saksena},
title = {An Efficient Random Jitter Measurement Technique Using Fast Comparator
Sampling},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {123--130},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.30},
doi = {10.1109/VTS.2005.30},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/HongDS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/IwaiNIO05,
author = {Hitoshi Iwai and
Atsushi Nakayama and
Naoko Itoga and
Kotaro Omata},
title = {Cantilever Type Probe Card for At-Speed Memory Test on Wafer},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {85--89},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.34},
doi = {10.1109/VTS.2005.34},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/IwaiNIO05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JoseJR05,
author = {Anup P. Jose and
Keith A. Jenkins and
Scott K. Reynolds},
title = {On-Chip Spectrum Analyzer for Analog Built-In Self Test},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {131--136},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.63},
doi = {10.1109/VTS.2005.63},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/JoseJR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/JoshiM05,
author = {Kirti Joshi and
Eric W. MacDonald},
title = {Reduction of Instantaneous Power by Ripple Scan Clocking},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {271--276},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.71},
doi = {10.1109/VTS.2005.71},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/JoshiM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/KoobURLJBBHCE05,
author = {John C. Koob and
Sue Ann Ung and
Ashwin S. Rao and
Daniel A. Leder and
Craig S. Joly and
Kristopher C. Breen and
Tyler L. Brandon and
Michael Hume and
Bruce F. Cockburn and
Duncan G. Elliott},
title = {Test and Characterization of a Variable-Capacity Multilevel {DRAM}},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {189--197},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.82},
doi = {10.1109/VTS.2005.82},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/KoobURLJBBHCE05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeeWA05,
author = {Benjamin N. Lee and
Li{-}C. Wang and
Magdy S. Abadir},
title = {Reducing Pattern Delay Variations for Screening Frequency Dependent
Defects},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {153--160},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.70},
doi = {10.1109/VTS.2005.70},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeeWA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LeeWPM05,
author = {Leonard Lee and
Li{-}C. Wang and
Praveen Parvathala and
T. M. Mak},
title = {On Silicon-Based Speed Path Identification},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {35--41},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.61},
doi = {10.1109/VTS.2005.61},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LeeWPM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiL05,
author = {Jin{-}Fu Li and
Chou{-}Kun Lin},
title = {Modeling and Testing Comparison Faults for Ternary Content Addressable
Memories},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {60--65},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.57},
doi = {10.1109/VTS.2005.57},
timestamp = {Tue, 17 Oct 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/LiL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinA05,
author = {Yu{-}Ting Lin and
Tony Ambler},
title = {An Economic Selecting Model for {DFT} Strategies},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {412--417},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.29},
doi = {10.1109/VTS.2005.29},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LinLC05,
author = {Yung{-}Chieh Lin and
Feng Lu and
Kwang{-}Ting Cheng},
title = {Pseudo-Functional Scan-based {BIST} for Delay Fault},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {229--234},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.69},
doi = {10.1109/VTS.2005.69},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LinLC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LingappanJ05,
author = {Loganathan Lingappan and
Niraj K. Jha},
title = {Unsatisfiability Based Efficient Design for Testability Solution for
Register-Transfer Level Circuits},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {418--423},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.88},
doi = {10.1109/VTS.2005.88},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LingappanJ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/LiuISC05,
author = {Chunsheng Liu and
Vikram Iyengar and
Jiangfan Shi and
{\'{E}}rika F. Cota},
title = {Power-Aware Test Scheduling in Network-on-Chip Using Variable-Rate
On-Chip Clocking},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {349--354},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.66},
doi = {10.1109/VTS.2005.66},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/LiuISC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Mohanram05,
author = {Kartik Mohanram},
title = {Closed-Form Simulation and Robustness Models for SEU-Tolerant Design},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {327--333},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.35},
doi = {10.1109/VTS.2005.35},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Mohanram05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/NouraniTA05,
author = {Mehrdad Nourani and
Mohammad Tehranipoor and
Nisar Ahmed},
title = {Pattern Generation and Estimation for Power Supply Noise Analysis},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {439--444},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.65},
doi = {10.1109/VTS.2005.65},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/NouraniTA05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/OmanaRM05,
author = {Martin Oma{\~{n}}a and
Daniele Rossi and
Cecilia Metra},
title = {Low Cost Scheme for On-Line Clock Skew Compensation},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {90--95},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.52},
doi = {10.1109/VTS.2005.52},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/OmanaRM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/ParkAM05,
author = {Intaik Park and
Ahmad A. Al{-}Yamani and
Edward J. McCluskey},
title = {Effective {TARO} Pattern Generation},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {161--166},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.43},
doi = {10.1109/VTS.2005.43},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/ParkAM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PereiraABLAR05,
author = {Gustavo Pereira and
Antonio Andrade Jr. and
Tiago R. Balen and
Marcelo Lubaszewski and
Florence Aza{\"{\i}}s and
Michel Renovell},
title = {Testing the Interconnect Networks and {I/O} Resources of Field Programmable
Analog Arrays},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {389--394},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.85},
doi = {10.1109/VTS.2005.85},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/PereiraABLAR05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/PolianKGERB05,
author = {Ilia Polian and
Sandip Kundu and
Jean{-}Marc Galli{\`{e}}re and
Piet Engelke and
Michel Renovell and
Bernd Becker},
title = {Resistive Bridge Fault Model Evolution from Conventional to Ultra
Deep Submicron Technologies},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {343--348},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.72},
doi = {10.1109/VTS.2005.72},
timestamp = {Fri, 19 Apr 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/PolianKGERB05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/RajskiT05,
author = {Janusz Rajski and
Jerzy Tyszer},
title = {Synthesis of X-Tolerant Convolutional Compactors},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {114--119},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.81},
doi = {10.1109/VTS.2005.81},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/RajskiT05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/StratigopoulosM05,
author = {Haralampos{-}G. D. Stratigopoulos and
Yiorgos Makris},
title = {Constructive Derivation of Analog Specification Test Criteria},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {395--400},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.36},
doi = {10.1109/VTS.2005.36},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/StratigopoulosM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/SuC05,
author = {Fei Su and
Krishnendu Chakrabarty},
title = {Defect Tolerance for Gracefully-Degradable Microfluidics-Based Biochips},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {321--326},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.39},
doi = {10.1109/VTS.2005.39},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/SuC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/TurakhiaBMSD05,
author = {Ritesh P. Turakhia and
Brady Benware and
Robert Madge and
Thaddeus T. Shannon and
W. Robert Daasch},
title = {Defect Screening Using Independent Component Analysis on I{\_}DDQ},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {427--432},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.38},
doi = {10.1109/VTS.2005.38},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/TurakhiaBMSD05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Valdes-GarciaVSSS05,
author = {Alberto Valdes{-}Garcia and
Radhika Venkatasubramanian and
Rangakrishnan Srinivasan and
Jos{\'{e}} Silva{-}Mart{\'{\i}}nez and
Edgar S{\'{a}}nchez{-}Sinencio},
title = {A {CMOS} {RF} {RMS} Detector for Built-in Testing of Wireless Transceivers},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {249--254},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.8},
doi = {10.1109/VTS.2005.8},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Valdes-GarciaVSSS05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangLPHW05,
author = {Chun{-}Chieh Wang and
Jing{-}Jia Liou and
Yen{-}Lin Peng and
Chih{-}Tsun Huang and
Cheng{-}Wen Wu},
title = {A {BIST} Scheme for {FPGA} Interconnect Delay Faults},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {201--206},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.5},
doi = {10.1109/VTS.2005.5},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/WangLPHW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangLQYFSW05,
author = {Jing Wang and
Xiang Lu and
Wangqi Qiu and
Ziding Yue and
Steve Fancler and
Weiping Shi and
D. M. H. Walker},
title = {Static Compaction of Delay Tests Considering Power Supply Noise},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {235--240},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.77},
doi = {10.1109/VTS.2005.77},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WangLQYFSW05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WangWYIZ05,
author = {Baosheng Wang and
Yuejian Wu and
Josh Yang and
Andr{\'{e}} Ivanov and
Yervant Zorian},
title = {{SRAM} Retention Testing: Zero Incremental Time Integration with March
Algorithms},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {66--71},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.76},
doi = {10.1109/VTS.2005.76},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WangWYIZ05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/Wen05,
author = {Yun{-}Che Wen},
title = {A {BIST} Scheme for Testing Analog-to-Digital Converters with Digital
Response Analyses},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {383--388},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.6},
doi = {10.1109/VTS.2005.6},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/Wen05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WenWCYLC05,
author = {Charles H.{-}P. Wen and
Li{-}C. Wang and
Kwang{-}Ting Cheng and
Kai Yang and
Wei{-}Ting Liu and
Ji{-}Jan Chen},
title = {On {A} Software-Based Self-Test Methodology and Its Application},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {107--113},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.59},
doi = {10.1109/VTS.2005.59},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WenWCYLC05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WenYKWSK05,
author = {Xiaoqing Wen and
Yoshiyuki Yamashita and
Seiji Kajihara and
Laung{-}Terng Wang and
Kewal K. Saluja and
Kozo Kinoshita},
title = {On Low-Capture-Power Test Generation for Scan Testing},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {265--270},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.60},
doi = {10.1109/VTS.2005.60},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WenYKWSK05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/WohlWPHGM05,
author = {Peter Wohl and
John A. Waicukauski and
Sanjay Patel and
Cy Hay and
Emil Gizdarski and
Ben Mathew},
title = {Hierarchical Compactor Design for Diagnosis in Deterministic Logic
{BIST}},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {359--365},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.48},
doi = {10.1109/VTS.2005.48},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/WohlWPHGM05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05,
title = {Foreword},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.46},
doi = {10.1109/VTS.2005.46},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05a,
title = {Organizing Committee},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.64},
doi = {10.1109/VTS.2005.64},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05b,
title = {Steering Committee},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.78},
doi = {10.1109/VTS.2005.78},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05c,
title = {Program Committee},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.68},
doi = {10.1109/VTS.2005.68},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05d,
title = {Reviewers},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.73},
doi = {10.1109/VTS.2005.73},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05e,
title = {Acknowledgments},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.28},
doi = {10.1109/VTS.2005.28},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05f,
title = {Test Technology Technical Council},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.84},
doi = {10.1109/VTS.2005.84},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05f.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05g,
title = {Test Technology Educational Program: Overview of Tutorials},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.83},
doi = {10.1109/VTS.2005.83},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05g.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05h,
title = {{VTS} 2004 Best Paper Award},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.91},
doi = {10.1109/VTS.2005.91},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05h.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05i,
title = {{VTS} 2004 Best Panel Award},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.90},
doi = {10.1109/VTS.2005.90},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05i.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/X05j,
title = {{VTS} 2004 Best Innovative Practices Session Award},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.89},
doi = {10.1109/VTS.2005.89},
timestamp = {Fri, 24 Mar 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/conf/vts/X05j.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/vts/YehLSWHL05,
author = {Jen{-}Chieh Yeh and
Yan{-}Ting Lai and
Yuan{-}Yuan Shih and
Cheng{-}Wen Wu and
Chien{-}Hung Ho and
Yen{-}Tai Lin},
title = {Flash Memory Built-In Self-Diagnosis with Test Mode Control},
booktitle = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
pages = {15--20},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://doi.org/10.1109/VTS.2005.45},
doi = {10.1109/VTS.2005.45},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/YehLSWHL05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2005,
title = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
Springs, CA, {USA}},
publisher = {{IEEE} Computer Society},
year = {2005},
url = {https://ieeexplore.ieee.org/xpl/conhome/9857/proceeding},
isbn = {0-7695-2314-5},
timestamp = {Wed, 16 Oct 2019 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/vts/2005.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-04-19 23:56 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
