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@article{DBLP:journals/dt/AitkenR03,
  author       = {Robert C. Aitken and
                  Gordon W. Roberts},
  title        = {{ITC} 2003: Breaking Test Interface Bottlenecks},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {54},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/AitkenR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AnandCFJOOW03,
  author       = {Darren Anand and
                  Bruce Cowan and
                  Owen Farnsworth and
                  Peter Jakobsen and
                  Steven F. Oakland and
                  Michael Ouellette and
                  Donald L. Wheater},
  title        = {An On-Chip Self-Repair Calculation and Fusing Methodology},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {67--75},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232258},
  doi          = {10.1109/MDT.2003.1232258},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/AnandCFJOOW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Anderson03,
  author       = {Tom Anderson},
  title        = {Who Cares about System Verification?},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {114},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Anderson03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Ashenden03,
  author       = {Peter J. Ashenden},
  title        = {Boundary Scan Test Standards},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {91--92},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Ashenden03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Ashenden03a,
  author       = {Peter J. Ashenden},
  title        = {{VHDL-200X:} The Next Revision},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {112--113},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Ashenden03a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/AzaisBRIT03,
  author       = {Florence Aza{\"{\i}}s and
                  Yves Bertrand and
                  Michel Renovell and
                  Andr{\'{e}} Ivanov and
                  Sassan Tabatabaei},
  title        = {An All-Digital {DFT} Scheme for Testing Catastrophic Faults in PLLs},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {60--67},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173054},
  doi          = {10.1109/MDT.2003.1173054},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/AzaisBRIT03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BandapatiSC03,
  author       = {Satish K. Bandapati and
                  Scott C. Smith and
                  Minsu Choi},
  title        = {Design and Characterization of Null Convention Self-Timed Multipliers},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {26--36},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246161},
  doi          = {10.1109/MDT.2003.1246161},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/BandapatiSC03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BensoCNP03,
  author       = {Alfredo Benso and
                  Stefano Di Carlo and
                  Giorgio Di Natale and
                  Paolo Prinetto},
  title        = {Online Self-Repair of {FIR} Filters},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {50--57},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198686},
  doi          = {10.1109/MDT.2003.1198686},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/BensoCNP03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BensoCPZ03,
  author       = {Alfredo Benso and
                  Stefano Di Carlo and
                  Paolo Prinetto and
                  Yervant Zorian},
  title        = {A Hierarchical Infrastructure for SoC Test Management},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {32--39},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1214350},
  doi          = {10.1109/MDT.2003.1214350},
  timestamp    = {Tue, 07 May 2024 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/BensoCPZ03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/BodoniB03,
  author       = {Monica Lobetti Bodoni and
                  Ben Bennetts},
  title        = {Guest Editors' Introduction: Board Test},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {5--7},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188256},
  doi          = {10.1109/MDT.2003.1188256},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/BodoniB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ButlerCW03,
  author       = {Kenneth M. Butler and
                  Kwang{-}Ting (Tim) Cheng and
                  Li{-}C. Wang},
  title        = {Guest Editors' Introduction: Speed Test and Speed Binning for Complex
                  ICs},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {6--7},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232250},
  doi          = {10.1109/MDT.2003.1232250},
  timestamp    = {Wed, 07 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/ButlerCW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CardosoN03,
  author       = {Jo{\~{a}}o M. P. Cardoso and
                  Hor{\'{a}}cio C. Neto},
  title        = {Compilation for FPGA-Based Reconfigurable Hardware},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {65--75},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188264},
  doi          = {10.1109/MDT.2003.1188264},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/CardosoN03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CarroNJSF03,
  author       = {Luigi Carro and
                  Marcelo Negreiros and
                  Gabriel Parmegiani Jahn and
                  Ad{\~{a}}o Ant{\^{o}}nio de Souza Jr. and
                  Denis Teixeira Franco},
  title        = {Circuit-Level Considerations for Mixed-Signal Programmable Components},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {76--84},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173056},
  doi          = {10.1109/MDT.2003.1173056},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/CarroNJSF03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ClarkR03,
  author       = {C. J. Clark and
                  Mike Ricchetti},
  title        = {Infrastructure {IP} for Configuration and Test of Boards and Systems},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {78--87},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198689},
  doi          = {10.1109/MDT.2003.1198689},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/ClarkR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CoryKU03,
  author       = {Bruce Cory and
                  Rohit Kapur and
                  Bill Underwood},
  title        = {Speed Binning with Path Delay Test in 150-nm Technology},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {41--45},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232255},
  doi          = {10.1109/MDT.2003.1232255},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/CoryKU03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CrouchPD03,
  author       = {Alfred L. Crouch and
                  John C. Potter and
                  Jason Doege},
  title        = {{AC} Scan Path Selection for Physical Debugging},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {34--40},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232254},
  doi          = {10.1109/MDT.2003.1232254},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/CrouchPD03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/CupakCM03,
  author       = {Miroslav Cup{\'{a}}k and
                  Francky Catthoor and
                  Hugo De Man},
  title        = {Efficient System-Level Functional Verification Methodology for Multimedia
                  Applications},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {56--64},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188263},
  doi          = {10.1109/MDT.2003.1188263},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/CupakCM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/DagaPMRMGA03,
  author       = {Jean Michel Daga and
                  Caroline Papaix and
                  Marc Merandat and
                  Stephane Ricard and
                  Giuseppe Medulla and
                  Jeanine Guichaoua and
                  Daniel Auvergne},
  title        = {Design Techniques for EEPROMs Embedded in Portable Systems on Chips},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {68--75},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173055},
  doi          = {10.1109/MDT.2003.1173055},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/DagaPMRMGA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Davidson03,
  author       = {Scott Davidson},
  title        = {All {I} Know {I} Learned at {ITC}},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {104},
  year         = {2003},
  timestamp    = {Sat, 09 Dec 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/Davidson03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/DupontM03,
  author       = {Eric Dupont and
                  Grant Martin},
  title        = {Panel Summaries},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {100--102},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/DupontM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/EklowBP03,
  author       = {Bill Eklow and
                  Carl Barnhart and
                  Kenneth P. Parker},
  title        = {{IEEE} 1149.6: {A} Boundary-Scan Standard for Advanced Digital Networks},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {76--83},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232259},
  doi          = {10.1109/MDT.2003.1232259},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/EklowBP03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/EnginK03,
  author       = {Nur Engin and
                  Hans G. Kerkhoff},
  title        = {Fast Fault Simulation for Nonlinear Analog Circuits},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {40--47},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188261},
  doi          = {10.1109/MDT.2003.1188261},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/EnginK03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/GrochowskiAT03,
  author       = {Ed Grochowski and
                  David Ayers and
                  Vivek Tiwari},
  title        = {Microarchitectural dI/dt Control},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {40--47},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198684},
  doi          = {10.1109/MDT.2003.1198684},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/GrochowskiAT03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Gupta03,
  author       = {Rajesh Gupta},
  title        = {From the Editor in Chief: Twenty years!},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {1},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Gupta03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Gupta03a,
  author       = {Rajesh Gupta},
  title        = {From the Editor in Chief: Full Circle?},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {1},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Gupta03a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Gupta03b,
  author       = {Rajesh Gupta},
  title        = {From the Editor in Chief: {A} "Powerful" Issue!},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {1},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Gupta03b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Gupta03c,
  author       = {Rajesh Gupta},
  title        = {From the Editor in Chief: Addressing Problems of the Large},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {3},
  year         = {2003},
  url          = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.10024},
  doi          = {10.1109/MDT.2003.10024},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Gupta03c.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Gupta03d,
  author       = {Rajesh Gupta},
  title        = {At-Speed Testing: {A} Shared Red Brick between Design and Test},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {1},
  year         = {2003},
  url          = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.10037},
  doi          = {10.1109/MDT.2003.10037},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Gupta03d.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Gupta03e,
  author       = {Rajesh Gupta},
  title        = {From the {EIC:} The changing face of {IC} design and its industry},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {1},
  year         = {2003},
  url          = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.10044},
  doi          = {10.1109/MDT.2003.10044},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Gupta03e.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HahanovU03,
  author       = {Vladimir Hahanov and
                  Raimund Ubar},
  title        = {Conference Reports},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {103},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/HahanovU03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Harris03,
  author       = {Ian G. Harris},
  title        = {Fault Models and Test Generation for Hardware-Software Covalidation},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {40--47},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1214351},
  doi          = {10.1109/MDT.2003.1214351},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Harris03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HassounJ03,
  author       = {Soha Hassoun and
                  Geert Janssen},
  title        = {First CADathlon Programming Contest held at 2002 {ICCAD}},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {104--107},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/HassounJ03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HassounKL03,
  author       = {Soha Hassoun and
                  Yong{-}Bin Kim and
                  Fabrizio Lombardi},
  title        = {Guest Editors' Introduction: Clockless {VLSI} Systems},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {5--8},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246158},
  doi          = {10.1109/MDT.2003.1246158},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/HassounKL03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/HosabettuGS03,
  author       = {Ravi Hosabettu and
                  Ganesh Gopalakrishnan and
                  Mandayam K. Srivas},
  title        = {A Practical Methodology for Verifying Pipelined Microarchitectures},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {4--14},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1214347},
  doi          = {10.1109/MDT.2003.1214347},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/HosabettuGS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Irwin03,
  author       = {Mary Jane Irwin},
  title        = {Power-Aware Designers at Odds with Power Grid Designers?},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {120},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Irwin03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Jerraya03,
  author       = {Ahmed Amine Jerraya},
  title        = {Hot Topics at {HLDVT} 02},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {92},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Jerraya03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KacNANR03,
  author       = {Uros Kac and
                  Franc Novak and
                  Florence Aza{\"{\i}}s and
                  Pascal Nouet and
                  Michel Renovell},
  title        = {Extending {IEEE} Std. 1149.4 Analog Boundary Modules to Enhance Mixed-Signal
                  Test},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {32--39},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188260},
  doi          = {10.1109/MDT.2003.1188260},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/KacNANR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Kahng03,
  author       = {Andrew B. Kahng},
  title        = {Error Tolerance},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {86--87},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Kahng03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Kahng03a,
  author       = {Andrew B. Kahng},
  title        = {Bringing down {NRE}},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {110--111},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Kahng03a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Kahng03b,
  author       = {Andrew B. Kahng},
  title        = {How much variability can designers tolerate?},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {96--97},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Kahng03b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KimK03,
  author       = {Woo Jin Kim and
                  Yong{-}Bin Kim},
  title        = {Automating Wave-Pipelined Circuit Design},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {51--58},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246164},
  doi          = {10.1109/MDT.2003.1246164},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/KimK03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KimMR03,
  author       = {Kee Sup Kim and
                  Subhasish Mitra and
                  Paul G. Ryan},
  title        = {Delay Defect Characteristics and Testing Strategies},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {8--16},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232251},
  doi          = {10.1109/MDT.2003.1232251},
  timestamp    = {Sun, 25 Jul 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/KimMR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/KimZ03,
  author       = {Suhwan Kim and
                  Conrad H. Ziesler},
  title        = {A clockless future for systems on chip},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {120},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/KimZ03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LavagnoF03,
  author       = {Luciano Lavagno and
                  Limor Fix},
  title        = {{DAC} Highlights},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {88--89},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/LavagnoF03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Lawrence03,
  author       = {Jay Lawrence},
  title        = {Orthogonality of Verilog Data Types and Object Kinds},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {94--96},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Lawrence03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LeeCD03,
  author       = {Jong{-}eun Lee and
                  Kiyoung Choi and
                  Nikil D. Dutt},
  title        = {Compilation Approach for Coarse-Grained Reconfigurable Architectures},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {26--33},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173050},
  doi          = {10.1109/MDT.2003.1173050},
  timestamp    = {Sat, 05 Sep 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/LeeCD03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LinPRRRST03,
  author       = {Xijiang Lin and
                  Ron Press and
                  Janusz Rajski and
                  Paul Reuter and
                  Thomas Rinderknecht and
                  Bruce Swanson and
                  Nagesh Tamarapalli},
  title        = {High-Frequency, At-Speed Scan Testing},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {17--25},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232252},
  doi          = {10.1109/MDT.2003.1232252},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/LinPRRRST03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/LiuCJ03,
  author       = {Chien{-}Nan Jimmy Liu and
                  I{-}Ling Chen and
                  Jing{-}Yang Jou},
  title        = {A Design-for-Verification Technique for Functional Pattern Reduction},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {48--55},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188262},
  doi          = {10.1109/MDT.2003.1188262},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/LiuCJ03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MadgeBD03,
  author       = {Robert Madge and
                  Brady Benware and
                  W. Robert Daasch},
  title        = {Obtaining High Defect Coverage for Frequency-Dependent Defects in
                  Complex ASICs},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {46--53},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232256},
  doi          = {10.1109/MDT.2003.1232256},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/MadgeBD03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Mann03,
  author       = {Bill Mann},
  title        = {Test's Evolving Mission},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {95--96},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Mann03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MarinissenVHB03,
  author       = {Erik Jan Marinissen and
                  Bart Vermeulen and
                  Henk D. L. Hollmann and
                  Ben Bennetts},
  title        = {Minimizing Pattern Count for Interconnect Test under a Ground Bounce
                  Constraint},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {8--18},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188257},
  doi          = {10.1109/MDT.2003.1188257},
  timestamp    = {Mon, 05 Feb 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/MarinissenVHB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Marques-SilvaS03,
  author       = {Jo{\~{a}}o Marques{-}Silva and
                  Lu{\'{\i}}s Guerra e Silva},
  title        = {Solving Satisfiability in Combinational Circuits},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {16--21},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1214348},
  doi          = {10.1109/MDT.2003.1214348},
  timestamp    = {Mon, 03 Apr 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Marques-SilvaS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MartinNW03,
  author       = {Alain J. Martin and
                  Mika Nystr{\"{o}}m and
                  Catherine G. Wong},
  title        = {Three Generations of Asynchronous Microprocessors},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {9--17},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246159},
  doi          = {10.1109/MDT.2003.1246159},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/MartinNW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MastellerS03,
  author       = {Steve Masteller and
                  Lief Sorenson},
  title        = {Cycle Decomposition in {NCL}},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {38--43},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246162},
  doi          = {10.1109/MDT.2003.1246162},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/MastellerS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Maxwell03,
  author       = {Peter C. Maxwell},
  title        = {Wafer-Package Test Mix for Optimal Defect Detection and Test Time
                  Savings},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {84--89},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232260},
  doi          = {10.1109/MDT.2003.1232260},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Maxwell03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Micheli03,
  author       = {Giovanni De Micheli},
  title        = {{CASS} Brings Publishing to Its {DAC} Partnership},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {101--102},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Micheli03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MrugalskiTR03,
  author       = {Grzegorz Mrugalski and
                  Jerzy Tyszer and
                  Janusz Rajski},
  title        = {2D Test Sequence Generators},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {51--59},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173053},
  doi          = {10.1109/MDT.2003.1173053},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/MrugalskiTR03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/MukherjeeM03,
  author       = {Arindam Mukherjee and
                  Malgorzata Marek{-}Sadowska},
  title        = {Clock and Power Gating with Timing Closure},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {32--39},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198683},
  doi          = {10.1109/MDT.2003.1198683},
  timestamp    = {Mon, 05 Jun 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/MukherjeeM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NassifH03,
  author       = {Sani R. Nassif and
                  Soha Hassoun},
  title        = {Guest Editors' Introduction: On-Chip Power Distribution Networks},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {5--6},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/NassifH03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/NicoliciA03,
  author       = {Nicola Nicolici and
                  Bashir M. Al{-}Hashimi},
  title        = {Power-Conscious Test Synthesis and Scheduling},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {48--55},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1214352},
  doi          = {10.1109/MDT.2003.1214352},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/NicoliciA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/OrailogluV03,
  author       = {Alex Orailoglu and
                  Alexander V. Veidenbaum},
  title        = {Guest Editors' Introduction: Application-Specific Microprocessors},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {6--7},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/OrailogluV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PandaSB03,
  author       = {Rajendran Panda and
                  Savithri Sundareswaran and
                  David T. Blaauw},
  title        = {Impact of Low-Impedance Substrate on Power Supply Integrity},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {16--22},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198681},
  doi          = {10.1109/MDT.2003.1198681},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/PandaSB03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Parker03,
  author       = {Kenneth P. Parker},
  title        = {Testing for what?},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {96},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Parker03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Pateras03,
  author       = {Stephen Pateras},
  title        = {Achieving At-Speed Structural Test},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {26--33},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232253},
  doi          = {10.1109/MDT.2003.1232253},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Pateras03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PetrovO03,
  author       = {Peter Petrov and
                  Alex Orailoglu},
  title        = {Application-Specific Instruction Memory Customizations for Power-Efficient
                  Embedded Processors},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {18--25},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173049},
  doi          = {10.1109/MDT.2003.1173049},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/PetrovO03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Pistilli03,
  author       = {Pat O. Pistilli},
  title        = {{DAC:} Serving the {EDA} Community for 40 Years},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {97--98},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Pistilli03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PixleyC03,
  author       = {Carl Pixley and
                  Juan Antonio Carballo},
  title        = {Panel Summaries},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {86--88},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/PixleyC03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PlosilaSL03,
  author       = {Juha Plosila and
                  Tiberiu Seceleanu and
                  Pasi Liljeberg},
  title        = {Implementation of a Self-Timed Segmented Bus},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {44--50},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246163},
  doi          = {10.1109/MDT.2003.1246163},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/PlosilaSL03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/PnevmatikatosSV03,
  author       = {Dionisios N. Pnevmatikatos and
                  Ioannis Sourdis and
                  Kyriakos Vlachos},
  title        = {An Efficient, Low-Cost {I/O} Subsystem for Network Processors},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {56--64},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1214353},
  doi          = {10.1109/MDT.2003.1214353},
  timestamp    = {Wed, 07 Dec 2022 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/PnevmatikatosSV03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/QuasemJG03,
  author       = {Md. Saffat Quasem and
                  Zhigang Jiang and
                  Sandeep K. Gupta},
  title        = {Benefits of a SoC-Specific Test Methodology},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {68--77},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198688},
  doi          = {10.1109/MDT.2003.1198688},
  timestamp    = {Thu, 21 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/QuasemJG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RaabBHHRST03,
  author       = {Wolfgang Raab and
                  Nico Br{\"{u}}ls and
                  J. A. Ulrich Hachmann and
                  Jens Harnisch and
                  Ulrich Ramacher and
                  Christian Sauer and
                  Axel Techmer},
  title        = {A 100-GOPS Programmable Processor for Vehicle Vision Systems},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {8--16},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173047},
  doi          = {10.1109/MDT.2003.1173047},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/RaabBHHRST03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RajskiKMTTQ03,
  author       = {Janusz Rajski and
                  Mark Kassab and
                  Nilanjan Mukherjee and
                  Nagesh Tamarapalli and
                  Jerzy Tyszer and
                  Jun Qian},
  title        = {Embedded Deterministic Test for Low-Cost Manufacturing},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {58--66},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1232257},
  doi          = {10.1109/MDT.2003.1232257},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/RajskiKMTTQ03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Rich03,
  author       = {David I. Rich},
  title        = {The Evolution of SystemVerilog},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {82--84},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Rich03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/RobertsA03,
  author       = {Gordon W. Roberts and
                  Robert C. Aitken},
  title        = {{ITC} Highlights},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {55--57},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/RobertsA03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Roethig03,
  author       = {Wolfgang Roethig},
  title        = {New advanced library format standard approved},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {98--99},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Roethig03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Rohrer03,
  author       = {Ronald A. Rohrer},
  title        = {DAC, Moore's Law Still Drive {EDA}},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {99--100},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Rohrer03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SalamatiS03,
  author       = {Mahnaz Salamati and
                  Dag Stranneby},
  title        = {Electromagnetic Signatures as a Tool for Connectionless Test},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {26--30},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188259},
  doi          = {10.1109/MDT.2003.1188259},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/SalamatiS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Sangiovanni-Vincentelli03,
  author       = {Alberto L. Sangiovanni{-}Vincentelli},
  title        = {{DAC} Turns 40!},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {90--96},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Sangiovanni-Vincentelli03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Sangiovanni-Vincentelli03a,
  author       = {Alberto L. Sangiovanni{-}Vincentelli},
  title        = {The Tides of {EDA}},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {59--75},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246165},
  doi          = {10.1109/MDT.2003.1246165},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Sangiovanni-Vincentelli03a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SapatnekarS03,
  author       = {Sachin S. Sapatnekar and
                  Haihua Su},
  title        = {Analysis and Optimization of Power Grids},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {7--15},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198680},
  doi          = {10.1109/MDT.2003.1198680},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/SapatnekarS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/SinanogluO03,
  author       = {Ozgur Sinanoglu and
                  Alex Orailoglu},
  title        = {Compacting Test Responses for Deeply Embedded SoC Cores},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {22--30},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1214349},
  doi          = {10.1109/MDT.2003.1214349},
  timestamp    = {Tue, 29 Dec 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/SinanogluO03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Stolicny03,
  author       = {Carol Stolicny},
  title        = {{ITC} 2002 Panels},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {88--90},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Stolicny03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Stolicny03a,
  author       = {Carol Stolicny},
  title        = {{ITC} 2002 Panels: Part 2},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {90--91},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Stolicny03a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/TreurenM03,
  author       = {Bradford G. Van Treuren and
                  Jos{\'{e}} M. Miranda},
  title        = {Embedded Boundary Scan},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {20--25},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1188258},
  doi          = {10.1109/MDT.2003.1188258},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/TreurenM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Unger03,
  author       = {Stephen H. Unger},
  title        = {Reducing Power Dissipation, Delay, and Area in Logic Circuits by Narrowing
                  Transistors},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {18--24},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1246160},
  doi          = {10.1109/MDT.2003.1246160},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Unger03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Vahid03,
  author       = {Frank Vahid},
  title        = {Making the Best of Those Extra Transistors},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {96},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Vahid03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Vollrath03,
  author       = {J{\"{o}}rg E. Vollrath},
  title        = {Testing and Characterization of SDRAMs},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {42--50},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173052},
  doi          = {10.1109/MDT.2003.1173052},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Vollrath03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/WahlenHLM03,
  author       = {Oliver Wahlen and
                  Manuel Hohenauer and
                  Rainer Leupers and
                  Heinrich Meyr},
  title        = {Instruction Scheduler Generation for Retargetable Compilation},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {34--41},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1173051},
  doi          = {10.1109/MDT.2003.1173051},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/WahlenHLM03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03,
  title        = {{DATC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {93},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03a,
  title        = {{TTTC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {1},
  pages        = {94--95},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03b,
  title        = {Test Data Compression},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {76--87},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03b.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03c,
  title        = {Conference Reports},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {88--89},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03c.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03d,
  title        = {{DATC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {93},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03d.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03e,
  title        = {{TTTC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {2},
  pages        = {94--95},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03e.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03f,
  title        = {Conference Reports},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {115},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03f.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03g,
  title        = {{TTTC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {116--117},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03g.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03h,
  title        = {{DATC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {118},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03h.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03i,
  title        = {Embedded Memories for the Future},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {66--81},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03i.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03j,
  title        = {McCluskey Awarded {TTTC} Lifetime Contribution Medal},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {89},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03j.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03k,
  title        = {{TTTC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {90--91},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03k.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03l,
  title        = {{DATC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {4},
  pages        = {93},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03l.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03m,
  title        = {{ARM} Twisting with Sir Robin: An Interview with {ARM} Chairman Sir
                  Robin Saxby},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {90--93},
  year         = {2003},
  url          = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.10032},
  doi          = {10.1109/MDT.2003.10032},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03m.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03n,
  title        = {Conference Reports},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {97--99},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03n.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03o,
  title        = {{DATC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {100},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03o.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03p,
  title        = {{TTTC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {5},
  pages        = {102--103},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03p.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03q,
  title        = {Fabless or IDM? What the Future Holds for Both: An Interview with
                  Cirrus Logic Chairman, Michael L. Hackworth},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {76--85},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03q.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03r,
  title        = {What Is the Next Implementation Fabric?},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {86--95},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03r.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03s,
  title        = {Test Technology {TC} Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {104--105},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03s.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03t,
  title        = {Design Automation Technical Committee Newsletter},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {106},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03t.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/X03u,
  title        = {2003 Annual Index {IEEE} Design {\&} Test of Computers Volume
                  20},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {6},
  pages        = {108--119},
  year         = {2003},
  url          = {http://doi.ieeecomputersociety.org/10.1109/MDT.2003.10046},
  doi          = {10.1109/MDT.2003.10046},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/X03u.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ZhengKP03,
  author       = {Hui Zheng and
                  Byron Krauter and
                  Lawrence T. Pileggi},
  title        = {Electrical Modeling of Integrated-Package Power and Ground Distributions},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {24--31},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198682},
  doi          = {10.1109/MDT.2003.1198682},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/ZhengKP03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Zorian03,
  author       = {Yervant Zorian},
  title        = {Guest Editor's Introduction: Advances in Infrastructure {IP}},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {49},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Zorian03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/Zorian03a,
  author       = {Yervant Zorian},
  title        = {{IEEE} {CASS} becomes D{\&}T Copublisher},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {108},
  year         = {2003},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/Zorian03a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/dt/ZorianS03,
  author       = {Yervant Zorian and
                  Samvel K. Shoukourian},
  title        = {Embedded-Memory Test and Repair: Infrastructure {IP} for SoC Yield},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {20},
  number       = {3},
  pages        = {58--66},
  year         = {2003},
  url          = {https://doi.org/10.1109/MDT.2003.1198687},
  doi          = {10.1109/MDT.2003.1198687},
  timestamp    = {Sun, 17 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/ZorianS03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}