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@article{DBLP:journals/et/Agrawal11,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {1--2},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5200-4},
doi = {10.1007/S10836-011-5200-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal11a,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {95},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5224-9},
doi = {10.1007/S10836-011-5224-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal11a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal11b,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {219},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5228-5},
doi = {10.1007/S10836-011-5228-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal11b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal11c,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {425--426},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5247-2},
doi = {10.1007/S10836-011-5247-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal11c.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal11d,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {579},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5254-3},
doi = {10.1007/S10836-011-5254-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal11d.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Agrawal11e,
author = {Vishwani D. Agrawal},
title = {Editorial},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {681--682},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5267-y},
doi = {10.1007/S10836-011-5267-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Agrawal11e.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Al-GayemLRB11,
author = {Qais Al{-}Gayem and
Hongyuan Liu and
Andrew Richardson and
Nick Burd},
title = {Test Strategies for Electrode Degradation in Bio-Fluidic Microsystems},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {57--68},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5180-9},
doi = {10.1007/S10836-010-5180-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Al-GayemLRB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Al-GayemRLB11,
author = {Qais Al{-}Gayem and
Andrew Richardson and
Hongyuan Liu and
Nick Burd},
title = {An Oscillation-Based Technique for Degradation Monitoring of Sensing
and Actuation Electrodes Within Microfluidic Systems},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {375--387},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5203-1},
doi = {10.1007/S10836-011-5203-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Al-GayemRLB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AristizabalOLVCPKM11,
author = {Jeydmer Aristizabal and
Badr Omrane and
Clinton K. Landrock and
Sasan Vosoogh{-}Grayli and
Yindar Chuo and
Jasbir N. Patel and
Bozena Kaminska and
Carlo Menon},
title = {Tungsten Lamps as an Affordable Light Source for Testing of Photovoltaic
Cells},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {403--410},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5226-7},
doi = {10.1007/S10836-011-5226-7},
timestamp = {Wed, 07 Dec 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/AristizabalOLVCPKM11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AsianFLRH11,
author = {Manuel J. Barragan Asian and
Rafaella Fiorelli and
Gildas L{\'{e}}ger and
Adoraci{\'{o}}n Rueda and
Jos{\'{e}} L. Huertas},
title = {Alternate Test of LNAs Through Ensemble Learning of On-Chip Digital
Envelope Signatures},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {277--288},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5193-4},
doi = {10.1007/S10836-010-5193-4},
timestamp = {Sat, 09 Apr 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AsianFLRH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AsianVR11,
author = {Manuel J. Barragan Asian and
Diego V{\'{a}}zquez and
Adoraci{\'{o}}n Rueda},
title = {Analog Sinewave Signal Generators for Mixed-Signal Built-in Test Applications},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {305--320},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5192-5},
doi = {10.1007/S10836-010-5192-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AsianVR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/AzambujaPRK11,
author = {Jos{\'{e}} Rodrigo Azambuja and
Samuel Pagliarini and
Lucas Rosa and
Fernanda Lima Kastensmidt},
title = {Exploring the Limitations of Software-based Techniques in {SEE} Fault
Coverage},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {541--550},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5218-7},
doi = {10.1007/S10836-011-5218-7},
timestamp = {Fri, 09 Apr 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/AzambujaPRK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BahramaliJR11,
author = {Mohsen Bahramali and
Jin Jiang and
Arash Reyhani{-}Masoleh},
title = {A Fault Detection Scheme for the {FPGA} Implementation of {SHA-1}
and {SHA-512} Round Computations},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {517--530},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5237-4},
doi = {10.1007/S10836-011-5237-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BahramaliJR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BenwareMPRST11,
author = {Brady Benware and
Grzegorz Mrugalski and
Artur Pogiel and
Janusz Rajski and
Jedrzej Solecki and
Jerzy Tyszer},
title = {Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {599--609},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5243-6},
doi = {10.1007/S10836-011-5243-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BenwareMPRST11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/BrascaBRBBLMS11,
author = {Lyl M. Ciganda Brasca and
Paolo Bernardi and
Matteo Sonza Reorda and
Dimitri Barbieri and
Luciano Bonaria and
Roberto Losco and
Luciano Marcigot and
Maurizio Straiotto},
title = {A Parallel Tester Architecture for Accelerometer and Gyroscope {MEMS}
Calibration and Test},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {389--402},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5210-2},
doi = {10.1007/S10836-011-5210-2},
timestamp = {Sun, 25 Jul 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/BrascaBRBBLMS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChakrabortyB11,
author = {Rajat Subhra Chakraborty and
Swarup Bhunia},
title = {Security Against Hardware Trojan Attacks Using Key-Based Design Obfuscation},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {767--785},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5255-2},
doi = {10.1007/S10836-011-5255-2},
timestamp = {Mon, 28 Aug 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChakrabortyB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ChengL11,
author = {Chi{-}Hsuan Cheng and
James Chien{-}Mo Li},
title = {An Asynchronous Design for Testability and Implementation in Thin-film
Transistor Technology},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {193--201},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5195-x},
doi = {10.1007/S10836-011-5195-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ChengL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Font-RosselloIRPFG11,
author = {Joan Font{-}Rossell{\'{o}} and
Eugeni Isern and
Miquel Roca and
Rodrigo Picos and
Miquel Font{-}Rossell{\'{o}} and
Eugeni Garc{\'{\i}}a{-}Moreno},
title = {Band-Pass Filter Design with Diagnosis Facilities Based on Predictive
Techniques},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {685--696},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5257-0},
doi = {10.1007/S10836-011-5257-0},
timestamp = {Wed, 20 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Font-RosselloIRPFG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FoucardPV11,
author = {Gilles Foucard and
Paul Peronnard and
Raoul Velazco},
title = {Reliability Limits of {TMR} Implemented in a SRAM-based {FPGA:} Heavy
Ion Measures vs. Fault Injection Predictions},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {627--633},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5245-4},
doi = {10.1007/S10836-011-5245-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FoucardPV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/FritzBANH11,
author = {Gilles Fritz and
Vincent Beroulle and
Oum{-}El{-}Kheir Aktouf and
Minh Duc Nguyen and
David H{\'{e}}ly},
title = {{RFID} System On-line Testing Based on the Evaluation of the Tags
Read-Error-Rate},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {267--276},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5191-6},
doi = {10.1007/S10836-010-5191-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/FritzBANH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Garcia-GervacioC11,
author = {Jose Luis Garcia{-}Gervacio and
V{\'{\i}}ctor H. Champac},
title = {Computing the Detection Probability for Small Delay Defects of Nanometer
ICs},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {741--752},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5256-1},
doi = {10.1007/S10836-011-5256-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Garcia-GervacioC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Gizdarski11,
author = {Emil Gizdarski},
title = {Construction and Analysis of Augmented Time Compactors},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {109--122},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5211-1},
doi = {10.1007/S10836-011-5211-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Gizdarski11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GoncalvesBBLSH11,
author = {Luiz Fernando Gon{\c{c}}alves and
Jefferson Luiz Bosa and
Tiago Roberto Balen and
Marcelo Lubaszewski and
Eduardo Luis Schneider and
Renato V. B. Henriques},
title = {Fault Detection, Diagnosis and Prediction in Electrical Valves Using
Self-Organizing Maps},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {551--564},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5220-0},
doi = {10.1007/S10836-011-5220-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GoncalvesBBLSH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GrayK11,
author = {Carl Edward Gray and
David C. Keezer},
title = {Extending a {DWDM} Optical Network Test System to 12 Gbps x4 Channels},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {351--361},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5216-9},
doi = {10.1007/S10836-011-5216-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GrayK11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GrossoHRSRTV11,
author = {Michelangelo Grosso and
Wilson{-}Javier P{\'{e}}rez{-}Holgu{\'{\i}}n and
Danilo Ravotto and
Ernesto S{\'{a}}nchez and
Matteo Sonza Reorda and
Alberto Paolo Tonda and
Jaime Velasco{-}Medina},
title = {Functional Verification of {DMA} Controllers},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {505--516},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5219-6},
doi = {10.1007/S10836-011-5219-6},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/GrossoHRSRTV11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuglielmoGFP11,
author = {Giuseppe Di Guglielmo and
Luigi Di Guglielmo and
Franco Fummi and
Graziano Pravadelli},
title = {Efficient Generation of Stimuli for Functional Verification by Backjumping
Across Extended FSMs},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {137--162},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5209-8},
doi = {10.1007/S10836-011-5209-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GuglielmoGFP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/GuoHL11,
author = {Jierong Guo and
Yigang He and
Meirong Liu},
title = {Wavelet Neural Network Approach for Testing of Switched-Current Circuits},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {611--625},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5248-1},
doi = {10.1007/S10836-011-5248-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/GuoHL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HanPLCBWOA11,
author = {Kihyuk Han and
Joonsung Park and
Jae Wook Lee and
Jaeyong Chung and
Eonjo Byun and
Cheol{-}Jong Woo and
Sejang Oh and
Jacob A. Abraham},
title = {Off-Chip Skew Measurement and Compensation Module {(SMCM)} Design
for Built-Off Test Chip},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {429--439},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5213-z},
doi = {10.1007/S10836-011-5213-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HanPLCBWOA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HarutunyanHSVZ11,
author = {Gurgen Harutunyan and
Aram Hakhumyan and
Samvel K. Shoukourian and
Valery A. Vardanian and
Yervant Zorian},
title = {Symmetry Measure for Memory Test and Its Application in {BIST} Optimization},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {753--766},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5251-6},
doi = {10.1007/S10836-011-5251-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HarutunyanHSVZ11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HerveMALKC11,
author = {Marcos Barcellos Herv{\'{e}} and
Marcelo de Souza Moraes and
Pedro Almeida and
Marcelo Lubaszewski and
Fernanda Lima Kastensmidt and
{\'{E}}rika F. Cota},
title = {Functional Test of Mesh-Based NoCs with Deterministic Routing: Integrating
the Test of Interconnects and Routers},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {635--646},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5246-3},
doi = {10.1007/S10836-011-5246-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HerveMALKC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/HuangKYH11,
author = {Xuan{-}Lun Huang and
Ping{-}Ying Kang and
Yuan{-}Chi Yu and
Jiun{-}Lang Huang},
title = {Histogram-Based Calibration of Capacitor Mismatch and Comparator Offset
for 1-Bit/Stage Pipelined ADCs},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {441--453},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5231-x},
doi = {10.1007/S10836-011-5231-X},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/HuangKYH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/InoueYHF11,
author = {Michiko Inoue and
Tomokazu Yoneda and
Muneo Hasegawa and
Hideo Fujiwara},
title = {Balanced Secure Scan: Partial Scan Approach for Secret Information
Protection},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {99--108},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5204-0},
doi = {10.1007/S10836-011-5204-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/InoueYHF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Jin11,
author = {Le Jin},
title = {Application of the Kalman Filter in Linearity Testing of Analog-to-Digital
Converters},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {163--175},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5196-9},
doi = {10.1007/S10836-011-5196-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Jin11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KannanKSTAF11,
author = {Sukeshwar Kannan and
Bruce C. Kim and
Ganesh Srinivasan and
Friedrich Taenzler and
Richard Antley and
Craig Force},
title = {Embedded {RF} Circuit Diagnostic Technique with Multi-Tone Dither
Scheme},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {241--252},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5212-0},
doi = {10.1007/S10836-011-5212-0},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KannanKSTAF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KaoLW11,
author = {Chen{-}Yuan Kao and
Chien{-}Hui Liao and
Charles H.{-}P. Wen},
title = {Diagnosing Multiple Byzantine Open-Segment Defects Using Integer Linear
Programming},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {723--739},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5265-0},
doi = {10.1007/S10836-011-5265-0},
timestamp = {Thu, 23 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KaoLW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KavithamaniMD11,
author = {Ashok Kavithamani and
Venugopal Manikandan and
Nanjundappan Devarajan},
title = {Analog Circuit Fault Detection Using Location of Poles},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {673--678},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5240-9},
doi = {10.1007/S10836-011-5240-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KavithamaniMD11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/KerzerhoCACBR11,
author = {Vincent Kerzerho and
Mariane Comte and
Florence Aza{\"{\i}}s and
Philippe Cauvet and
Serge Bernard and
Michel Renovell},
title = {Digital Test Method for Embedded Converters with Unknown-Phase Harmonics},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {335--350},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5194-y},
doi = {10.1007/S10836-011-5194-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/KerzerhoCACBR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/LinT11,
author = {Jin{-}Fu Lin and
Hsin{-}Wen Ting},
title = {Digital Design-for-Diagnosis Method for Error Identification of Pipelined
ADCs},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {697--709},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5252-5},
doi = {10.1007/S10836-011-5252-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/LinT11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MaestroRAP11,
author = {Juan Antonio Maestro and
Pedro Reviriego and
Costas Argyrides and
Dhiraj K. Pradhan},
title = {Fault Tolerant Single Error Correction Encoders},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {215--218},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5208-9},
doi = {10.1007/S10836-011-5208-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MaestroRAP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MalandruccoloCRF11,
author = {Vezio Malandruccolo and
Mauro Ciappa and
Hubert Rothleitner and
Wolfgang Fichtner},
title = {A New Built-In Defect-Based Testing Technique to Achieve Zero Defects
in the Automotive Environment},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {19--30},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5178-3},
doi = {10.1007/S10836-010-5178-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MalandruccoloCRF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MannathCMHdKA11,
author = {Deepa Mannath and
David Cohen and
Victor Monta{\~{n}}o{-}Martinez and
Rick Hudgens and
Elida de{-}Obaldia and
Shai Kush and
Simon S. Ang},
title = {Methodology to Replace Sensitivity {BER} and Transmit Power Production
Tests in Bluetooth Devices with BiSTs},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {253--266},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5215-x},
doi = {10.1007/S10836-011-5215-X},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MannathCMHdKA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MarquezTSC11,
author = {Carlos Ivan Castro Marquez and
Edgar Leonardo Romero Tobar and
Marius Strum and
Jiang Chau Wang},
title = {A Functional Verification Methodology Based on Parameter Domains for
Efficient Input Stimuli Generation and Coverage Modeling},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {485--503},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5225-8},
doi = {10.1007/S10836-011-5225-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MarquezTSC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MitraGRCB11,
author = {Debasis Mitra and
Sarmishtha Ghoshal and
Hafizur Rahaman and
Krishnendu Chakrabarty and
Bhargab B. Bhattacharya},
title = {Test Planning in Digital Microfluidic Biochips Using Efficient Eulerization
Techniques},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {657--671},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5239-2},
doi = {10.1007/S10836-011-5239-2},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/MitraGRCB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MozuelosLMB11,
author = {Rom{\'{a}}n Mozuelos and
Yolanda Lechuga and
Mar Mart{\'{\i}}nez and
Salvador Bracho},
title = {Structural Test Approach for Embedded Analog Circuits Based on a Built-in
Current Sensor},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {177--192},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5214-y},
doi = {10.1007/S10836-011-5214-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MozuelosLMB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MunarettiWCF11,
author = {Ruthiano Simioni Munaretti and
Taisy Silva Weber and
S{\'{e}}rgio Luis Cechin and
Bruno Coswig Fiss},
title = {A Java Framework to Specify Faultloads for Fault Injection Campaigns},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {531--539},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5217-8},
doi = {10.1007/S10836-011-5217-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MunarettiWCF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/MyersB11,
author = {Thomas O. Myers and
Ian M. Bell},
title = {Assessment of Microfluidic System Testability using Fault Simulation
and Test Metrics},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {363--373},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5202-2},
doi = {10.1007/S10836-011-5202-2},
timestamp = {Thu, 14 Oct 2021 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/MyersB11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NourivandAS11,
author = {Afshin Nourivand and
Asim J. Al{-}Khalili and
Yvon Savaria},
title = {Analysis of Resistive Open Defects in Drowsy {SRAM} Cells},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {203--213},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5206-y},
doi = {10.1007/S10836-011-5206-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NourivandAS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/NummerS11,
author = {Muhammad Nummer and
Manoj Sachdev},
title = {Experimental Results for Slow-speed Timing Characterization of High-speed
Pipelined Datapaths},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {9--17},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5186-3},
doi = {10.1007/S10836-010-5186-3},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/NummerS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/OnabajoGAAMS11,
author = {Marvin Onabajo and
Didac G{\'{o}}mez and
Eduardo Aldrete{-}Vidrio and
Josep Altet and
Diego Mateo and
Jos{\'{e}} Silva{-}Mart{\'{\i}}nez},
title = {Survey of Robustness Enhancement Techniques for Wireless Systems-on-a-Chip
and Study of Temperature as Observable for Process Variations},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {225--240},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5199-6},
doi = {10.1007/S10836-011-5199-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/OnabajoGAAMS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/OoiF11,
author = {Chia Yee Ooi and
Hideo Fujiwara},
title = {A New Design-for-Testability Method Based on Thru-Testability},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {583--598},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5241-8},
doi = {10.1007/S10836-011-5241-8},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/OoiF11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ParkSA11,
author = {Joonsung Park and
Hongjoong Shin and
Jacob A. Abraham},
title = {Pseudorandom Test of Nonlinear Analog and Mixed-Signal Circuits Based
on a Volterra Series Model},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {321--334},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5227-6},
doi = {10.1007/S10836-011-5227-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ParkSA11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/PousALR11,
author = {Nicolas Pous and
Florence Aza{\"{\i}}s and
Laurent Latorre and
Jochen Rivoir},
title = {A Level-Crossing Approach for the Analysis of {RF} Modulated Signals
Using Only Digital Test Resources},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {289--303},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5222-y},
doi = {10.1007/S10836-011-5222-Y},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/PousALR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RabenaltGL11,
author = {Thomas Rabenalt and
Michael G{\"{o}}ssel and
Andreas Leininger},
title = {Masking of X-Values by Use of a Hierarchically Configurable Register},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {31--41},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5179-2},
doi = {10.1007/S10836-010-5179-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RabenaltGL11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RadhakrishnanO11,
author = {Gurusubrahmaniyan Subrahmaniyan Radhakrishnan and
Sule Ozev},
title = {Adaptive Modeling of Analog/RF Circuits for Efficient Fault Response
Evaluation},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {465--476},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5221-z},
doi = {10.1007/S10836-011-5221-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/RadhakrishnanO11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/RekikADMN11,
author = {Ahmed Amine Rekik and
Florence Aza{\"{\i}}s and
Norbert Dumas and
Fr{\'{e}}d{\'{e}}rick Mailly and
Pascal Nouet},
title = {A Behavioral Model of {MEMS} Convective Accelerometers for the Evaluation
of Design and Calibration Strategies at System Level},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {411--423},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5207-x},
doi = {10.1007/S10836-011-5207-X},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/RekikADMN11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/StratigopoulosC11,
author = {Haralampos{-}G. D. Stratigopoulos and
Krishnendu Chakrabarty},
title = {Guest Editorial},
journal = {J. Electron. Test.},
volume = {27},
number = {3},
pages = {223},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5229-4},
doi = {10.1007/S10836-011-5229-4},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/StratigopoulosC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/SunZLLS11,
author = {Haijun Sun and
Yongjia Zeng and
Pu Li and
Shaochong Lei and
Zhibiao Shao},
title = {An Optimized Seed-based Pseudo-random Test Pattern Generator: Theory
and Implementation},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {477--484},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5232-9},
doi = {10.1007/S10836-011-5232-9},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/SunZLLS11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TadesseBG11,
author = {Desta Tadesse and
R. Iris Bahar and
Joel Grodstein},
title = {Test Vector Generation for Post-Silicon Delay Testing Using SAT-Based
Decision Problems},
journal = {J. Electron. Test.},
volume = {27},
number = {2},
pages = {123--136},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5205-z},
doi = {10.1007/S10836-011-5205-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TadesseBG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/Ting11,
author = {Hsin{-}Wen Ting},
title = {An Output Response Analyzer Circuit for {ADC} Built-in Self-Test},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {455--464},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5235-6},
doi = {10.1007/S10836-011-5235-6},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/Ting11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/TingCH11,
author = {Hsin{-}Wen Ting and
Soon{-}Jyh Chang and
Su{-}Ling Huang},
title = {A Design of Linearity Built-in Self-Test for Current-Steering {DAC}},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {85--94},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5187-2},
doi = {10.1007/S10836-010-5187-2},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/TingCH11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/WanDPY11,
author = {Min{-}yong Wan and
Yong Ding and
Yun Pan and
Xiaolang Yan},
title = {An Efficient Compatibility-Based Test Data Compression and Its Decoder
Architecture},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {787--796},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5258-z},
doi = {10.1007/S10836-011-5258-Z},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/WanDPY11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X11,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {427--428},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5236-5},
doi = {10.1007/S10836-011-5236-5},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X11a,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {581--582},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5250-7},
doi = {10.1007/S10836-011-5250-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X11a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/X11b,
title = {Test Technology Newsletter},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {683--684},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5264-1},
doi = {10.1007/S10836-011-5264-1},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/X11b.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/YaoSR11,
author = {Chunhua Yao and
Kewal K. Saluja and
Parmesh Ramanathan},
title = {Calibrating On-chip Thermal Sensors in Integrated Circuits: {A} Design-for-Calibration
Approach},
journal = {J. Electron. Test.},
volume = {27},
number = {6},
pages = {711--721},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5253-4},
doi = {10.1007/S10836-011-5253-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/YaoSR11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhangKY11,
author = {Ling Zhang and
Jishun Kuang and
Zhiqiang You},
title = {Test Data Compression Using Selective Sparse Storage},
journal = {J. Electron. Test.},
volume = {27},
number = {4},
pages = {565--577},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5234-7},
doi = {10.1007/S10836-011-5234-7},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhangKY11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhaoC11,
author = {Yang Zhao and
Krishnendu Chakrabarty},
title = {Fault Diagnosis in Lab-on-Chip Using Digital Microfluidic Logic Gates},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {69--83},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5190-7},
doi = {10.1007/S10836-010-5190-7},
timestamp = {Mon, 03 Jan 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/et/ZhaoC11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhouXYW11,
author = {Bin Zhou and
Liyi Xiao and
Yizheng Ye and
Xin{-}chun Wu},
title = {Optimization of Test Power and Data Volume in {BIST} Scheme Based
on Scan Slice Overlapping},
journal = {J. Electron. Test.},
volume = {27},
number = {1},
pages = {43--56},
year = {2011},
url = {https://doi.org/10.1007/s10836-010-5185-4},
doi = {10.1007/S10836-010-5185-4},
timestamp = {Fri, 11 Sep 2020 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhouXYW11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhuHWP11,
author = {Jianfeng Zhu and
Hu He and
Dong Wu and
Liyang Pan},
title = {A cost-efficient self-configurable {BIST} technique for testing multiplexer-based
{FPGA} interconnect},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {647--655},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5238-3},
doi = {10.1007/S10836-011-5238-3},
timestamp = {Sun, 12 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhuHWP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/et/ZhuHWP11a,
author = {Jianfeng Zhu and
Hu He and
Dong Wu and
Liyang Pan},
title = {Erratum to: {A} Cost-Efficient Self-Configurable {BIST} Technique
for Testing Multiplexer-Based {FPGA} Interconnect},
journal = {J. Electron. Test.},
volume = {27},
number = {5},
pages = {679},
year = {2011},
url = {https://doi.org/10.1007/s10836-011-5249-0},
doi = {10.1007/S10836-011-5249-0},
timestamp = {Sun, 12 Jun 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/et/ZhuHWP11a.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
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