Search dblp for Publications

export results for "toc:db/journals/mr/mr68.bht:"

 download as .bib file

@article{DBLP:journals/mr/BernsteinBB17,
  author       = {Joseph B. Bernstein and
                  Alain Bensoussan and
                  Emmanuel Bender},
  title        = {Reliability prediction with {MTOL}},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {91--97},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.005},
  doi          = {10.1016/J.MICROREL.2016.09.005},
  timestamp    = {Sat, 30 Sep 2023 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/BernsteinBB17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ChatzikyriakouR17,
  author       = {Eleni Chatzikyriakou and
                  William Redman{-}White and
                  C. H. De Groot},
  title        = {Total Ionizing Dose, Random Dopant Fluctuations, and its combined
                  effect in the 45 nm {PDSOI} node},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {21--29},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.007},
  doi          = {10.1016/J.MICROREL.2016.11.007},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ChatzikyriakouR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/EftaxiopoulosAP17,
  author       = {Nikolaos Eftaxiopoulos and
                  Nicholas Axelos and
                  Kiamal Z. Pekmestzi},
  title        = {{DIRT} latch: {A} novel low cost double node upset tolerant latch},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {57--68},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.006},
  doi          = {10.1016/J.MICROREL.2016.11.006},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/EftaxiopoulosAP17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ErslandM17,
  author       = {Peter Ersland and
                  Roberto Menozzi},
  title        = {Editorial},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {1},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.12.011},
  doi          = {10.1016/J.MICROREL.2016.12.011},
  timestamp    = {Sun, 02 Oct 2022 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/ErslandM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/LaiKYC17,
  author       = {Zhongmin Lai and
                  Xinda Kong and
                  Qingrong You and
                  Xiubin Cao},
  title        = {Microstructure and mechanical properties of Co/Sn-10Bi couple and
                  Co/Sn-10Bi/Co joint},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {69--76},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.008},
  doi          = {10.1016/J.MICROREL.2016.11.008},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LaiKYC17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PolingVBJM17,
  author       = {B. S. Poling and
                  Glen David Via and
                  K. D. Bole and
                  E. E. Johnson and
                  J. M. McDermott},
  title        = {Commercial-off-the-shelf algan/gan hemt device reliability study after
                  exposure to heavy ion radiation},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {13--20},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.017},
  doi          = {10.1016/J.MICROREL.2016.09.017},
  timestamp    = {Wed, 01 Jul 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/PolingVBJM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/PoothBRHPTMWCUK17,
  author       = {Alexander Pooth and
                  Johan Bergsten and
                  Niklas Rorsman and
                  Hassan Hirshy and
                  R. Perks and
                  Paul J. Tasker and
                  Trevor Martin and
                  Richard F. Webster and
                  Dave Cherns and
                  Michael J. Uren and
                  Martin Kuball},
  title        = {Morphological and electrical comparison of Ti and Ta based ohmic contacts
                  for AlGaN/GaN-on-SiC HFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {2--4},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.002},
  doi          = {10.1016/J.MICROREL.2016.11.002},
  timestamp    = {Mon, 26 Oct 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/PoothBRHPTMWCUK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/RajaguruLBGA17,
  author       = {Pushparajah Rajaguru and
                  Hua Lu and
                  Chris Bailey and
                  Jose Angel Ortiz Gonzalez and
                  Olayiwola Alatise},
  title        = {Evaluation of the impact of the physical dimensions and material of
                  the semiconductor chip on the reliability of Sn3.5Ag solder interconnect
                  in power electronic module: {A} finite element analysis perspective},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {77--85},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.12.002},
  doi          = {10.1016/J.MICROREL.2016.12.002},
  timestamp    = {Thu, 14 Oct 2021 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RajaguruLBGA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SasakiONAKSKLKT17,
  author       = {Akito Sasaki and
                  Hideyuki Oozu and
                  Miho Nakamura and
                  Katsuaki Aoki and
                  Yoshinori Kataoka and
                  Syuichi Saito and
                  Kumpei Kobayashi and
                  Wei Li and
                  Kuniyuki Kakushima and
                  Kazuo Tsutsui and
                  Hiroshi Iwai},
  title        = {Durability evaluation of hexagonal WO\({}_{\mbox{3}}\) electrode for
                  lithium ion secondary batteries},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {86--90},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.015},
  doi          = {10.1016/J.MICROREL.2016.11.015},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SasakiONAKSKLKT17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/SufianA17,
  author       = {Shaker Farid Sufian and
                  Mohd Zulkifly Abdullah},
  title        = {Heat transfer enhancement of LEDs with a combination of piezoelectric
                  fans and a heat sink},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {39--50},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.011},
  doi          = {10.1016/J.MICROREL.2016.11.011},
  timestamp    = {Mon, 11 Mar 2024 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SufianA17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/WhitmanMZ17,
  author       = {Charles S. Whitman and
                  Michael G. Meeder and
                  Peter J. Zampardi},
  title        = {Determination of safe reliability region over temperature and current
                  density for through wafer vias},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {5--12},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.09.011},
  doi          = {10.1016/J.MICROREL.2016.09.011},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/WhitmanMZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/XuMCWSWZWHY17,
  author       = {Xiuqin Xu and
                  Jiongjiong Mo and
                  Wei Chen and
                  Zhiyu Wang and
                  Yong{-}Heng Shang and
                  Yang Wang and
                  Qin Zheng and
                  Liping Wang and
                  Zheng{-}Liang Huang and
                  Fa{-}Xin Yu},
  title        = {A new meshing criterion for the equivalent thermal analysis of GaAs
                  {PHEMT} MMICs},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {30--38},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.012},
  doi          = {10.1016/J.MICROREL.2016.11.012},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/XuMCWSWZWHY17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

@article{DBLP:journals/mr/ZhuLYKZ17,
  author       = {Wenyi Zhu and
                  Binghan Li and
                  Tao Yu and
                  Weiran Kong and
                  Shichang Zou},
  title        = {Investigation of read disturb in split-gate memory and its feasible
                  solution},
  journal      = {Microelectron. Reliab.},
  volume       = {68},
  pages        = {51--56},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2016.11.009},
  doi          = {10.1016/J.MICROREL.2016.11.009},
  timestamp    = {Sat, 22 Feb 2020 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ZhuLYKZ17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.