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export results for "Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust Path Delay Tests."

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@article{DBLP:journals/dt/ShahNS20,
  author       = {Ankit Shah and
                  Raman Nayyar and
                  Arani Sinha},
  title        = {Silicon-Proven Timing Signoff Methodology Using Hazard-Free Robust
                  Path Delay Tests},
  journal      = {{IEEE} Des. Test},
  volume       = {37},
  number       = {4},
  pages        = {7--13},
  year         = {2020}
}

@inproceedings{DBLP:conf/vts/ShahNS19,
  author       = {Ankit Shah and
                  Raman Nayyar and
                  Arani Sinha},
  title        = {Silicon Proven Timing Signoff Methodology using Hazard-Free Robust
                  Path Delay Tests},
  booktitle    = {{VTS}},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2019}
}

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