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@inproceedings{DBLP:conf/itc/WuLRJST04,
  author       = {David M. Wu and
                  Mike Lin and
                  Madhukar Reddy and
                  Talal Jaber and
                  Anil Sabbavarapu and
                  Larry Thatcher},
  title        = {An Optimized {DFT} and Test Pattern Generation Strategy for an Intel
                  High Performance Microprocessor},
  booktitle    = {{ITC}},
  pages        = {38--47},
  publisher    = {{IEEE} Computer Society},
  year         = {2004}
}
@inproceedings{DBLP:conf/itc/WuLMKSJJMP03,
  author       = {David M. Wu and
                  Mike Lin and
                  Subhasish Mitra and
                  Kee Sup Kim and
                  Anil Sabbavarapu and
                  Talal Jaber and
                  Pete Johnson and
                  Dale March and
                  Greg Parrish},
  title        = {{H-DFT:} {A} Hybrid {DFT} Architecture For Low-Cost High Quality Structural
                  Testing},
  booktitle    = {{ITC}},
  pages        = {1229--1238},
  publisher    = {{IEEE} Computer Society},
  year         = {2003}
}
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