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@inproceedings{DBLP:conf/itc/WuLRJST04, author = {David M. Wu and Mike Lin and Madhukar Reddy and Talal Jaber and Anil Sabbavarapu and Larry Thatcher}, title = {An Optimized {DFT} and Test Pattern Generation Strategy for an Intel High Performance Microprocessor}, booktitle = {{ITC}}, pages = {38--47}, publisher = {{IEEE} Computer Society}, year = {2004} }
@inproceedings{DBLP:conf/itc/WuLMKSJJMP03, author = {David M. Wu and Mike Lin and Subhasish Mitra and Kee Sup Kim and Anil Sabbavarapu and Talal Jaber and Pete Johnson and Dale March and Greg Parrish}, title = {{H-DFT:} {A} Hybrid {DFT} Architecture For Low-Cost High Quality Structural Testing}, booktitle = {{ITC}}, pages = {1229--1238}, publisher = {{IEEE} Computer Society}, year = {2003} }
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