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export results for "A Circuit Level Fault Model for Resistive Shorts of MOS Gate Oxide."

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@inproceedings{DBLP:conf/mtv/LuLQWS04,
  author       = {Xiang Lu and
                  Zhuo Li and
                  Wangqi Qiu and
                  D. M. H. Walker and
                  Weiping Shi},
  title        = {A Circuit Level Fault Model for Resistive Shorts of {MOS} Gate Oxide},
  booktitle    = {Fifth International Workshop on Microprocessor Test and Verification
                  {(MTV} 2004), Common Challenges and Solutions, 08-10 September 2004,
                  Austin, Texas, {USA}},
  pages        = {97--102},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/MTV.2004.1},
  doi          = {10.1109/MTV.2004.1},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/mtv/LuLQWS04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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