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@inproceedings{DBLP:conf/aspdac/GoudarziIY07, author = {Maziar Goudarzi and Tohru Ishihara and Hiroto Yasuura}, title = {A Software Technique to Improve Yield of Processor Chips in Presence of Ultra-Leaky {SRAM} Cells Caused by Process Variation}, booktitle = {Proceedings of the 12th Conference on Asia South Pacific Design Automation, {ASP-DAC} 2007, Yokohama, Japan, January 23-26, 2007}, pages = {878--883}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/ASPDAC.2007.358100}, doi = {10.1109/ASPDAC.2007.358100}, timestamp = {Thu, 23 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/aspdac/GoudarziIY07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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