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@inproceedings{DBLP:conf/compcon/AikyoHIKF86,
  author       = {Takashi Aikyo and
                  Y. Hatano and
                  J. Ishii and
                  N. Karasawa and
                  S. Fujii},
  title        = {An Automatic Test Generation System for Large Scale Gate Arrays},
  booktitle    = {Spring COMPCON'86, Digest of Papers, Thirty-First {IEEE} Computer
                  Society International Conference, San Francisco, California, USA,
                  March 3-6, 1986},
  pages        = {445--451},
  publisher    = {{IEEE} Computer Society},
  year         = {1986},
  timestamp    = {Wed, 28 Jun 2006 09:47:20 +0200},
  biburl       = {https://dblp.org/rec/conf/compcon/AikyoHIKF86.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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