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@article{DBLP:journals/corr/abs-2107-10292, author = {Carlos Olivares and Raziur Rahman and Christopher Stankus and Jade Hampton and Andrew Zedwick and Moinuddin Ahmed}, title = {Predicting Power Electronics Device Reliability under Extreme Conditions with Machine Learning Algorithms}, journal = {CoRR}, volume = {abs/2107.10292}, year = {2021}, url = {https://arxiv.org/abs/2107.10292}, eprinttype = {arXiv}, eprint = {2107.10292}, timestamp = {Thu, 29 Jul 2021 01:00:00 +0200}, biburl = {https://dblp.org/rec/journals/corr/abs-2107-10292.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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