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export results for "Built-in Current Sensor for ?I{DDQ} Testing of Deep Submicron Digital CMOS ICs."

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@inproceedings{DBLP:conf/vts/VazquezG04,
  author       = {Josep Rius V{\'{a}}zquez and
                  Jos{\'{e}} Pineda de Gyvez},
  title        = {Built-in Current Sensor for ?I\{DDQ\} Testing of Deep Submicron Digital
                  {CMOS} ICs},
  booktitle    = {22nd {IEEE} {VLSI} Test Symposium {(VTS} 2004), 25-29 April 2004,
                  Napa Valley, CA, {USA}},
  pages        = {53--58},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/VTEST.2004.1299225},
  doi          = {10.1109/VTEST.2004.1299225},
  timestamp    = {Fri, 24 Mar 2023 00:00:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/VazquezG04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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