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export results for "Characterization of Soft Errors Caused by Single Event Upsets in CMOS Processes."

 download as .bib file

@article{DBLP:journals/tdsc/KarnikHP04,
  author       = {Tanay Karnik and
                  Peter Hazucha and
                  Jagdish Patel},
  title        = {Characterization of Soft Errors Caused by Single Event Upsets in {CMOS}
                  Processes},
  journal      = {{IEEE} Trans. Dependable Secur. Comput.},
  volume       = {1},
  number       = {2},
  pages        = {128--143},
  year         = {2004},
  url          = {https://doi.org/10.1109/TDSC.2004.14},
  doi          = {10.1109/TDSC.2004.14},
  timestamp    = {Thu, 09 Apr 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tdsc/KarnikHP04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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