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export results for "Defect Tolerance Based on Coding and Series Replication in Transistor-Logic Demultiplexer Circuits."

 download as .bib file

@article{DBLP:journals/tcas/RobinettKW07,
  author       = {Warren Robinett and
                  Philip Kuekes and
                  R. Stanley Williams},
  title        = {Defect Tolerance Based on Coding and Series Replication in Transistor-Logic
                  Demultiplexer Circuits},
  journal      = {{IEEE} Trans. Circuits Syst. {I} Regul. Pap.},
  volume       = {54-I},
  number       = {11},
  pages        = {2410--2421},
  year         = {2007},
  url          = {https://doi.org/10.1109/TCSI.2007.907865},
  doi          = {10.1109/TCSI.2007.907865},
  timestamp    = {Fri, 22 May 2020 01:00:00 +0200},
  biburl       = {https://dblp.org/rec/journals/tcas/RobinettKW07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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