Stop the war!Остановите войну!
for scientists:
default search action
Google
Google Scholar
Semantic Scholar
Internet Archive Scholar
CiteSeerX
ORCIDSearch dblp for Publications
export results for "Dionyz Pogany"
download as .bib file
@inproceedings{DBLP:conf/irps/WielandOSBKSMRHNGPO23,
author = {D. Wieland and
S. Ofner and
M. Stabentheiner and
B. Butej and
Christian Koller and
J. Sun and
Andrea Minetto and
K. Reiser and
Oliver H{\"{a}}berlen and
Michael Nelhiebel and
Michael Glavanovics and
Dionyz Pogany and
Clemens Ostermaier},
title = {A common hard-failure mechanism in GaN HEMTs in accelerated switching
and single-pulse short-circuit tests},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
CA, USA, March 26-30, 2023},
pages = {1--6},
publisher = {{IEEE}},
year = {2023},
url = {https://doi.org/10.1109/IRPS48203.2023.10117943},
doi = {10.1109/IRPS48203.2023.10117943},
timestamp = {Wed, 24 May 2023 09:43:44 +0200},
biburl = {https://dblp.org/rec/conf/irps/WielandOSBKSMRHNGPO23.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OstermaierLRP18,
author = {Clemens Ostermaier and
Peter Lagger and
M. Reiner and
Dionyz Pogany},
title = {Review of bias-temperature instabilities at the III-N/dielectric interface},
journal = {Microelectron. Reliab.},
volume = {82},
pages = {62--83},
year = {2018},
url = {https://doi.org/10.1016/j.microrel.2017.12.039},
doi = {10.1016/J.MICROREL.2017.12.039},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OstermaierLRP18.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleuryNRP17,
author = {Cl{\'{e}}ment Fleury and
Guido Notermans and
Hans{-}Martin Ritter and
Dionyz Pogany},
title = {TIM, {EMMI} and 3D {TCAD} analysis of discrete-technology SCRs},
journal = {Microelectron. Reliab.},
volume = {76-77},
pages = {698--702},
year = {2017},
url = {https://doi.org/10.1016/j.microrel.2017.06.070},
doi = {10.1016/J.MICROREL.2017.06.070},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FleuryNRP17.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MeneghiniHFSCSP16,
author = {Matteo Meneghini and
Oliver Hilt and
Cl{\'{e}}ment Fleury and
Riccardo Silvestri and
Mattia Capriotti and
Gottfried Strasser and
Dionyz Pogany and
Eldad Bahat{-}Treidel and
Frank Brunner and
A. Knauer and
Joachim W{\"{u}}rfl and
Isabella Rossetto and
Enrico Zanoni and
Gaudenzio Meneghesso and
Stefano Dalcanale},
title = {Normally-off GaN-HEMTs with p-type gate: Off-state degradation, forward
gate stress and {ESD} failure},
journal = {Microelectron. Reliab.},
volume = {58},
pages = {177--184},
year = {2016},
url = {https://doi.org/10.1016/j.microrel.2015.11.026},
doi = {10.1016/J.MICROREL.2015.11.026},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MeneghiniHFSCSP16.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleuryCRHWDSKSP15,
author = {Cl{\'{e}}ment Fleury and
Mattia Capriotti and
Matteo Rigato and
Oliver Hilt and
Joachim W{\"{u}}rfl and
Joff Derluyn and
Stephan Steinhauer and
Anton K{\"{o}}ck and
Gottfried Strasser and
Dionyz Pogany},
title = {High temperature performances of normally-off p-GaN gate AlGaN/GaN
HEMTs on SiC and Si substrates for power applications},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1687--1691},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.010},
doi = {10.1016/J.MICROREL.2015.06.010},
timestamp = {Mon, 05 Feb 2024 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/FleuryCRHWDSKSP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/RigatoFHCSP15,
author = {Matteo Rigato and
Cl{\'{e}}ment Fleury and
Michael Heer and
Mattia Capriotti and
Werner Simb{\"{u}}rger and
Dionyz Pogany},
title = {{ESD} characterization of multi-finger {RF} nMOSFET transistors by
{TLP} and transient interferometric mapping technique},
journal = {Microelectron. Reliab.},
volume = {55},
number = {9-10},
pages = {1471--1475},
year = {2015},
url = {https://doi.org/10.1016/j.microrel.2015.06.019},
doi = {10.1016/J.MICROREL.2015.06.019},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/RigatoFHCSP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/essderc/CapriottiFBRLPS15,
author = {Mattia Capriotti and
Cl{\'{e}}ment Fleury and
Ole Bethge and
Matteo Rigato and
Suzanne Lancaster and
Dionyz Pogany and
Gottfried Strasser and
Eldad Bahat{-}Treidel and
Oliver Hilt and
Frank Brunner and
Joachim W{\"{u}}rfl},
title = {E-mode AlGaN/GaN True-MOS, with high-k ZrO2 gate insulator},
booktitle = {45th European Solid State Device Research Conference, {ESSDERC} 2015,
Graz, Austria, September 14-18, 2015},
pages = {60--63},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/ESSDERC.2015.7324713},
doi = {10.1109/ESSDERC.2015.7324713},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/conf/essderc/CapriottiFBRLPS15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@inproceedings{DBLP:conf/irps/LaggerDSPRNMMPP15,
author = {Peter Lagger and
S. Donsa and
P. Spreitzer and
Gregor Pobegen and
M. Reiner and
H. Naharashi and
J. Mohamed and
H. Mosslacher and
G. Prechtl and
Dionyz Pogany and
Clemens Ostermaier},
title = {Thermal activation of PBTI-related stress and recovery processes in
GaN MIS-HEMTs using on-wafer heaters},
booktitle = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
CA, USA, April 19-23, 2015},
pages = {6},
publisher = {{IEEE}},
year = {2015},
url = {https://doi.org/10.1109/IRPS.2015.7112767},
doi = {10.1109/IRPS.2015.7112767},
timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
biburl = {https://dblp.org/rec/conf/irps/LaggerDSPRNMMPP15.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/FleuryZBCHVMZWDSP13,
author = {Cl{\'{e}}ment Fleury and
Rimma Zhytnytska and
Sergey Bychikhin and
Mattia Capriotti and
Oliver Hilt and
Domenica Visalli and
Gaudenzio Meneghesso and
Enrico Zanoni and
Joachim W{\"{u}}rfl and
Joff Derluyn and
Gottfried Strasser and
Dionyz Pogany},
title = {Statistics and localisation of vertical breakdown in AlGaN/GaN HEMTs
on SiC and Si substrates for power applications},
journal = {Microelectron. Reliab.},
volume = {53},
number = {9-11},
pages = {1444--1449},
year = {2013},
url = {https://doi.org/10.1016/j.microrel.2013.07.117},
doi = {10.1016/J.MICROREL.2013.07.117},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/FleuryZBCHVMZWDSP13.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mj/RhayemBBBHPDGWT12,
author = {J. Rhayem and
B. Besbes and
Raul Blecic and
Sergey Bychikhin and
Georg Haberfehlner and
Dionyz Pogany and
B. Desoete and
Renaud Gillon and
Aarnout Wieers and
Marnix Tack},
title = {Electro-thermal characterization and simulation of integrated multi-trenched
XtreMOS\({}^{\mbox{TM}}\) power devices},
journal = {Microelectron. J.},
volume = {43},
number = {9},
pages = {618--623},
year = {2012},
url = {https://doi.org/10.1016/j.mejo.2011.09.010},
doi = {10.1016/J.MEJO.2011.09.010},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mj/RhayemBBBHPDGWT12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/MarkoMBMMZP12,
author = {Paul Marko and
Matteo Meneghini and
Sergey Bychikhin and
Denis Marcon and
Gaudenzio Meneghesso and
Enrico Zanoni and
Dionyz Pogany},
title = {IV, noise and electroluminescence analysis of stress-induced percolation
paths in AlGaN/GaN high electron mobility transistors},
journal = {Microelectron. Reliab.},
volume = {52},
number = {9-10},
pages = {2194--2199},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2012.06.030},
doi = {10.1016/J.MICROREL.2012.06.030},
timestamp = {Tue, 07 May 2024 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/MarkoMBMMZP12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/NotermansBPJM12,
author = {Guido Notermans and
Sergey Bychikhin and
Dionyz Pogany and
David Johnsson and
Dejan M. Maksimovic},
title = {{HMM-TLP} correlation for system-efficient {ESD} design},
journal = {Microelectron. Reliab.},
volume = {52},
number = {6},
pages = {1012--1019},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2011.11.018},
doi = {10.1016/J.MICROREL.2011.11.018},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/NotermansBPJM12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/OstermaierLAHMAFDSPK12,
author = {Clemens Ostermaier and
Peter Lagger and
Mohammed Alomari and
Patrick Herfurth and
David Maier and
Alexander Alexewicz and
Marie{-}Antoinette di Forte{-}Poisson and
Sylvain L. Delage and
Gottfried Strasser and
Dionyz Pogany and
Erhard Kohn},
title = {Reliability investigation of the degradation of the surface passivation
of InAlN/GaN HEMTs using a dual gate structure},
journal = {Microelectron. Reliab.},
volume = {52},
number = {9-10},
pages = {1812--1815},
year = {2012},
url = {https://doi.org/10.1016/j.microrel.2012.06.006},
doi = {10.1016/J.MICROREL.2012.06.006},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/OstermaierLAHMAFDSPK12.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KockDFINLGP11,
author = {Helmut K{\"{o}}ck and
Christian Djelassi and
Stefano de Filippis and
Robert Illing and
Michael Nelhiebel and
Markus Ladurner and
Michael Glavanovics and
Dionyz Pogany},
title = {Improved thermal management of low voltage power devices with optimized
bond wire positions},
journal = {Microelectron. Reliab.},
volume = {51},
number = {9-11},
pages = {1913--1918},
year = {2011},
url = {https://doi.org/10.1016/j.microrel.2011.06.052},
doi = {10.1016/J.MICROREL.2011.06.052},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/KockDFINLGP11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PoganyBHMG11,
author = {Dionyz Pogany and
Sergey Bychikhin and
Michael Heer and
W. Mamanee and
Erich Gornik},
title = {Application of transient interferometric mapping method for {ESD}
and latch-up analysis},
journal = {Microelectron. Reliab.},
volume = {51},
number = {9-11},
pages = {1592--1596},
year = {2011},
url = {https://doi.org/10.1016/j.microrel.2011.07.016},
doi = {10.1016/J.MICROREL.2011.07.016},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PoganyBHMG11.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BychikhinHRVGP10,
author = {Sergey Bychikhin and
Georg Haberfehlner and
J. Rhayem and
Daniel Vanderstraeten and
Renaud Gillon and
Dionyz Pogany},
title = {Investigation of smart power {DMOS} devices under repetitive stress
conditions using transient thermal mapping and numerical simulation},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1427--1430},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.138},
doi = {10.1016/J.MICROREL.2010.07.138},
timestamp = {Thu, 05 Nov 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BychikhinHRVGP10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PodgaynayaREPGSS10,
author = {A. Podgaynaya and
Ralf Rudolf and
B. Elattari and
Dionyz Pogany and
Erich Gornik and
Matthias Stecher and
Marc Strasser},
title = {Single pulse energy capability and failure modes of n- and p-channel
{LDMOS} with thick copper metallization},
journal = {Microelectron. Reliab.},
volume = {50},
number = {9-11},
pages = {1347--1351},
year = {2010},
url = {https://doi.org/10.1016/j.microrel.2010.07.075},
doi = {10.1016/J.MICROREL.2010.07.075},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/PodgaynayaREPGSS10.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HaberfehlnerBDHPPSGP09,
author = {Georg Haberfehlner and
Sergey Bychikhin and
Viktor Dubec and
Michael Heer and
A. Podgaynaya and
M. Pfost and
Matthias Stecher and
Erich Gornik and
Dionyz Pogany},
title = {Thermal imaging of smart power {DMOS} transistors in the thermally
unstable regime using a compact transient interferometric mapping
system},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1346--1351},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.07.032},
doi = {10.1016/J.MICROREL.2009.07.032},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HaberfehlnerBDHPPSGP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerDEGPGS09,
author = {Michael Heer and
Krzysztof Domanski and
Kai Esmark and
Ulrich Glaser and
Dionyz Pogany and
Erich Gornik and
Wolfgang Stadler},
title = {Transient interferometric mapping of carrier plasma during external
transient latch-up phenomena in latch-up test structures and {I/O}
cells processed in {CMOS} technology},
journal = {Microelectron. Reliab.},
volume = {49},
number = {12},
pages = {1455--1464},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.052},
doi = {10.1016/J.MICROREL.2009.06.052},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerDEGPGS09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/KockKDGP09,
author = {Helmut K{\"{o}}ck and
Vladim{\'{\i}}r Kosel and
Christian Djelassi and
Michael Glavanovics and
Dionyz Pogany},
title = {{IR} thermography and {FEM} simulation analysis of on-chip temperature
during thermal-cycling power-metal reliability testing using in situ
heated structures},
journal = {Microelectron. Reliab.},
volume = {49},
number = {9-11},
pages = {1132--1136},
year = {2009},
url = {https://doi.org/10.1016/j.microrel.2009.06.032},
doi = {10.1016/J.MICROREL.2009.06.032},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/KockKDGP09.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerGHP08,
author = {Michael Heer and
P. Grombach and
A. Heid and
Dionyz Pogany},
title = {Hot spot analysis during thermal shutdown of {SOI} {BCDMOS} half bridge
driver for automotive applications},
journal = {Microelectron. Reliab.},
volume = {48},
number = {8-9},
pages = {1525--1528},
year = {2008},
url = {https://doi.org/10.1016/j.microrel.2008.07.009},
doi = {10.1016/J.MICROREL.2008.07.009},
timestamp = {Sat, 22 Feb 2020 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerGHP08.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BychikhinSSPPP07,
author = {Sergey Bychikhin and
T. Swietlik and
Tadeusz Suski and
Sylwester Porowski and
Piotr Perlin and
Dionyz Pogany},
title = {Thermal analysis of InGaN/GaN (GaN substrate) laser diodes using transient
interferometric mapping},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1649--1652},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.046},
doi = {10.1016/J.MICROREL.2007.07.046},
timestamp = {Sun, 05 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BychikhinSSPPP07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/CicoKGSLGPF07,
author = {Karol Cico and
J{\'{a}}n Kuzm{\'{\i}}k and
Dagmar Gregusov{\'{a}} and
Roman Stoklas and
Tibor Lalinsky and
Alexandros G. Georgakilas and
Dionyz Pogany and
Karol Fr{\"{o}}hlich},
title = {Optimization and performance of Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)/GaN
metal-oxide-semiconductor structures},
journal = {Microelectron. Reliab.},
volume = {47},
number = {4-5},
pages = {790--793},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.01.010},
doi = {10.1016/J.MICROREL.2007.01.010},
timestamp = {Sat, 30 Sep 2023 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/CicoKGSLGPF07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DubecBPGBS07,
author = {Viktor Dubec and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik and
Tilo Brodbeck and
Wolfgang Stadler},
title = {Backside interferometric methods for localization of ESD-induced leakage
current and metal shorts},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1539--1544},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.029},
doi = {10.1016/J.MICROREL.2007.07.029},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DubecBPGBS07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerBMPHGKSR07,
author = {Michael Heer and
Sergey Bychikhin and
W. Mamanee and
Dionyz Pogany and
A. Heid and
P. Grombach and
M. Klaussner and
Winfried Soppa and
Bernd Ramler},
title = {Experimental and numerical analysis of current flow homogeneity in
low voltage {SOI} multi-finger gg-NMOS and {NPN} {ESD} protection
devices},
journal = {Microelectron. Reliab.},
volume = {47},
number = {9-11},
pages = {1450--1455},
year = {2007},
url = {https://doi.org/10.1016/j.microrel.2007.07.092},
doi = {10.1016/J.MICROREL.2007.07.092},
timestamp = {Fri, 10 Nov 2023 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerBMPHGKSR07.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerDBPGFKS06,
author = {Michael Heer and
Viktor Dubec and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik and
M. Frank and
A. Konrad and
J. Schulz},
title = {Analysis of triggering behaviour of high voltage {CMOS} {LDMOS} clamps
and SCRs during {ESD} induced latch-up},
journal = {Microelectron. Reliab.},
volume = {46},
number = {9-11},
pages = {1591--1596},
year = {2006},
url = {https://doi.org/10.1016/j.microrel.2006.07.040},
doi = {10.1016/J.MICROREL.2006.07.040},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerDBPGFKS06.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/HeerDBBPGDSG05,
author = {Michael Heer and
Viktor Dubec and
M. Blaho and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik and
Marie Denison and
Matthias Stecher and
Gerhard Groos},
title = {Automated setup for thermal imaging and electrical degradation study
of power {DMOS} devices},
journal = {Microelectron. Reliab.},
volume = {45},
number = {9-11},
pages = {1688--1693},
year = {2005},
url = {https://doi.org/10.1016/j.microrel.2005.07.082},
doi = {10.1016/J.MICROREL.2005.07.082},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/HeerDBBPGDSG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/tim/LitzenbergerFBPG05,
author = {Martin Litzenberger and
Christoph Furb{\"{o}}ck and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik},
title = {Scanning heterodyne interferometer setup for the time-resolved thermal
and free-carrier mapping in semiconductor devices},
journal = {{IEEE} Trans. Instrum. Meas.},
volume = {54},
number = {6},
pages = {2438--2445},
year = {2005},
url = {https://doi.org/10.1109/TIM.2005.858121},
doi = {10.1109/TIM.2005.858121},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/tim/LitzenbergerFBPG05.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BychikhinDPGGDS04,
author = {Sergey Bychikhin and
Viktor Dubec and
Dionyz Pogany and
Erich Gornik and
M. Graf and
V. Dudek and
Winfried Soppa},
title = {Transient interferometric mapping of smart power {SOI} {ESD} protection
devices under {TLP} and vf-TLP stress},
journal = {Microelectron. Reliab.},
volume = {44},
number = {9-11},
pages = {1687--1692},
year = {2004},
url = {https://doi.org/10.1016/j.microrel.2004.07.110},
doi = {10.1016/J.MICROREL.2004.07.110},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BychikhinDPGGDS04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DubecBBHPDJSGG04,
author = {Viktor Dubec and
Sergey Bychikhin and
M. Blaho and
Michael Heer and
Dionyz Pogany and
Marie Denison and
Nils Jensen and
Matthias Stecher and
Gerhard Groos and
Erich Gornik},
title = {Multiple-time-instant 2D thermal mapping during a single {ESD} event},
journal = {Microelectron. Reliab.},
volume = {44},
number = {9-11},
pages = {1793--1798},
year = {2004},
url = {https://doi.org/10.1016/j.microrel.2004.07.087},
doi = {10.1016/J.MICROREL.2004.07.087},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DubecBBHPDJSGG04.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlahoPGDGS03,
author = {M. Blaho and
Dionyz Pogany and
Erich Gornik and
Marie Denison and
Gerhard Groos and
Matthias Stecher},
title = {Study of internal behavior in a vertical {DMOS} transistor under short
high current stress by an interferometric mapping method},
journal = {Microelectron. Reliab.},
volume = {43},
number = {4},
pages = {545--548},
year = {2003},
url = {https://doi.org/10.1016/S0026-2714(03)00021-0},
doi = {10.1016/S0026-2714(03)00021-0},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlahoPGDGS03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/DubecBBPGWQWZA03,
author = {Viktor Dubec and
Sergey Bychikhin and
M. Blaho and
Dionyz Pogany and
Erich Gornik and
J. Willemen and
Ning Qu and
Wolfgang Wilkening and
L. Zullino and
A. Andreini},
title = {A dual-beam Michelson interferometer for investigation of trigger
dynamics in {ESD} protection devices under very fast {TLP} stress},
journal = {Microelectron. Reliab.},
volume = {43},
number = {9-11},
pages = {1557--1561},
year = {2003},
url = {https://doi.org/10.1016/S0026-2714(03)00274-9},
doi = {10.1016/S0026-2714(03)00274-9},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/DubecBBPGWQWZA03.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BlahoPZAG02,
author = {M. Blaho and
Dionyz Pogany and
L. Zullino and
A. Andreini and
Erich Gornik},
title = {Experimental and simulation analysis of a {BCD} {ESD} protection element
under the {DC} and {TLP} stress conditions},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1281--1286},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00135-X},
doi = {10.1016/S0026-2714(02)00135-X},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BlahoPZAG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/PoganyKDLBUMHLG02,
author = {Dionyz Pogany and
J{\'{a}}n Kuzm{\'{\i}}k and
J. Darmo and
Martin Litzenberger and
Sergey Bychikhin and
Karl Unterrainer and
Z. Mozolova and
S. Hascik and
Tibor Lalinsky and
Erich Gornik},
title = {Electrical field mapping in InGaP HEMTs and GaAs terahertz emitters
using backside infrared {OBIC} technique},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1673--1677},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00210-X},
doi = {10.1016/S0026-2714(02)00210-X},
timestamp = {Sun, 02 Oct 2022 01:00:00 +0200},
biburl = {https://dblp.org/rec/journals/mr/PoganyKDLBUMHLG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/StadlerEGSWFPLG02,
author = {Wolfgang Stadler and
Kai Esmark and
Harald Gossner and
Martin Streibl and
M. Wendel and
Wolfgang Fichtner and
Dionyz Pogany and
Martin Litzenberger and
Erich Gornik},
title = {Device Simulation and Backside Laser Interferometry--Powerful Tools
for {ESD} Protection Development},
journal = {Microelectron. Reliab.},
volume = {42},
number = {9-11},
pages = {1267--1274},
year = {2002},
url = {https://doi.org/10.1016/S0026-2714(02)00133-6},
doi = {10.1016/S0026-2714(02)00133-6},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/StadlerEGSWFPLG02.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/BychikhinLPPGGS01,
author = {Sergey Bychikhin and
Martin Litzenberger and
R. Pichler and
Dionyz Pogany and
Erich Gornik and
Gerhard Groos and
Matthias Stecher},
title = {Thermal and free carrier laser interferometric mapping and failure
analysis of anti-serial smart power {ESD} protection structures},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1501--1506},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00152-4},
doi = {10.1016/S0026-2714(01)00152-4},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/BychikhinLPPGGS01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
@article{DBLP:journals/mr/LitzenbergerPBPGEG01,
author = {Martin Litzenberger and
R. Pichler and
Sergey Bychikhin and
Dionyz Pogany and
Erich Gornik and
Kai Esmark and
Harald Gossner},
title = {Effect of pulse risetime on trigger homogeneity in single finger grounded
gate nMOSFET electrostatic discharge protection devices},
journal = {Microelectron. Reliab.},
volume = {41},
number = {9-10},
pages = {1385--1390},
year = {2001},
url = {https://doi.org/10.1016/S0026-2714(01)00146-9},
doi = {10.1016/S0026-2714(01)00146-9},
timestamp = {Wed, 16 Mar 2022 00:00:00 +0100},
biburl = {https://dblp.org/rec/journals/mr/LitzenbergerPBPGEG01.bib},
bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of 
manage site settings
To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.
retrieved on 2024-06-03 16:08 CEST from data curated by the dblp team
all metadata released as open data under CC0 1.0 license
see also: Terms of Use | Privacy Policy | Imprint
dblp was originally created in 1993 at:
since 2018, dblp has been operated and maintained by:
the dblp computer science bibliography is funded and supported by:
