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export results for "Fanout fault analysis for digital logic circuits."
@inproceedings{DBLP:conf/ats/ChenLSC95, author = {Jwu E. Chen and Chung{-}Len Lee and Wen{-}Zen Shen and Beyin Chen}, title = {Fanout fault analysis for digital logic circuits}, booktitle = {4th Asian Test Symposium {(ATS} '95), November 23-24, 1995. Bangalore, India}, pages = {33--39}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/ATS.1995.485313}, doi = {10.1109/ATS.1995.485313}, timestamp = {Fri, 24 Mar 2023 00:00:00 +0100}, biburl = {https://dblp.org/rec/conf/ats/ChenLSC95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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